Multi-joint arm type measurement apparatus

• US 9,689,663 B2
• Filed: 05/26/2015
• Issued: 06/27/2017
• Est. Priority Date: 05/30/2014
• Status: Active Grant

• Current Assignee: Mitutoyo Corporation
• Original Assignee: Mitutoyo Corporation
• Inventors: Nemoto, Kentaro, Nagataki, Yuichi
• Primary Examiner(s): Fulton, Christopher
• Application Number:
  US14/721,895
• Publication Number:
  US 20150345933A1
• Time in Patent Office: 763 Days
• Field of Search: 33503, 33557, 33560
• CPC Class Codes: G01B 11/007 feeler heads therefor
• CPC Class Codes: G01B 11/245 using a plurality of fixed, simultaneously operating transducers G01B11/2408 - G01B11/2425, G01B11/255 take precedence
• CPC Class Codes: G01B 21/047 Accessories, e.g. for positioning, for tool-setting, for measuring probes
• CPC Class Codes: G01B 5/012 Contact-making feeler heads therefor

Abstract

A multi-joint arm type measurement apparatus includes a plurality of probes mounted at a tip of a multi-joint mechanism, and a probe rotation holding mechanism configured to rotatably hold the other probe around one probe and to fix a rotating position of the other probe at a plurality of positions.

Claims

1. A multi-joint arm type measurement apparatus comprising:

a plurality of probes mounted at a tip of a multi-joint mechanism, the plurality of probes including at least a first probe and a second probe; and

a probe rotation holding mechanism configured to rotatably hold the first probe around the second probe, the probe rotation holding mechanism being configured to fix a rotating position of the first probe at a plurality of positions, the probe rotation holding mechanism including a click stop mechanism including;

(i) a wheel formed with a plurality of notches, and (ii) a rotation stopper urged towards the wheel to be engaged with the plurality of notches so as to fix the rotating position of the first probe at the plurality of positions.

2. The multi-joint arm type measurement apparatus according to claim 1, wherein the second probe is a contact probe and the first probe is a non-contact probe.

3. The multi-joint arm type measurement apparatus according to claim 2, wherein the probe rotation holding mechanism is configured to rotate the non-contact probe around the contact probe.

4. The multi-joint arm type measurement apparatus according to claim 2, wherein the contact probe is a ball probe, and the non-contact probe is an optical probe.

5. A multi-joint arm type measurement apparatus comprising:

a plurality of probes mounted at a tip of a multi-joint mechanism, the plurality of probes including at least a first probe and a second probe; and

a probe rotation holding mechanism configured to rotatably hold the first probe around the second probe, the probe rotation holding mechanism being configured to fix a rotating position of the first probe at a plurality of positions, wherein the probe rotation holding mechanism includes a ratchet mechanism configured to fix the rotating position of the first probe at the plurality of positions.

6. The multi-joint arm type measurement apparatus according to claim 5, wherein the second probe is a contact probe and the first probe is a non-contact probe.

7. The multi-joint arm type measurement apparatus according to claim 6, wherein the probe rotation holding mechanism is configured to rotate the non-contact probe around the contact probe.

8. The multi-joint arm type measurement apparatus according to claim 6, wherein the contact probe is a ball probe, and the non-contact probe is an optical probe.

9. A multi-joint arm type measurement apparatus comprising:

a plurality of probes mounted at a tip of a multi-joint mechanism, the plurality of probes including at least a first probe and a second probe; and

a probe rotation holding mechanism configured to rotatably hold the first probe around the second probe, the probe rotation holding mechanism being configured to fix a rotating position of the first probe at a plurality of positions, wherein the probe rotation holding mechanism includes a rotary encoder configured to detect a rotating angle of the first probe relative to the second probe.

10. The multi-joint arm type measurement apparatus according to claim 9, wherein the second probe is a contact probe and the first probe is a non-contact probe.

11. The multi-joint arm type measurement apparatus according to claim 10, wherein the probe rotation holding mechanism is configured to rotate the non-contact probe around the contact probe.

12. The multi-joint arm type measurement apparatus according to claim 10, wherein the contact probe is a ball probe, and the non-contact probe is an optical probe.