Evaluating images

• US 9,646,191 B2
• Filed: 09/23/2015
• Issued: 05/09/2017
• Est. Priority Date: 09/23/2015
• Status: Active Grant

• Current Assignee: Intermec Technologies Corporation (Honeywell International Inc.)
• Original Assignee: Intermec Technologies Corporation (Honeywell International Inc.)
• Inventors: Unemyr, Erik Karl Henning, Perry, Karl
• Primary Examiner(s): TRAIL, ALLYSON NEEL
• Application Number:
  US14/862,336
• Publication Number:
  US 20170083734A1
• Time in Patent Office: 594 Days
• Field of Search: 2354621, 235454, 382112, 382162, 345158
• CPC Class Codes: G06K 19/06028 using bar codes
• CPC Class Codes: G06K 19/06037 multi-dimensional coding
• CPC Class Codes: G06K 7/1413 1D bar codes
• CPC Class Codes: G06K 7/1417 2D bar codes
• CPC Class Codes: G06K 7/1443 locating of the code in an image
• CPC Class Codes: G06K 7/1486 Setting the threshold-width for bar codes to be decoded
• CPC Class Codes: G08G 5/0013 with a ground station
• CPC Class Codes: G08G 5/0026 located on the ground
• CPC Class Codes: G08G 5/0091 for monitoring atmospheric conditions radar or analogous systems specially adapted for meteorological use G01S13/95; meteorology G01W

Abstract

A method for evaluating an output pattern printed on a medium is described. A reference pattern is stored. The output pattern is printed on the medium based correspondingly on the stored reference pattern. A scan based instance of the output pattern is rendered, which has a set of features at least corresponding to the printed output pattern and zero or more features additional thereto. A difference image, having the zero or more features of the rendered scan instance, is computed based on a comparison of the rendered scan instance to the stored reference pattern. Upon the zero or more features including at least one feature, the computed difference image is evaluated in relation to a proximity of at least one feature to locations pixels of the reference pattern.

Claims

1. A method for evaluating an output pattern printed on a medium, the evaluating method comprising the steps of:

storing a reference pattern, wherein the output pattern is printed on the medium based correspondingly on the stored reference pattern;

rendering a scan based instance of the output pattern, wherein the rendered scan based instance comprises;

a set of features at least corresponding to the printed output pattern; and

zero or more defect features in addition to the set of features at least corresponding to the printed output pattern, the zero or more defect features comprising zero or more printed defect features;

computing a difference image based on a comparison of the rendered scan based instance to the stored reference pattern, the computed difference image comprising the zero or more defect features of the rendered scan based instance; and

evaluating the computed difference image upon the zero or more defect features comprising at least one defect feature in relation to a proximity of at least one feature to a location of one or more picture elements (pixels) of the stored reference pattern.

2. The evaluating method as described in claim 1, further comprising the steps of:

determining, based on the evaluation step, that the proximity comprises an unacceptably small separation between a position of one or more pixels of the at least one of the zero or more defect features to the location of the one or more stored reference pattern pixels; and

presenting a warning, based on the determining step, in relation to the unacceptably small separation.

3. The evaluating method as described in claim 2 wherein the unacceptably small separation relates to a spatial distance between one or more pixels of the at least one of the zero or more defect features and a position of at least one of the one or more pixels of the stored reference pattern.

4. The evaluating method as described in claim 2, further comprising the step of adjusting a subsequent printing of the output pattern based on the determining step, wherein the at least one of the zero or more defect features is eliminated from an output pattern of the subsequent printing.

5. The evaluating method as described in claim 1, further comprising the step of determining that the proximity of the at least one of the zero or more defect features is acceptable in relation to the position of each of a plurality of pixels of the stored reference pattern.

6. The evaluating method as described in claim 5 wherein the determining that the proximity is acceptable relates to an acceptably large separation between each pixel of the at least one of the zero or more defect features to the location of each of the one or more stored reference pattern pixels.

7. The evaluating method as described in claim 5 further comprising, upon the determining that the proximity is acceptable in relation to the position of the stored reference pattern, the steps of indicating that the at least one of the zero or more defect features is acceptable.

