Systems and methods for machine control
First Claim
Patent Images
1. A computer implemented method for conducting machine control, the method comprising:
- scanning a region of space, the scanning including;
directing at least two emission cycles to form at least two scan patterns that scan from an emission region to the region of space, one scan pattern of the at least two scan patterns being different from at least one other scan pattern of the at least two scan patterns;
detecting a reflectance of the at least two scan patterns; and
determining that the detected reflectance indicates a presence of an object in the region of space;
determining a first object attribute set of one or more object attributes of the object for a first scan pattern of the at least two scan patterns;
determining a second object attribute set of one or more object attributes of the object for a second scan pattern of the at least two scan patterns;
analyzing the first object attribute set and the second object attribute set to determine a control portion of the object;
comparing the first object attribute set and the second object attribute set to determine control information; and
responding to the determined control information according to response criteria.
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Abstract
A region of space may be monitored for the presence or absence of one or more control objects, and object attributes and changes thereto may be interpreted as control information provided as input to a machine or application. In some embodiments, the region is monitored using a combination of scanning and image-based sensing.
427 Citations
26 Claims
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1. A computer implemented method for conducting machine control, the method comprising:
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scanning a region of space, the scanning including; directing at least two emission cycles to form at least two scan patterns that scan from an emission region to the region of space, one scan pattern of the at least two scan patterns being different from at least one other scan pattern of the at least two scan patterns; detecting a reflectance of the at least two scan patterns; and determining that the detected reflectance indicates a presence of an object in the region of space; determining a first object attribute set of one or more object attributes of the object for a first scan pattern of the at least two scan patterns; determining a second object attribute set of one or more object attributes of the object for a second scan pattern of the at least two scan patterns; analyzing the first object attribute set and the second object attribute set to determine a control portion of the object; comparing the first object attribute set and the second object attribute set to determine control information; and responding to the determined control information according to response criteria. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21, 22, 23, 24, 25, 26)
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Specification