Adjustable power sensor

• US 9,702,911 B2
• Filed: 09/07/2012
• Issued: 07/11/2017
• Est. Priority Date: 09/07/2012
• Status: Active Grant

• Current Assignee: Keysight Technologies, Inc.
• Original Assignee: Keysight Technologies, Inc.
• Inventors: Breakenridge, Eric, Robertson, Clive
• Primary Examiner(s): Nguyen, Tung X
• Application Number:
  US13/606,215
• Publication Number:
  US 20140070793A1
• Time in Patent Office: 1,768 Days
• CPC Class Codes: G01R 21/10 by using square-law characteristics of circuit elements, e.g. diodes, to measure power absorbed by loads of known impedance G01R21/02 takes precedence
• CPC Class Codes: G01R 21/14 Compensating for temperature change

Abstract

A power sensor applies respective first and second currents having substantially equal magnitudes to a reference detector and a measurement detector that are thermally coupled to each other. The power sensor senses an input signal with the measurement detector, and it adjusts the respective magnitudes of the first and second currents by substantially equal amounts to correspondingly adjust a measurement characteristic of the measurement detector.

Claims

1. An apparatus, comprising:

a measurement detector configured to receive an input signal;

a variable current source configured to provide first and second currents of substantially equal magnitude to a reference detector and the measurement detector, respectively, wherein the reference detector and the measurement detector are thermally coupled; and

a circuit configured to adjust the first and second currents by substantially equal amounts to correspondingly adjust a measurement characteristic of the measurement detector.

2. The apparatus of claim 1 wherein adjusting respective magnitudes of the first and second currents is based on a power level of the input signal sensed by the measurement detector.

3. The apparatus of claim 1 wherein the circuit comprises at least one current mirror.

4. The apparatus of claim 1 wherein the variable current source is further configured to adjust respective magnitudes of the first and second currents to achieve a target measurement bandwidth or measurement sensitivity of the measurement detector.

5. The apparatus of claim 1, wherein the reference detector and measurement detector are located on a same chip.

6. The apparatus of claim 1, wherein the reference detector and the measurement detector each comprise at least one diode.

7. An apparatus, comprising:

a measurement detector configured to receive an input signal;

a variable current source configured to provide first and second currents of substantially equal magnitude to a reference detector and the measurement detector, respectively, wherein the reference detector and the measurement detector are thermally coupled; and

a circuit configured to adjust the first and second currents by substantially equal amounts to correspondingly adjust a measurement characteristic of the measurement detector, the circuit comprising;

a first current mirror configured to regulate a first measurement voltage apparent at a positive output terminal of the measurement detector and a first reference voltage apparent at a positive output terminal of the reference detector; and

a second current mirror configured to regulate a second measurement voltage apparent at a negative output terminal of the measurement detector and a second reference voltage apparent at a negative output terminal of the reference detector.

8. The apparatus of claim 7, further comprising:

an instrumentation amplifier configured to receive the first and second measurement voltages and the first and second reference voltages, and further configured to amplify a difference between the first measurement voltage and the first reference voltage to generate a first output signal and to amplify a difference between the second measurement voltage and the second reference voltage to generate a second output signal, wherein the first and second output signals constitute a differential signal pair representing a power level of the input signal.

9. The apparatus of claim 8, wherein the instrumentation amplifier comprises:

a first block configured to amplify the difference between the first measurement voltage and the first reference voltage; and

a second block configured to amplify the difference between the second measurement voltage and the second reference voltage, wherein each of the first and second blocks comprises at least four operational amplifiers.

12. The apparatus of claim 7, wherein adjusting respective magnitudes of the first and second currents is based on a power level of the input signal sensed by the measurement detector.

13. The apparatus of claim 7, wherein the variable current source is further configured to adjust respective magnitudes of the first and second currents to achieve a target measurement bandwidth or measurement sensitivity of the measurement detector.

10. An apparatus, comprising:

a measurement detector configured to receive an input signal;

a variable current source configured to provide first and second currents of substantially equal magnitude to a reference detector and the measurement detector, respectively, wherein the reference detector and the measurement detector are thermally coupled, the reference detector and measurement detector being located on different chips, and thermally coupled through a thermal conduit connected between the different chips; and

a circuit configured to adjust the first and second currents by substantially equal amounts to correspondingly adjust a measurement characteristic of the measurement detector.

11. The apparatus of claim 10, wherein the different chips are mounted on different thermal pads of a printed circuit board (PCB), and the thermal conduit extends between the different thermal pads.

14. The apparatus of claim 10, wherein the reference detector and measurement detector are located on a same chip.

15. The apparatus of claim 10, wherein adjusting the respective magnitudes of the first and second currents is based on a power level of the input signal sensed by the measurement detector.

16. The apparatus of claim 10, wherein the variable current source is further configured to adjust respective magnitudes of the first and second currents to achieve a target measurement bandwidth or measurement sensitivity of the measurement detector.

17. The apparatus of claim 10, wherein the reference detector and measurement detector are located on a same chip.