Methods and apparatus for defining a probe configuration using a probe configuration tool

• US 9,664,492 B2
• Filed: 12/27/2012
• Issued: 05/30/2017
• Est. Priority Date: 12/27/2012
• Status: Active Grant

• Current Assignee: Baker Hughes Holdings LLC (Baker Hughes Company)
• Original Assignee: General Electric Company
• Inventors: Frogget, Daryl Ronald, Marshall, Donald Evan, Tappan, Jacqueline Marie, Alldredge, Gregory Mark, Abbott, Brian Dean
• Primary Examiner(s): Nghiem, Michael
• Application Number:
  US13/728,368
• Publication Number:
  US 20140188428A1
• Time in Patent Office: 1,615 Days
• Field of Search: 702108, 702183
• CPC Class Codes: G01B 5/14 for measuring distance or clearance between spaced objects or spaced apertures G01B5/24 takes precedence
• CPC Class Codes: G05B 2219/32235 Sharing of data between process control and maintenance management computers
• CPC Class Codes: G05B 2219/35 Nc in input of data, input till input file format
• CPC Class Codes: G06F 3/0484 for the control of specific functions or operations, e.g. selecting or manipulating an object, an image or a displayed text element, setting a parameter value or selecting a range

Abstract

A method for defining a probe configuration using an interactive probe configuration tool is provided. The probe configuration tool comprises a shaft icon displayed on the probe configuration tool, and a probe position indicator configured to display an orientation of at least one first probe icon relative to the shaft icon. The probe position indicator is further configured to modify the orientation of the at least one first probe icon based on input from a user. The probe configuration tool further comprises a probe type indicator configured to display a type of the at least one first probe icon, wherein the probe position indicator and the probe type indicator are simultaneously displayed on a presentation interface.

Claims

1. A non-transitory computer readable medium comprising instructions that when executed by a processor, cause the processor to:

execute a probe configuration tool comprising;

a shaft icon displayed on said probe configuration tool;

a probe position indicator configured to display an orientation of at least one first probe icon relative to said shaft icon, said probe position indicator is further configured to modify the orientation of said at least one first probe icon based on a non-typed input from a user; and

a probe type indicator configured to display a type of said at least one first probe icon, wherein at least said probe position indicator and said probe type indicator are simultaneously displayed on a presentation interface; and

a probe position editor configured to;

display an angular value representative of the orientation of the at least one first probe icon with respect to a reference point on said shaft icon; and

modify the angular value representative of the orientation based on a typed input from the user.

2. The non-transitory computer readable medium of claim 1 comprising instructions that when executed by a processor, cause the processor to:

execute the probe configuration tool to further apply a scale factor display configured to;

display a sensitivity level of said at least one first probe icon; and

modify the sensitivity level of said at least one first probe icon based on input from the user, wherein said probe type indicator is further configured to selectively change the type of said at least a first probe icon based on input from the user.

3. The non-transitory computer readable medium of claim 1 comprising instructions that when executed by a processor, cause the processor to:

execute the probe configuration tool to further apply a direction editor configured to;

display a direction of the angular value of the orientation with respect to said reference point; and

modify the direction of the angular value based on input from the user.

4. The non-transitory computer readable medium of claim 3, wherein said probe position editor and said direction editor are synchronized with said probe position indicator such that when the orientation of said first probe icon is modified using one of said probe position editor, direction editor, and probe position indicator, said probe configuration tool is configured to automatically modify the orientation displayed on the others of said probe position editor, direction editor, or probe position indicator correspondingly.

5. The non-transitory computer readable medium of claim 1, wherein the probe position indicator is further configured to simultaneously display the orientation of said at least one first probe icon and an orientation of a second probe icon relative to said shaft icon, wherein the orientation of said second probe icon is modifiable based on input from the user.

6. A method of defining a probe configuration, said method comprising:

displaying to a user, on a presentation interface coupled to a processor, a shaft icon and an orientation of at least one first probe icon relative to the shaft icon;

modifying, based on a non-typed user input, the orientation of the at least one first probe icon;

displaying to the user a type of the at least one first probe icon, wherein the orientation and type of the at least one first probe icon are simultaneously displayed on the presentation interface;

displaying an angular value representative of the orientation of the at least one first probe icon with respect to a reference point on the shaft icon; and

modifying the angular value based on a typed input from the user.

