System and method for detecting unknown materials using short wave infrared hyperspectral imaging
First Claim
1. A method comprising:
- collecting a plurality of interacted photons from an unknown sample;
generating a first test data set from a first detector, the first data set comprising a short-wave infrared hyperspectral image from a first plurality of the plurality of interacted photons collected at wavelengths ranging from about 900-1,700 nm;
generating a second test data set from the first detector, the second data set comprising an extended short-wave infrared hyperspectral image from a second plurality of the plurality of interacted photons collected at wavelengths ranging from about 1,200-2,500 nm; and
analyzing the first test data set and the second test data set to associate the unknown sample with a known sample.
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Abstract
A system and method for analyzing unknown materials on surfaces including, but not limited to, chemical materials, biological materials, hazardous materials, drug materials, and non-threat materials using SWIR and/or extended range SWIR hyperspectral and spectroscopic techniques. A system comprising a collection optics, a tunable filter, and a first detector for generating a test data set representative of the unknown sample. A second detector, comprising a visible imaging device, may be configured to operate in a scanning mode to locate areas of interest for further interrogation using SWIR. A method comprising generating a SWIR test data set representative of the unknown sample and analyzing the unknown sample to detect, identify and/or distinguish an unknown material as a known material. This analysis may be achieved by comparing the test data set to a reference data set using at least one chemometric technique.
17 Citations
47 Claims
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1. A method comprising:
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collecting a plurality of interacted photons from an unknown sample; generating a first test data set from a first detector, the first data set comprising a short-wave infrared hyperspectral image from a first plurality of the plurality of interacted photons collected at wavelengths ranging from about 900-1,700 nm; generating a second test data set from the first detector, the second data set comprising an extended short-wave infrared hyperspectral image from a second plurality of the plurality of interacted photons collected at wavelengths ranging from about 1,200-2,500 nm; and analyzing the first test data set and the second test data set to associate the unknown sample with a known sample. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18)
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19. A system comprising:
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a collection optic configured to collect a plurality of interacted photons from an unknown sample; a tunable filter configured to filter the plurality of interacted photons into a plurality of filtered photons comprising a plurality of wavelength bands; a first detector configured to detect a first plurality of the plurality of filtered photons and generate a first test data set comprising a short-wave infrared hyperspectral image collected at wavelengths ranging from about 900-1,700 nm and detect a second plurality of the plurality of filtered photons and generate a second test data set comprising an extended short-wave infrared hyperspectral image collected at wavelengths ranging from about 1,200-2,500 nm. - View Dependent Claims (20, 21, 22, 23, 24, 25, 26, 27, 28, 29, 30, 31, 32, 33, 34, 35, 36, 37)
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38. A storage medium containing machine readable program code, which, when executed by a processor, causes the processor to perform the following:
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generate a first test data from a first detector, the first data set comprising a short-wave infrared hyperspectral image collected at wavelengths ranging from about 900-1,700 nm and a second data set from the first detector, the second data set comprising an extended range short-wave infrared hyperspectral image data set collected at wavelengths ranging from about 1,200-2,500 nm; and analyze the first test data set and the second test data set to associate the unknown sample to a known material. - View Dependent Claims (39, 40, 41, 42, 43, 44, 45, 46, 47)
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Specification