Semiconductor device and manufacturing method thereof
First Claim
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1. A semiconductor device, comprising:
- a Fin FET device including;
a fin structure extending in a first direction and protruding from an isolation insulating layer, the fin structure including a well layer, an oxide layer disposed over the well layer and a channel layer disposed over the oxide layer; and
a gate stack including a gate electrode layer and a gate dielectric layer, covering a portion of the channel layer and extending in a second direction perpendicular to the first direction,wherein a width of the well layer in the second direction at an interface between the well layer and the oxide layer is smaller than a width of the channel layer in the second direction.
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Abstract
In a method for manufacturing a semiconductor device, a fin structure including a first semiconductor layer, an oxide layer disposed over the first semiconductor layer and a second semiconductor layer disposed over the oxide layer is formed. An isolation insulating layer is formed so that the second semiconductor layer of the fin structure protrudes from the isolation insulating layer while the oxide layer and the first semiconductor layer are embedded in the isolation insulating layer. A third semiconductor layer is formed on the exposed second semiconductor layer so as to form a channel.
63 Citations
20 Claims
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1. A semiconductor device, comprising:
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a Fin FET device including; a fin structure extending in a first direction and protruding from an isolation insulating layer, the fin structure including a well layer, an oxide layer disposed over the well layer and a channel layer disposed over the oxide layer; and a gate stack including a gate electrode layer and a gate dielectric layer, covering a portion of the channel layer and extending in a second direction perpendicular to the first direction, wherein a width of the well layer in the second direction at an interface between the well layer and the oxide layer is smaller than a width of the channel layer in the second direction. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A semiconductor device, comprising:
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a Fin FET device including; a first fin structure and a second fin structure, both extending in a first direction and protruding from an isolation insulating layer, each of the first and second fin structures including a well layer, an oxide layer disposed over the well layer and a channel layer disposed over the oxide layer; and a gate stack including a gate electrode layer and a gate dielectric layer, covering a portion of the channel layer of the first fin structure and a portion of the channel layer of the second fin structure, and extending in a second direction perpendicular to the first direction, wherein a width of the well layer of the first fin structure in the second direction at an interface between the well layer of the first fin structure and the oxide layer of the first fin structure is smaller than a width of the channel layer of the first fin structure in the second direction. - View Dependent Claims (8, 9, 10, 11, 12)
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13. A semiconductor device, comprising:
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a Fin FET device including; a fin structure extending in a first direction and protruding from an isolation insulating layer, the fin structure including a well layer, an oxide layer disposed over the well layer and a channel layer disposed over the oxide layer; and a gate stack including a gate electrode layer and a gate dielectric layer, covering a portion of the channel layer and extending in a second direction perpendicular to the first direction, wherein; a bottom part of the channel layer is embedded in the isolation insulating layer, and a width of the bottom part of the channel layer in the second direction is smaller than a largest width of the channel layer in the second direction. - View Dependent Claims (14, 15, 16, 17, 18, 19, 20)
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Specification