8. The evaluating method as described in claim 1 wherein the stored reference pattern comprises a graphic model, wherein the output pattern is printed, and corresponds to the stored reference pattern based on the graphic model.

9. The evaluating method as described in claim 1, further comprising the step of printing the output pattern on the medium based on the stored reference pattern.

10. The evaluating method as described in claim 1 wherein the step of rendering the scan based instance comprises the step of scanning the output pattern printed on the medium, the scan based instance rendered based on the scanning step.

11. The evaluating method as described in claim 1 wherein the step of computing the difference image comprises performing an ‘

exclusive OR’

(XOR) logical operation over the pixels of the rendered scan based instance of the output pattern, relative to each corresponding pixel of the stored reference pattern.

12. A system for evaluating an output pattern printed on a medium, the evaluating system comprising:

a non-transitory computer readable storage medium operable for storing a reference pattern, wherein the output pattern is printed on the medium based correspondingly on the stored reference pattern;

a scanner operable for rendering a scan based instance of the output pattern, wherein the rendered scan based instance comprises;

a set of features at least corresponding to the printed output pattern; and

zero or more defect features in addition to the set of features at least corresponding to the printed output pattern, the zero or more defect features comprising zero or more printed defect features; and

one or more image processors operable for;

computing a difference image based on a comparison of the rendered scan based instance to the stored reference pattern, the computed difference image comprising the zero or more defect features of the rendered scan based instance; and

evaluating the computed difference image upon the zero or more defect features comprising at least one defect feature in relation to a proximity of at least one defect feature to a location of one or more picture elements (pixels) of the stored reference pattern.

13. The evaluating system as described in claim 12 wherein the computation of the difference image by the one or more image processors comprises performing an ‘

exclusive OR’

(XOR) logical operation over the pixels of the rendered scan based instance of the output pattern, relative to each corresponding pixel of the stored reference pattern.

14. The evaluating system as described in claim 12 wherein the evaluation of the computed difference image by the one or more image processors comprises:

determining, based on the evaluation of the computed difference image, that the proximity comprises an unacceptably small separation between a position of one or more pixels of the at least one of the zero or more defect features to the location of the one or more stored reference pattern pixels; and

presenting a warning, based on the determining step, in relation to the unacceptably small separation.

15. The evaluating system as described in claim 14 wherein the unacceptably small separation relates to a spatial distance between the one or more pixels of the at least one of the zero or more defect features and a position of at least one of the one or more pixels of the stored reference pattern.

16. The evaluating system as described in claim 12, further comprising a printer component operable for printing the output pattern on the medium based on the stored reference pattern.

17. The evaluating system as described in claim 16 wherein the printer component is further operable for adjusting a subsequent printing of the output pattern based on the determining step, wherein the at least one of the zero or more defect features is eliminated from an output pattern of the subsequent printing.

18. The evaluating system as described in claim 16 wherein the stored reference pattern comprises a graphic model, wherein the printer component is further operable for printing the output pattern wherein the printed output pattern corresponds to the stored reference pattern based on the graphic model.

19. The evaluating system as described in claim 12, further comprising a scanner component operable for scanning the output pattern printed on the medium and for the rendering of the scan based instance.

20. A non-transitory computer readable storage medium comprising instructions, which when executed by a processor are operable for one or more of causing, controlling, or programming a process for evaluating an output pattern printed on a medium, the evaluating process comprising:

storing a reference pattern, wherein the output pattern is printed on the medium based correspondingly on the stored reference pattern;

rendering a scan based instance of the output pattern, wherein the rendered scan based instance comprises;

a set of features at least corresponding to the printed output pattern; and

zero or more defect features in addition to the set of features at least corresponding to the printed output pattern, the zero or more defect features comprising zero or more printed defect features;

computing a difference image based on a comparison of the rendered scan based instance to the stored reference pattern, the computed difference image comprising the zero or more defect features of the rendered scan based instance; and

evaluating the computed difference image upon the zero or more defect features comprising at least one defect feature in relation to a proximity of at least one feature to a location of one or more picture elements (pixels) of the stored reference pattern.