Semiconductor device and manufacturing method thereof
First Claim
1. A semiconductor device comprising:
- a transistor over an insulating surface, the transistor including;
an oxide semiconductor layer over a first insulating film;
a source electrode layer and a drain electrode layer which are on and in contact with the oxide semiconductor layer and the insulating surface;
a second insulating film over the oxide semiconductor layer, the source electrode layer, and the drain electrode layer; and
a gate electrode layer over the oxide semiconductor layer with the second insulating film therebetween;
a capacitor, the capacitor including;
a first electrode in the same layer as the oxide semiconductor layer, the first electrode being located over the first insulating film;
a transparent conductive film as a second electrode of the capacitor, the transparent conductive film overlapping the first electrode; and
a dielectric between the first electrode and the second electrode; and
a wiring on and in contact with the insulating surface and the first electrode which is formed using the same material as the source electrode layer and the drain electrode layer,wherein the first electrode includes the same material as the oxide semiconductor layer.
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Accused Products
Abstract
A semiconductor device with high aperture ratio is provided. The semiconductor device includes a transistor and a capacitor having a pair of electrodes. An oxide semiconductor layer formed over the same insulating surface is used for a channel formation region of the transistor and one of the electrodes of the capacitor. The other electrode of the capacitor is a transparent conductive film. One electrode of the capacitor is electrically connected to a wiring formed over the insulating surface over which a source electrode or a drain electrode of the transistor is provided, and the other electrode of the capacitor is electrically connected to one of the source electrode and the drain electrode of the transistor.
136 Citations
21 Claims
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1. A semiconductor device comprising:
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a transistor over an insulating surface, the transistor including; an oxide semiconductor layer over a first insulating film; a source electrode layer and a drain electrode layer which are on and in contact with the oxide semiconductor layer and the insulating surface; a second insulating film over the oxide semiconductor layer, the source electrode layer, and the drain electrode layer; and a gate electrode layer over the oxide semiconductor layer with the second insulating film therebetween; a capacitor, the capacitor including; a first electrode in the same layer as the oxide semiconductor layer, the first electrode being located over the first insulating film; a transparent conductive film as a second electrode of the capacitor, the transparent conductive film overlapping the first electrode; and a dielectric between the first electrode and the second electrode; and a wiring on and in contact with the insulating surface and the first electrode which is formed using the same material as the source electrode layer and the drain electrode layer, wherein the first electrode includes the same material as the oxide semiconductor layer. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12)
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13. A method for manufacturing a semiconductor device, comprising the steps of:
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forming an oxide semiconductor film over a first insulating film; patterning the oxide semiconductor film so that a first oxide semiconductor layer and a second oxide semiconductor layer are formed; forming a conductive film over the first oxide semiconductor layer and the second oxide semiconductor layer; patterning the conductive film so that a source electrode layer and a drain electrode layer which are electrically connected to the first oxide semiconductor layer and a wiring electrically connected to the second oxide semiconductor layer are formed; forming a second insulating film over the first insulating film, the first oxide semiconductor layer, the second oxide semiconductor layer, the source electrode layer, the drain electrode layer, and the wiring; forming a gate electrode layer overlapping the first oxide semiconductor layer with the second insulating film therebetween; forming a third insulating film over the second insulating film and the gate electrode layer; forming a fourth insulating film over the third insulating film; forming an opening in the second insulating film, the third insulating film, and the fourth insulating film so as to reach the source electrode layer or the drain electrode layer; and forming a transparent conductive film over the fourth insulating film so as to be electrically connected to the source electrode layer or the drain electrode layer through the opening, wherein a capacitor includes a first electrode formed by the second oxide semiconductor layer and the transparent conductive film serves as a second electrode of the capacitor. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20, 21)
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Specification