Microprocessor-assisted calibration for analog-to-digital converter

• US 9,654,133 B2
• Filed: 12/01/2015
• Issued: 05/16/2017
• Est. Priority Date: 12/17/2014
• Status: Active Grant

• Current Assignee: Analog Devices, Inc.
• Original Assignee: Analog Devices, Inc.
• Inventors: Otte, Eric, Rakuljic, Nevena, Bray, Jeffrey Paul, Speir, Carroll C.
• Primary Examiner(s): Mai, Lam T
• Application Number:
  US14/955,888
• Publication Number:
  US 20160182074A1
• Time in Patent Office: 532 Days
• Field of Search: 341118-155
• CPC Class Codes: H03M 1/1019 by storing a corrected or correction value in a digital look-up table
• CPC Class Codes: H03M 1/1028 at two points of the transfer characteristic, i.e. by adjusting two reference values, e.g. offset and gain error gain setting for range control H03M1/18
• CPC Class Codes: H03M 1/12 Analogue/digital converters H03M1/001 – H03M1/10 take precedence
• CPC Class Codes: H03M 1/121 Interleaved, i.e. using multiple converters or converter parts for one channel
• CPC Class Codes: H03M 1/1215 using time-division multiplexing
• CPC Class Codes: H03M 1/128 at random intervals, e.g. digital alias free signal processing [DASP]
• CPC Class Codes: H03M 1/46 with digital/analogue converter for supplying reference values to converter
• CPC Class Codes: H03M 1/462 Details of the control circuitry, e.g. of the successive approximation register
• CPC Class Codes: H03M 1/468 in which the input S/H circuit is merged with the feedback DAC array
• CPC Class Codes: H03M 3/382 at one point of the transfer characteristic, i.e. by adjusting a single reference value, e.g. bias or gain error
• CPC Class Codes: H03M 3/498 Variable sample rate

Abstract

Analog-to-digital converters (ADCs) can have errors which can affect their performance. To improve the performance, many techniques have been used to compensate or correct for the errors. When the ADCs are being implemented with sub-micron technology, ADCs can be readily and easily equipped with an on-chip microprocessor for performing a variety of digital functions. The on-chip microprocessor and any suitable digital circuitry can implement functions for reducing those errors, enabling certain undesirable artifacts to be reduced, and providing a flexible platform for a highly configurable ADC. The on-chip microprocessor is particularly useful for a randomized time-interleaved ADC. Moreover, a randomly sampling ADC can be added in parallel to a main ADC for calibration purposes. Furthermore, the overall system can include an efficient implementation for correcting errors in an ADC.

Claims

1. A time-interleaved analog-to-digital converter comprising:

two or more analog-to-digital converters for sampling, interleaved in time, an analog input signal;

first circuitry for generating measurements by processing a plurality of samples of signals in the two or more analog-to-digital converters and recording the measurements in an on-chip memory accessible by a microprocessor on-chip with the two or more analog-to-digital converters;

the microprocessor for executing instructions stored on-chip configured to carry out one or more calibration algorithms for calculating one or more correction terms based on the measurements; and

second circuitry for correcting one or more signals in the two or more analog-to-digital converters based on the correction terms.

2. The time-interleaved analog-to-digital converter of claim 1, further comprising:

a clock generator for generating a clock signal for the microprocessor to provide spread spectrum clocking, wherein the clock signal has on average a particular frequency but an instantaneous period of the clock signal is spread over multiple frequencies.

3. The time-interleaved analog-to-digital converter of claim 2, wherein the clock generator generates clock signals for running one or more of the following:

any one or more of the two or more analog-to-digital converters, and a reference analog-to-digital converter sampling in parallel with the two or more analog-to-digital converters.

4. The time-interleaved analog-to-digital converter of claim 1, wherein the first circuitry for generating the measurements comprises one or more of the following:

correlator logic, accumulation logic, decimation logic, absolute value logic, and squaring logic.

