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Proactively correcting behavior that may affect I/O performance in a non-volatile semiconductor storage device

  • US 9,684,460 B1
  • Filed: 07/29/2016
  • Issued: 06/20/2017
  • Est. Priority Date: 09/15/2010
  • Status: Active Grant
First Claim
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1. A method of proactively addressing conditions that affect input/output (′

  • I/O′

    ) performance in a non-volatile semiconductor storage system that includes a plurality of non-volatile semiconductor storage devices, the method comprising;

    monitoring, for a non-volatile semiconductor storage devices, one or more non-volatile semiconductor device-related performance attributes;

    determining, for the non-volatile semiconductor storage device in dependence upon the one or more non-volatile semiconductor device-related performance attributes, whether the non-volatile semiconductor storage device is exhibiting a behavior that may affect I/O performance, including determining whether the non-volatile semiconductor storage device is about to perform an internal cache flush; and

    responsive to determining that the non-volatile semiconductor storage device is exhibiting the behavior that may affect I/O performance, scheduling a proactive operation associated with the behavior on the non-volatile semiconductor storage device.

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