7. The method of defining a probe configuration in accordance with claim 6 further comprising:

displaying a sensitivity level of the at least one first probe icon;

modifying the sensitivity level based on input from the user; and

modifying the type of the at least one first probe icon based on input from the user.

8. The method of defining a probe configuration in accordance with claim 6 further comprising:

displaying a direction of the angular value of the orientation with respect to the reference point; and

modifying the direction based on input from the user.

9. The method of defining a probe configuration in accordance with claim 6 further comprising:

simultaneously displaying the orientation of the at least one first probe icon and an orientation of a second probe icon relative to the shaft icon; and

modifying the orientation of the second probe icon based on input from the user.

10. The method of defining a probe configuration in accordance with claim 9, further comprising synchronizing the first and second probe icons such that when the orientation of one of the first and second probe icons is modified, the orientation of the other of said probe icons is automatically modified.

11. A computing device comprising:

a processor configured to;

display a shaft icon representative of a shaft and a probe position indicator indicative of an orientation of a probe positioned proximate to said shaft, said probe position indicator is configured to display an orientation of at least one first probe icon, representative of said probe, relative to said shaft icon, said probe position indicator is further configured to modify the orientation of said at least one first probe icon based on a non-typed input from a user; and

a probe type indicator configured to display a type of said at least one first probe icon, wherein at least said probe position indicator and said probe type indicator are simultaneously displayed on a presentation interface;

display a scale factor display, said scale factor display is configured to;

display a sensitivity level of said at least one first probe icon; and

modify the sensitivity level based on input from the user, wherein said probe type indicator is further configured to selectively change the type of said at least a first probe icon based on input from the user;

display a probe position editor, said probe position editor is configured to;

display an angular value representative of the orientation of said at least one first probe icon with respect to a reference point on said shaft icon; and

modify the angular value representative of the orientation based on a typed input from the user.

12. The computing device in accordance with claim 11, wherein said probe position indicator is further configured to simultaneously display the orientation of said at least one first probe icon and an orientation of a second probe icon relative to said shaft icon, wherein the orientation of said second probe icon is modifiable based on input from the user.

13. The computing device in accordance with claim 12 further configured to synchronize said first and second probe icons such that when the orientation of one of said first and second probe icons is modified, the orientation of the other of said probe icons is automatically modified.

14. A non-transitory computer readable medium comprising instructions that when executed by a processor, cause the processor to:

execute a probe configuration tool comprising;

a shaft icon displayed on said probe configuration tool;

probe position indicator configured to display an orientation of at least one first probe icon relative to said shaft icon, said probe position indicator is further configured to modify the orientation of said at least one first probe icon based on input from a user; and

a probe type indicator configured to display a type of said at least one first probe icon, wherein at least said probe position indicator and said probe type indicator are simultaneously displayed on a presentation interface;

wherein said probe position indicator is further configured to simultaneously display the orientation of said at least one first probe icon and an orientation of a second probe icon relative to said shaft icon, wherein the orientation of said second probe icon is modifiable based on the input from the user;

wherein the first and second probe icons are synchronized such that when the orientation of one of said first and second probe icons is modified, the orientation of the other of said probe icons is automatically modified.

15. The non-transitory computer readable medium of claim 14, wherein the at least one first probe icon is selectively fixed at a pre-determined angular value relative to said second probe icon, and wherein said first and second probe icons are independently positionable.

16. A computing device comprising:

a processor configured to;

display a shaft icon representative of a shaft and a probe position indicator indicative of an orientation of a probe positioned proximate to said shaft, said probe position indicator is configured to display an orientation of at least one first probe icon, representative of said probe, relative to said shaft icon, said probe position indicator is further configured to modify the orientation of said at least one first probe icon based on input from a user; and

a probe type indicator configured to display a type of said at least one first probe icon, wherein at least said probe position indicator and said probe type indicator are simultaneously displayed on a presentation interface,

wherein said probe position indicator is further configured to simultaneously display the orientation of said at least one first probe icon and an orientation of a second probe icon relative to said shaft icon, wherein the orientation of said second probe icon is modifiable based on the input from the user, and

configured to synchronize said first and second probe icons such that when the orientation of one of said first and second probe icons is modified, the orientation of the other of said probe icons is automatically modified.

17. The computing device in accordance with claim 16, wherein said at least one first probe icon is selectively fixed at a pre-determined angular value relative to said second probe icon, and wherein said first and second probe icons are independently positionable.