5. The time-interleaved analog-to-digital converter of claim 1, wherein the second circuitry comprises registers for storing correction terms, said registers accessible by or are available to one or more of the following:

any one or more of the two or more analog-to-digital converters, the second circuitry, and a reference analog-to-digital converter sampling along with the two or more analog-to-digital converters.

6. The time-interleaved analog-to-digital converter of claim 1, wherein the instructions includes a code portion selected from a plurality of code portions for different applications, wherein the code portion is selected using one or more of the following:

one or more fuses, non-volatile memory, and one or more input pins.

7. The time-interleaved analog-to-digital converter of claim 6, wherein the code portions correspond to different calibration sequences or different calibration schemes for the time-interleaved analog-to-digital converter.

8. The time-interleaved analog-to-digital converter of claim 1, wherein the microprocessor polls the on-chip memory for measurements.

9. The time-interleaved analog-to-digital converter of claim 1, wherein:

the microprocessor asserts a start signal to the first circuitry to initiate processing of signals in the two or more analog-to-digital converters by the second circuitry; and

the second circuitry transmits an interrupt to the microprocessor to signal to the microprocessor that the measurements are ready.

10. The time-interleaved analog-to-digital converter of claim 1, further comprising:

a digital-to-analog converter having a plurality of bits for generating bits of a random signal being injected into a first one of the two or more analog-to-digital converters; and

a subtraction circuit for subtracting the injected random signal, the subtraction circuit comprising two registers per each bit of the digital-to-analog converter, wherein values stored in the two registers are selectable by a respective bit of the random signal for subtracting the random signal;

wherein;

the second circuitry comprises a correlator and an accumulator block for estimating errors of a particular bit in the digital-to-analog converter; and

the microprocessor updates values stored in the two registers per each bit based on the estimated errors.

11. The time-interleaved analog-to-digital converter of claim 10, wherein the digital-to-analog converter is configured to toggle between two values corresponding to a bit under calibration every clock cycle, and randomly toggle between two values for other bits on a divide by two clock, to allow an error of the bit under calibration to be measured by the correlator and the accumulator block.

22. The time-interleaved analog-to-digital converter of claim 1, wherein the two or more analog-to digital converters sample the analog input signal according to a pseudo-randomized sequence.

23. The time-interleaved analog-to-digital converter of claim 1, wherein the measurements are accessible to the microprocessor at a rate slower than a clock rate of the microprocessor.

24. The time-interleaved analog-to-digital converter of claim 1, further comprising:

a first in first out buffer to store data captured from the two or more analog-to-digital converters.

25. The time-interleaved analog-to-digital converter of claim 1, further comprising:

a clock generator for generating a clock signal for the microprocessor to provide spread spectrum clocking, wherein the clock signal has on average a particular frequency but an instantaneous period of the clock signal is randomized.

26. The time-interleaved analog-to-digital converter of claim 10, wherein the correlator is a one-bit correlator.

12. A method for assisting a time-interleaved analog-to-digital converter, the method comprising:

executing, by a microprocessor on-chip with the time-interleaved analog-to-digital converter, instructions stored on-chip to calculate coefficients for calibrating the time-interleaved analog-to-digital converter;

processing, by dedicated circuitry, signals in the time-interleaved analog-to-digital converter;

recording, by the dedicated circuitry, measurements of the signals in a memory accessible to the on-chip microprocessor; and

writing, by the on-chip microprocessor, the coefficients to calibration circuitry for adjusting one or more signals in the time-interleaved analog-to-digital converter and correcting one or more errors in the time-interleaved analog-to-digital converter, wherein the coefficients are determined by the on-chip microprocessor based on the measurements and the instructions.

13. The method of claim 12, further comprising:

detecting, by the on-chip microprocessor, condition(s) in the time-interleaved analog-to-digital converter based on the measurements recorded by the dedicated circuitry; and

adjusting, by the on-chip microprocessor, one or more parts of an adaptation algorithm based on the condition(s) being detected.

