Trench having thick dielectric selectively on bottom portion
First Claim
1. A method of fabricating a semiconductor device, comprising:
- etching a semiconductor substrate having a top surface to form a trench having sidewalls and a bottom surface that extends from said top surface into said semiconductor substrate;
forming a dielectric liner comprising a first dielectric material on said bottom surface and said sidewalls of said trench to line said trench;
after forming the dielectric liner, depositing a second dielectric layer comprising a second dielectric material on the dielectric liner to at least partially fill said trench;
partially etching said second dielectric layer to selectively remove said second dielectric layer from an upper portion of said trench while preserving said second dielectric layer on a lower portion of said trench and while preserving the dielectric liner in the upper portion of the trench and the lower portion of the trench, andfilling said trench with a fill material which provides an electrical conductivity that is at least that of a semiconductor, wherein the dielectric liner lines the fill material in the trench.
1 Assignment
0 Petitions
Accused Products
Abstract
A method of fabricating a semiconductor device includes etching a semiconductor substrate having a top surface to form a trench having sidewalls and a bottom surface that extends from the top surface into the semiconductor substrate. A dielectric liner of a first dielectric material is formed on the bottom surface and sidewalls of the trench to line the trench. A second dielectric layer of a second dielectric material is deposited to at least partially fill the trench. The second dielectric layer is partially etched to selectively remove the second dielectric layer from an upper portion of the trench while preserving the second dielectric layer on a lower portion of the trench. The trench is filled with a fill material which provides an electrical conductivity that is at least that of a semiconductor.
7 Citations
14 Claims
-
1. A method of fabricating a semiconductor device, comprising:
-
etching a semiconductor substrate having a top surface to form a trench having sidewalls and a bottom surface that extends from said top surface into said semiconductor substrate; forming a dielectric liner comprising a first dielectric material on said bottom surface and said sidewalls of said trench to line said trench; after forming the dielectric liner, depositing a second dielectric layer comprising a second dielectric material on the dielectric liner to at least partially fill said trench; partially etching said second dielectric layer to selectively remove said second dielectric layer from an upper portion of said trench while preserving said second dielectric layer on a lower portion of said trench and while preserving the dielectric liner in the upper portion of the trench and the lower portion of the trench, and filling said trench with a fill material which provides an electrical conductivity that is at least that of a semiconductor, wherein the dielectric liner lines the fill material in the trench. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
-
-
9. A method of fabricating a semiconductor device, comprising:
-
etching a semiconductor substrate to form a trench having sidewalls and a bottom surface; forming a dielectric liner comprising a first dielectric material on the bottom surface and the sidewalls of the trench to line the trench; after forming the dielectric liner, depositing a second dielectric layer comprising a second dielectric material on the dielectric liner to at least partially fill the trench; partially etching the second dielectric layer to selectively remove the second dielectric layer from an upper portion of the trench while preserving the second dielectric layer on a lower portion of the trench, wherein the dielectric liner extends along the sidewalls of the trench above a top surface of the second dielectric layer after the partial etching; and with the dielectric liner extending along the sidewalls of the trench above the top surface of the second dielectric layer, filling the trench with polysilicon, wherein the dielectric liner lines the polysilicon in the trench. - View Dependent Claims (10, 11, 12, 13)
-
-
14. A method of fabricating a semiconductor device, comprising:
-
forming a trench filed plate by; etching a semiconductor substrate to form a trench having sidewalls and a bottom surface; forming a dielectric liner comprising a first dielectric material on the bottom surface and the sidewalls of the trench to line the trench; depositing a second dielectric layer comprising a second dielectric material to at least partially fill the trench; partially etching the second dielectric layer to selectively remove the second dielectric layer from an upper portion of the trench while preserving the second dielectric layer on a lower portion of the trench, wherein the dielectric liner extends along the sidewalls of the trench above a top surface of the second dielectric layer after the partial etching; and with the dielectric liner extending along the sidewalls of the trench above the top surface of the second dielectric layer, filling the trench with polysilicon, wherein the dielectric liner lines the polysilicon in the trench; and forming a gate electrode on a gate dielectric that is on a top surface of the semiconductor substrate, wherein there is a space between the gate electrode and the polysilicon in the trench.
-
Specification