Methods and devices for optically determining a characteristic of a substance using integrated computational elements

• US 9,702,811 B2
• Filed: 04/26/2012
• Issued: 07/11/2017
• Est. Priority Date: 04/26/2012
• Status: Active Grant

• Current Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Original Assignee: Halliburton Energy Services Incorporated (Halliburton Company)
• Inventors: Freese, Robert, Perkins, David, Simcock, Michael, Jones, Christopher Michael, Soltmann, William
• Primary Examiner(s): Ko, Tony
• Application Number:
  US13/456,264
• Publication Number:
  US 20130284895A1
• Time in Patent Office: 1,902 Days
• Field of Search: 250226, 250216, 250564, 250573, 250428, 250432 R
• CPC Class Codes: G01J 2003/1213 Filters in general, e.g. dichroic, band
• CPC Class Codes: G01J 2003/1226 Interference filters
• CPC Class Codes: G01N 21/17 Systems in which incident light is modified in accordance with the properties of the material investigated where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63
• CPC Class Codes: G01N 21/31 Investigating relative effect of material at wavelengths characteristic of specific elements or molecules, e.g. atomic absorption spectrometry G01N21/72 takes precedence
• CPC Class Codes: G02B 27/1006 for splitting or combining different wavelengths G02B27/1086, G02B27/141 take precedence
• CPC Class Codes: G02B 27/141 using dichroic mirrors
• CPC Class Codes: G06E 3/001 Analogue devices in which mathematical operations are carried out with the aid of optical or electro-optical elements optical elements per se G02B; devices consisting of a plurality of solid state components, including light sensitive semiconductor components, formed in or on a common substrate H01L27/14; electro-, magneto- or acousto-optics, non-linear optics G02F1/00; graph reading G06K11/00

Abstract

Optical computing devices are disclosed. One exemplary optical computing device includes an electromagnetic radiation source configured to optically interact with a sample and at least two integrated computational elements. The at least two integrated computational elements are configured to produce optically interacted light and further configured to be associated with a characteristic of the sample. The optical computing device further includes a first detector arranged to receive the optically interacted light from the at least two integrated computational elements and thereby generate a first signal corresponding to the characteristic of the sample.

Claims

1. A device, comprising:

an electromagnetic radiation source configured to optically interact with a sample and at least two integrated computational elements, the at least two integrated computational elements configured to produce an optically interacted light when a sample light is sequentially transmitted through the at least two integrated computational elements, wherein, a first one of the at least two integrated computational elements comprises a first plurality of layers of material selected according to a linear regression vector associating the sample light with a sample characteristic via a first proportionality value, a second one of the at least two integrated computational elements comprises a second plurality of layers of material different from the first plurality of layers of material and selected according to the linear regression vector associating the sample light with the sample characteristic via a second proportionality value, and wherein the optically interacted light has an optical intensity;

at least one detector arranged to receive the optically interacted light and generate a signal indicative of the optical intensity; and

a processor that is configured to obtain from the signal indicative of the optical intensity a value of the sample characteristic.

2. The device of claim 1, wherein the electromagnetic radiation source is configured to optically interact with the at least two integrated computational elements after optically interacting with the sample.

3. The device of claim 1, wherein the electromagnetic radiation source is configured to optically interact with the at least two integrated computational elements before optically interacting with the sample.

4. The device of claim 1, wherein the electromagnetic radiation source is configured to optically interact with a first one of the at least two integrated computational elements before optically interacting with the sample and with a second one of the at least two integrated computational elements after optically interacting with the sample.

5. The device of claim 1, wherein the optically interacted light comprises a first beam comprising a first optically interacted light from the first one of the at least two integrated computational elements and a second beam comprising a second optically interacted light from the second one of the at least two integrated computational elements, and

wherein the at least one detector is a split detector comprising a first detector portion being arranged to receive the first beam and thereby generate a first signal and a second detector portion being arranged to receive the second beam and thereby generate a second signal, and further wherein the processor is configured to obtain the value of the sample characteristic from the first signal and the second signal.

6. The device of claim 5, wherein the split detector computationally combines the first and second signals to determine the sample characteristic.

7. The device of claim 1, wherein the value of the sample characteristic has a greater accuracy than the first proportionality value and the second proportionality value.

