Methods, systems, and apparatus for imaging spectroscopy

• US 9,681,798 B2
• Filed: 11/05/2015
• Issued: 06/20/2017
• Est. Priority Date: 05/22/2013
• Status: Active Grant

• Current Assignee: Massachusetts Institute of Technology
• Original Assignee: Massachusetts Institute of Technology
• Inventors: Hunter, Ian W., Chen, Yi
• Primary Examiner(s): Geisel, Kara E
• Assistant Examiner(s): BOLOGNA, DOMINIC JOSEPH
• Application Number:
  US14/933,666
• Publication Number:
  US 20160066775A1
• Time in Patent Office: 593 Days
• CPC Class Codes: A61B 1/0638 providing two or more wavelengths
• CPC Class Codes: G01J 3/0286 Constructional arrangements for compensating for fluctuations caused by temperature, humidity or pressure, or using cooling or temperature stabilization of parts of the device; Controlling the atmosphere inside a spectrometer, e.g. vacuum
• CPC Class Codes: G01J 3/0291 Housings; Spectrometer accessories; Spatial arrangement of elements, e.g. folded path arrangements
• CPC Class Codes: G01J 3/1256 using acousto-optic tunable filter; acousto-optic elements or systems G02F1/11, G02F1/33
• CPC Class Codes: G01J 3/2823 Imaging spectrometer
• CPC Class Codes: G01J 3/45 Interferometric spectrometry
• CPC Class Codes: G01J 3/453 by correlation of the amplitudes
• CPC Class Codes: G01J 3/4535 Devices with moving mirror G01J3/4532 takes precedence

Abstract

Imaging spectrometers can be used to generate hyperspectral images for medical diagnoses, contaminant detection, and food safety inspections, among other applications. An exemplary imaging spectrometer includes an integrated position sensing array that measures the relative positions of the interferometer components based on an interference pattern generated by illuminating the interferometer with a reference beam. Such an imaging spectrometer includes a processor that controls the interferometer component position by actuating a voice coil and several piezo-electric elements to align the components with respect to each other and to provide a desired optical path length mismatch between the interferometer arms. In some cases, the processor may use feedback and feed forward control, possibly based on the actuators'"'"' transfer functions, for more precise positioning. The processor may also implement adaptive and recursive spectral sampling to reduce the image acquisition period.

Claims

1. A system for imaging spectroscopy of an object, the system comprising:

an interferometer, in optical communication with the object, to delay a first portion of an object beam from the object with respect to a second portion of the object beam by a delay period, the delay period proportional to an optical path length difference defined by a first optical element and a second optical element;

a first detector array, in optical communication with the interferometer, to sense at least one object interference pattern between the first portion of the object beam and the second portion of the object beam, the at least one object interference pattern representing a spectroscopic image of at least a portion of the object;

a reference beam source, in optical communication with the interferometer, to illuminate the first optical element with a first portion of a reference beam and the second optical element with a second portion of the reference beam; and

a second detector array, in optical communication with the interferometer, to sense a reference interference pattern between the first portion of the reference beam and the second portion of the reference beam, the reference interference pattern representing a position of the first optical element with respect to the second optical element.

2. The system of claim 1, further comprising:

a controller, operably coupled to the second detector array, to determine a misalignment of the first optical element with respect to the second optical element based at least in part on the reference interference pattern; and

at least one actuator, in mechanical communication with the first optical element, to move the first optical element with respect to the second optical element in response to the misalignment determined by the controller.

3. The system of claim 2, wherein the at least one actuator is configured to translate, tip, and/or tilt the first optical element with respect to the second optical element in response to the misalignment.

4. The system of claim 2, wherein the controller is configured to determine the optical path length difference based at least in part on the reference interference pattern and to actuate the at least one actuator so as to vary the optical path length difference.

5. The system of claim 2, wherein:

the at least one actuator is configured to move the first optical element to a plurality of positions with respect to the second optical element, each position in the plurality of positions corresponding to a different optical path length difference; and

the first detector array is configured to sense a plurality of object interference patterns, each object interference pattern in the plurality of object interference patterns corresponding to a respective position in the plurality of positions.

6. The system of claim 5, wherein the controller is configured to select at least one first position within the plurality of positions in response to at least one object interference pattern in the plurality of object interference patterns.

7. The system of claim 5, further comprising:

a processor, operably coupled to the first detector array and the controller, to estimate a spectroscopic image of the object based on the plurality of object interference patterns, and

wherein the controller is configured to select at least one position within the plurality of positions based at least in part on the spectroscopic image.

