Semiconductor device
First Claim
1. A semiconductor device comprising:
- an oxide semiconductor film over a substrate;
an insulating film over the oxide semiconductor film, wherein the insulating film comprises an oxide containing silicon; and
a gate electrode over the insulating film,wherein the oxide semiconductor film comprises a region in which a concentration of silicon is lower than or equal to 1.0 at. %, andwherein the region is located at an interface between the oxide semiconductor film and the insulating film and in contact with the insulating film.
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Accused Products
Abstract
The concentration of impurity elements included in an oxide semiconductor film in the vicinity of a gate insulating film is reduced. Further, crystallinity of the oxide semiconductor film in the vicinity of the gate insulating film is improved. A semiconductor device includes an oxide semiconductor film over a substrate, a source electrode and a drain electrode over the oxide semiconductor film, a gate insulating film which includes an oxide containing silicon and is formed over the oxide semiconductor film, and a gate electrode over the gate insulating film. The oxide semiconductor film includes a region in which the concentration of silicon is lower than or equal to 1.0 at. %, and at least the region includes a crystal portion.
233 Citations
15 Claims
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1. A semiconductor device comprising:
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an oxide semiconductor film over a substrate; an insulating film over the oxide semiconductor film, wherein the insulating film comprises an oxide containing silicon; and a gate electrode over the insulating film, wherein the oxide semiconductor film comprises a region in which a concentration of silicon is lower than or equal to 1.0 at. %, and wherein the region is located at an interface between the oxide semiconductor film and the insulating film and in contact with the insulating film. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A semiconductor device comprising:
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a first transistor comprising; a channel formation region comprising silicon; a gate insulating film over the channel formation region; and a first gate electrode; and a second transistor over the first transistor, the second transistor comprising; an oxide semiconductor film; an insulating film over the oxide semiconductor film, wherein the insulating film comprises an oxide containing silicon; and a second gate electrode over the insulating film, wherein the oxide semiconductor film comprises a region in which a concentration of silicon is lower than or equal to 1.0 at. %, and wherein the region is located at an interface between the oxide semiconductor film and the insulating film and in contact with the insulating film. - View Dependent Claims (10, 11, 12, 13, 14, 15)
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Specification