8. The device of claim 1, wherein the at least one detector is a first detector and the device further comprises a second detector arranged to detect electromagnetic radiation from the electromagnetic radiation source and thereby generate a second signal indicative of electromagnetic radiating deviations.

9. The device of claim 8, wherein the processor is configured to computationally combine the signal indicative of the optical intensity with the, second signal indicative of electromagnetic radiating deviations to obtain a normalized signal sensitive to the sample characteristic.

10. The device of claim 1, wherein the at least two integrated computational elements are coupled together to form a monolithic structure.

11. The device of claim 1, wherein the at least two integrated computational elements are arranged in series.

12. The device of claim 1, wherein the first one of the at least two integrated computational elements is arranged parallel relative to the second one of the at least two integrated computational elements.

13. The device of claim 1, further comprising a movable assembly configured for rotation, wherein the at least two integrated computational elements are radially disposed within the movable assembly for rotation therewith.

14. The device of claim 13, further comprising at least one neutral element radially disposed within the movable assembly and arranged to optically interact with the electromagnetic radiation source and produce a compensating signal indicative of radiating deviations of the electromagnetic radiation source.

15. The device of claim 14, wherein the at least one detector is arranged to receive and computationally combine the compensating signal indicative of radiating deviations with the optically interacted light in order to compensate for electromagnetic radiating deviations.

16. The device of claim 13, wherein the at least two integrated computational elements form a first radial array, the device further comprising at least two or more other integrated computational elements disposed radially about the movable assembly and forming a second radial array, the first radial array being radially-offset from the second radial array.

17. The device of claim 1, wherein the at least two integrated computational elements are laterally arranged upon a movable assembly such that only one of the at least two integrated computational elements interacts optically with electromagnetic radiation at any given time.

18. The device of claim 17, wherein the movable assembly is configured for lateral oscillation.

19. A device, comprising:

an electromagnetic radiation source configured to optically interact with a sample and at least two integrated computational elements, the at least two integrated computational elements configured to produce an optically interacted light when a sample light is sequentially transmitted through the at least two integrated computational elements, wherein, a first one of the at least two integrated computational elements comprises a first plurality of layers of material selected according to a linear regression vector associating the sample light with a sample characteristic via a first proportionality value, a second one of the at least two integrated computational elements comprises a second plurality of layers of material different from the first plurality of layers of material selected according to the linear regression vector associating the sample light with the sample characteristic via a second proportionality value, and wherein the optically interacted light has an optical intensity;

a first detector arranged to receive the optically interacted light and form a signal sensitive to the sample characteristic; and

a processor that computationally obtains from the signal indicative of the optical intensity a value of the sample characteristic.

20. The device of claim 19, wherein the at least two integrated computational elements are coupled together to form a monolithic structure.

21. The device of claim 19, wherein the at least two integrated computational elements are arranged in series.

22. The device of claim 19, further comprising a second detector arranged to detect electromagnetic radiation from the electromagnetic radiation source and thereby generate a second signal indicative of electromagnetic radiating deviations.

23. The device of claim 22, wherein the processor is configured to computationally combine the signal sensitive to the sample characteristic and the second signal indicative of electromagnetic radiating deviations to obtain a normalized signal sensitive to the sample characteristic.

24. A device, comprising:

at least two integrated computational elements configured to receive electromagnetic radiation emitted from a sample and produce an optically interacted light when a sample light is sequentially transmitted through the at least two integrated computational elements, wherein, a first one of the at least two integrated computational elements comprises a first plurality of layers of material selected according to a linear regression vector associating the sample light with a sample characteristic via a first proportionality value, a second one of the at least two integrated computational elements comprises a second plurality of layers of material different from the first plurality of layers of material and selected according to the linear regression vector associating the sample light with the sample characteristic via a second proportionality value, and wherein;

at least one detector arranged to receive the optically interacted light and thereby generate a signal proportional to an intensity of the optically interacted light; and

a processor that computationally obtains a value of the sample characteristic.

25. The device of claim 24, wherein the at least two integrated computational elements are coupled together to form a monolithic structure or arranged in series.

26. The device of claim 24, wherein the sample is one of a blackbody radiation substance, a radioactive substance, and a chemo-luminescent substance.

27. The device of claim 24, wherein the sample is acted upon mechanically, magnetically, or electrically in order to emit the electromagnetic radiation.