8. The system of claim 5, wherein the plurality of positions includes fewer positions than a number of resolvable spectral bins in the spectroscopic image.

9. The system of claim 5, wherein the controller is configured to control the at least one actuator based at least in part on a transfer function of the at least one actuator and a desired position of the first optical element with respect to the second optical element.

10. The system of claim 2, wherein the at least one actuator comprises:

a voice-coil element to move the first optical element with respect to the second optical element.

11. The system of claim 10, wherein the at least one actuator further comprises:

a piezo-electric element to move the first optical element with respect to the second optical element at a rate greater than a frame rate of the first detector array and smaller than bandwidth of the second detector array.

12. The system of claim 2, further comprising:

at least one flexure coupling the at least one actuator to the first optical element.

13. The system of claim 1, further comprising:

a frame to support the first optical element and the second optical element; and

at least one flexure coupling the first optical element to the frame.

14. The system of claim 1, further comprising:

a light source to illuminate an object so as to produce the object beam via reflection, scattering, and/or emission by the object.

15. The system of claim 14, further comprising:

an endoscopic housing to contain the light source, the reference beam source, the first optical element, and the second optical element.

16. The system of claim 1, wherein the first portion of the object beam illuminates the first optical element and the second portion of the object beam illuminates the second optical element.

17. A method of imaging spectroscopy, the method comprising:

(A) receiving an object beam from an object;

(B) delaying, with an interferometer including a first optical element and a second optical element, a first portion of the object beam with respect to a second portion of the object beam by a delay period, the delay period proportional to an optical path length difference defined by the first optical element and the second optical element;

(C) sensing, with a first detector array, at least one object interference pattern between the first portion of the object beam and the second portion of the object beam, the at least one object interference pattern representing a spectroscopic image of at least a portion of the object;

(D) illuminating the first optical element with a first portion of a reference beam and the second optical element with a second portion of the reference beam; and

(E) sensing a reference interference pattern between the first portion of the reference beam and the second portion of the reference beam, the reference interference pattern representing a position of the first optical element with respect to the second optical element.

18. The method of claim 17, further comprising:

(F) determining, with a controller, a misalignment of the first optical element with respect to the second optical element based at least in part on the reference interference pattern; and

(G) moving, with at least one actuator, the first optical element with respect to the second optical element in response to the misalignment determined by the controller.

19. The method of claim 18, wherein (G) comprises translating, tipping, and/or tilting the first optical element with respect to the second optical element.

20. The method of claim 18, wherein (G) comprising actuating the at least one actuator based at least in part on a transfer function of the at least one actuator and a desired position of the first optical element with respect to the second optical element.

21. The method of claim 18, further comprising:

determining the optical path length difference based at least in part on the reference interference pattern; and

actuating the at least one actuator so as to vary the optical path length difference.

22. The method of claim 17, wherein:

(B) comprises delaying the first portion of the object beam with respect to the second portion of the object at each of a plurality of delay periods, and

(C) comprises sensing a plurality of object interference patterns corresponding to the plurality of delay periods.

23. The method of claim 22, wherein (B) comprises selecting at least one delay period in the plurality of delay periods in response to at least one object interference pattern in the plurality of object interference patterns.

24. The method of claim 22, wherein:

(C) further comprises estimating the spectroscopic image of the object based on the plurality of object interference patterns, and

(B) further comprises selecting at least one position within the plurality of positions based at least in part on the spectroscopic image.

25. The method of claim 24, wherein (C) further comprises estimating at least n spectral bins associated with the spectroscopic image from m object interference patterns, wherein n>

m.

26. An imaging spectrometer comprising:

a beamsplitter, to split light from an object into a first object beam and a second object beam;

at least one optical element, in optical communication with the beamsplitter, to delay the first object beam with respect to the second object beam by a plurality of delay periods;

at least one actuator, in mechanical communication with the at least one optical element, to move the at least one optical element to each of a plurality of positions so as to produce the plurality of delay periods, the at least one actuator being further configured to tip and/or tilt the at least one optical element;

a detector array, in optical communication with the at least one optical element, to sense a plurality of interference periods, the plurality of interference periods comprising at least one interference pattern between the first object beam and the second object beam at each delay period in the plurality of delay periods; and

a processor, operably coupled to the detector array, to determine a spectroscopic image of the object based at least in part on the plurality of interference patterns and to determine at least one position in the plurality of positions based at least in part on the spectroscopic image and a transfer function of the at least one actuator.

27. The imaging spectrometer of claim 26, wherein the delay periods in the plurality of delay periods are spaced at irregular intervals.