14. The method of claim 12, further comprising:

ensuring, by the on-chip microprocessor, the coefficients being written to the calibration circuitry do not go beyond a suitable range or do meet one or more expected characteristics.

15. The method of claim 12, further comprising:

adjusting, by the on-chip microprocessor, the dedicated circuitry based on measurements of a state of the time-interleaved analog-to-digital converter, wherein adjusting the dedicated circuitry comprises adjusting a number of samples being used for averaging in an accumulator or a term used for dividing an accumulated value when computing an average.

16. The method of claim 12, further comprising:

executing, by the on-chip microprocessor, an adaptation algorithm for updating the coefficients being written to the calibration circuitry; and

adjusting, by the on-chip microprocessor, a rate of the adaptation algorithm based on a state of the time-interleaved analog-to-digital converter.

17. The method of claim 12, further comprising:

determining whether an input frequency is of a certain range; and

tuning a number of dithering levels of the time-interleaved converter in response to determining the input frequency is of the certain range.

27. The method of claim 12, further comprising:

selecting a code portion from a plurality of code portions to be used as the instructions, wherein the code portion is selected using one or more of the following;

one or more fuses, non-volatile memory, and one or more input pins.

28. The method of claim 12, wherein the time-interleaved analog-to-digital converter comprises at least two analog-to-digital converters sampling, interleaved in time according to a pseudo-randomized sequence, an analog input signal.

18. A system on-chip with a time-interleaved analog-to-digital converter for assisting the time-interleaved analog-to-digital converter, the system comprising:

first circuitry for generating measurements by processing a plurality of samples of signals in the two or more analog-to-digital converters and recording the measurements in an on-chip memory accessible by a microprocessor on-chip with the time-interleaved analog-to-digital converter;

a microprocessor for executing instructions to carry out arithmetic logic for processing the measurements and calculating correction terms for calibrating the time-interleaved analog-to-digital converter;

memory for storing instructions and data associated with the arithmetic logic; and

an interrupt arbiter including second circuitry for generating an interrupt signal to the microprocessor in response to receiving one or more signals from the first circuitry indicating measurements are ready.

19. The system of claim 18, further comprising:

one or more sensors for providing sensor measurements to the microprocessor to change one or more rates for updating error coefficients associated with the calibration according to the sensor measurements.

20. The system of claim 18, further comprising:

registers for storing data for assisting the time-interleaved analog-to-digital converter, wherein the registers are accessible to the microprocessor and the time-interleaved analog-to-digital converter.

21. The system of claim 20, wherein the registers store one or more of the following:

error coefficients, measured error, states of the microprocessor, parameters for calibration processes, and states of the calibration processes.

29. A time-interleaved data converter comprising:

two or more data converters operating in a time-interleaved fashion;

circuitry for processing signals of the two or more data converter and recording measurements based on the signals in a memory accessible by the microprocessor; and

a microprocessor on-chip with the two or more data converters for executing instructions stored on-chip configured to execute computations to calculate one or more coefficients based on the measurements;

wherein the microprocessor is further configured to write the one or more coefficients usable to correct a signal in the time-interleaved data converter.

30. The time-interleaved data converter of claim 29, further comprising:

a clock generator for generating a clock signal for the microprocessor to provide spread spectrum clocking, wherein the clock signal has on average a particular frequency but an instantaneous period of the clock signal is spread over multiple frequencies.

31. The time-interleaved data converter of claim 29, wherein the circuitry comprises one or more of the following:

correlator logic, accumulation logic, decimation logic, absolute value logic, and squaring logic.

32. The time-interleaved data converter of claim 29, wherein the instructions includes a code portion selected from a plurality of code portions corresponding to different calibration sequences, wherein the code portion is selected using one or more of the following:

one or more fuses, non-volatile memory, and one or more input pins.