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Launch vehicle testing system

  • US 9,665,453 B2
  • Filed: 09/12/2012
  • Issued: 05/30/2017
  • Est. Priority Date: 09/12/2012
  • Status: Active Grant
First Claim
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1. A system for testing a launch vehicle, the system comprising:

  • a flight control section including radiation hardened flight electronics in the launch vehicle, the flight electronics including a radiation hardened flight processor;

    a non-flight test section operatively coupled to the flight control section, the non-flight test section comprising;

    a first electronic control module in operative communication with the flight electronics; and

    a second electronic control module that provides redundancy with respect to the first electronic control module, the second electronic control module in operative communication with the flight electronics;

    wherein the first and second electronic control modules include non-radiation hardened electronics;

    a first flight processor test interface coupled between the first electronic control module and the radiation hardened flight processor;

    a second flight processor test interface coupled between the second electronic control module and the radiation hardened flight processor;

    a flight processor control interface configured to assure that the test interfaces are controlled by the flight electronics;

    an isolation interface comprising a set of radiation hardened buffers configured to assure that the test interfaces are isolated from the flight processor control interface;

    a set of flight control section interfaces configured to assure that enables and direction control to the radiation hardened buffers are managed by the radiation hardened flight processor;

    a power interface configured to assure that power switching is controlled by the radiation hardened flight processor and radiation hardened switching electronics, the power interface further configured to assure that test logic is powered-off during flight such that the non-radiation hardened electronics in the non-flight test section are electrically isolated from the flight electronics; and

    an embedded software control mechanism configured to;

    select one of the first and second electronic control modules to send data to the flight control section during a test;

    determine whether a non-flight hardware error has occurred in the selected electronic control module;

    automatically select the other electronic control module to send data to the flight control section after the non-flight hardware error is determined to have occurred; and

    isolate the electronic control module where the non-flight hardware error occurred;

    wherein the first and second flight processor test interfaces are configured to provide for redundant flight system test and debug, such that any flight system faults are isolated from any non-flight system faults.

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