×

Pogo pin and probe card, and method of manufacturing a semiconductor device using the same

  • US 9,651,577 B2
  • Filed: 08/29/2014
  • Issued: 05/16/2017
  • Est. Priority Date: 09/10/2013
  • Status: Active Grant
First Claim
Patent Images

1. A probe card comprising:

  • a printed circuit board (PCB) having a circuit pattern through which a test current passes;

    a probing head arranged under the PCB, the probing head including circuitry through which the test current passes;

    a plurality of needles provided to the probing head to supply the test current to an object; and

    a plurality of pogo pins positioned between the PCB and the probing head, each pogo pin including a housing arranged between the PCB and the probing head, a resilient connecting member arranged in the housing to electrically connect the PCB with the probing head, and a switching unit provided in the housing to selectively cut off an electrical connection between the PCB and the probing head,wherein the resilient connecting member comprises a first spring electrically connected to the PCB, and a second spring electrically connected to the probing head, andwherein the switching unit is configured to move any one of the first spring and the second spring to selectively disconnect the first spring from the second spring.

View all claims
  • 1 Assignment
Timeline View
Assignment View
    ×
    ×