Background correction in emission spectra

• US 9,677,934 B2
• Filed: 08/27/2014
• Issued: 06/13/2017
• Est. Priority Date: 08/28/2013
• Status: Active Grant

• Current Assignee: Thermo Electron Manufacturing Limited (Thermo Fisher Scientific Incorporated)
• Original Assignee: Thermo Electron Manufacturing Limited (Thermo Fisher Scientific Incorporated)
• Inventors: Hartwell, Stephen, Bailey, Nigel Cooper
• Primary Examiner(s): Ayub, Hina F
• Application Number:
  US14/470,875
• Publication Number:
  US 20150062577A1
• Time in Patent Office: 1,021 Days
• Field of Search: 356307, 250 21, 702 85- 95
• CPC Class Codes: G01J 3/0297 Constructional arrangements for removing other types of optical noise or for performing calibration
• CPC Class Codes: G01J 3/28 Investigating the spectrum using colour filters G01J3/51
• CPC Class Codes: G01J 3/443 Emission spectrometry

Abstract

A method for deriving a background-corrected portion of a measured optical emission spectrum comprising the steps of identifying two or more background correction points from the portion of the measured emission spectrum; deriving a background correction function fitted to the identified background correction points, and applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum, wherein the background correction points are identified from the measured data points by consideration of the gradients between the measured data points.

Claims

1. A method for deriving a background-corrected portion of a measured emission spectrum, for determining concentration of an element in a sample, comprising the steps of:

acquiring the portion of the measured emission spectrum;

identifying two or more background correction points from the portion of the measured emission spectrum;

deriving a background correction function fitted to the identified background correction points,

applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum;

wherein

the portion of the measured emission spectrum comprises measured data points which consist of a series of n intensity values I_n, at discrete wavelengths or values corresponding to wavelength λ

_n, the series extending from a first measured data point to a last measured data point, and

the background correction points are identified from the measured data points by the following steps;

(1) identifying a first background correction point as the first measured data point;

(2) calculating the gradients G_m of straight lines between the background correction point just identified and each subsequent measured data point in the series;

(3) identifying a next background correction point as the measured data point which lies on the straight line which has the minimum gradient of all the calculated gradients G_m;

(4) if the background correction point just identified does not lie at the last measured data point, repeat the procedure from step (2) until it does; and

determining the element concentration in the sample using the background-corrected portion of the emission spectrum.

2. The method of claim 1 wherein the background correction function is a mathematical function which is fitted to the background correction points and the mathematical function is a combination of straight line functions taken between each successive pair of background correction points lying across the portion of measured emission spectrum.

3. The method of claim 2 wherein the background correction function is applied to any point P_k lying between a pair of background correction points by subtracting a background B_k from I_k, the intensity at point P_k, wherein B_k is derived by linear interpolation of the straight line function taken between the pair of background correction points which lie either side of point P_k.

4. The method of claim 1 wherein the background correction function is a mathematical function which is fitted to the background correction points and the mathematical function is a curve fitted to three or more background correction points.

5. The method of claim 4 wherein the background correction function is applied to any point P_k lying within the wavelength or values corresponding to wavelength bounds of the fitted curve by subtracting a background B_k from I_k, I_k being the intensity at point P_k, and B_k being derived from the intensity ordinate of the fitted curve at the wavelength or value corresponding to wavelength λ

_k.

6. The method of claim 1 wherein the background correction function is applied to all the points in the portion of the measured emission spectrum.

7. The method of claim 1 wherein gradients are calculated according to the function

8. The method of claim 1 wherein if the background correction points identified consist only of the first and last data points in the portion of measured emission spectrum, steps (1) to (4) are followed again using a subset of the portion of measured spectral data, the subset being all points from and including the second data point to the next-to-last data point, and additional background correction points thus identified together with the first and last data points in the portion of measured emission spectrum are used to derive the background correction function.

9. The method of claim 1 wherein if the background correction points identified consist only of the first and last data points in the portion of measured emission spectrum, the method further comprises:

(i) performing steps (1) to (4) from the top of a peak of the emission spectrum to the first data point to identify a first set of background correction points;

(ii) performing steps (1) to (4) from the top of the peak of the emission spectrum to the last data point, to identify a second set of background correction points;

(iii) discarding the first background correction point in the first set of background correction points and discarding the first background correction point in the second set of background correction points;

(iv) combining the two sets of background correction points to provide a single set of background correction points;

(v) deriving a background correction function fitted to the identified background correction points in the single set, and

(vi) applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum.

10. The method of claim 1 wherein the portion of measured spectral data is identified from a larger set of measured spectral data by a method of peak detection.

11. The method of claim 1 further comprising measuring spectral data prior to identifying one or more portions of the measured spectral data.

12. The method of claim 11 wherein the measured spectral data is measured using an inductively coupled plasma optical emission spectrometer.

13. The method of claim 11 wherein the measured spectral data is measured using a microwave induced plasma optical emission spectrometer.

14. A non transitory computer readable medium encoding a computer program for deriving a background-corrected portion of a measured emission spectrum, for determining concentration of an element in a sample, by performing the steps of:

acquiring the portion of the measured emission spectrum;

identifying two or more background correction points from the portion of the measured emission spectrum;

deriving a background correction function fitted to the identified background correction points;

applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum;

wherein

the portion of the measured emission spectrum comprises measured data points which consist of a series of n intensity values I_n, at discrete wavelengths or values corresponding to wavelength λ

_n, the series extending from a first measured data point to a last measured data point, and

the background correction points are identified from the measured data points by the following steps;

(1) identifying a first background correction point as the first measured data point;

(2) calculating the gradients G_m of straight lines between the background correction point just identified and each subsequent measured data point in the series;

(3) identifying a next background correction point as the measured data point which lies on the straight line which has the minimum gradient of all the calculated gradients G_m;

(4) if the background correction point just identified does not lie at the last measured data point, repeat the procedure from step (2) until it does; and

determining the element concentration in the sample using the background-corrected portion of the emission spectrum.

15. A system for determining a background-corrected portion of a measured emission spectrum, comprising:

a computer having an input for receiving a portion of measured emission spectrum data, and an output for outputting the background-corrected portion of a measured emission spectrum, for determining concentration of an element in a sample, derived by the computer from the portion of measured emission spectrum data;

wherein the computer is programmed with a program comprising;

one or more modules of program code for identifying two or more background correction points from the portion of the measured emission spectrum;

one or more modules of program code for deriving a background correction function fitted to the identified background correction points;

one or more modules of program code for applying the background correction function to the portion of the measured emission spectrum so as to produce a background-corrected portion of the emission spectrum;

wherein

the portion of the measured emission spectrum comprises measured data points which consist of a series of n intensity values I_n, at discrete wavelengths or values corresponding to wavelength λ

_n, the series extending from a first measured data point to a last measured data point, and

the background correction points are identified from the measured data points by the following steps;

(1) identifying a first background correction point as the first measured data point;

(2) calculating the gradients G_m of straight lines between the background correction point just identified and each subsequent measured data point in the series;

(3) identifying a next background correction point as the measured data point which lies on the straight line which has the minimum gradient of all the calculated gradients G_m;

(4) if the background correction point just identified does not lie at the last measured data point, repeat the procedure from step (2) until it does; and

determining the element concentration in the sample using the background-corrected portion of the emission spectrum.

16. The system of claim 15 further comprising an inductively coupled plasma optical emission spectrometer.

17. The system of claim 15 further comprising a microwave induced plasma optical emission spectrometer.