Self-heating trim techniques for improved LDO accuracy over load and temperature

• US 9,703,306 B2
• Filed: 09/10/2014
• Issued: 07/11/2017
• Est. Priority Date: 09/10/2014
• Status: Active Grant

• Current Assignee: Analog Devices, Inc.
• Original Assignee: Analog Devices, Inc.
• Inventors: Day, Brandon, Szostkiewicz, Mark
• Primary Examiner(s): MILLER, DANIEL R
• Application Number:
  US14/482,228
• Publication Number:
  US 20160070280A1
• Time in Patent Office: 1,035 Days
• CPC Class Codes: G05F 1/463 Sources providing an output which depends on temperature
• CPC Class Codes: G05F 1/625 wherein it is irrelevant whether the variable actually regulated is ac or dc
• CPC Class Codes: G05F 3/30 Regulators using the difference between the base-emitter voltages of two bipolar transistors operating at different current densities G05F3/26 takes precedence

Abstract

In one example, a method for compensating for a temperature effect during operation of a voltage regulator circuit includes applying a load current at an output of the voltage regulator circuit, measuring a first output voltage at the output, measuring a reference current or voltage, increasing the load current, measuring a change in the reference current or voltage corresponding to the increased load current, measuring a second output voltage when the measured change in the reference current exceeds a threshold, and determining a temperature coefficient (TC) value based on the measured second output voltage.

Claims

1. A method for compensating for a temperature effect during operation of a voltage regulator circuit, the method comprising:

applying a load current at an output of the voltage regulator circuit;

measuring a first output voltage at the output;

measuring a reference current or voltage;

increasing the load current;

measuring a change in the reference current or voltage corresponding to the increased load current;

measuring a second output voltage when the measured change in the reference current or voltage exceeds a threshold;

determining a temperature coefficient trim code using a difference between the measured first output voltage and the measured second output voltage; and

modifying a resistance of a variable resistance based on the determined trim code to improve an output accuracy of the voltage regulator circuit over load current and temperature.

2. The method of claim 1, wherein the reference current is a proportional to absolute temperature (PTAT) current or voltage.

3. The method of claim 1, wherein the reference current is a complementary to absolute temperature (CTAT) current or voltage.

4. The method of claim 1, comprising:

applying only one ambient temperature to the voltage regulator circuit when applying the load current and increasing the load current.

5. The method of claim 1, wherein the threshold is about a 20% increase in the reference current or voltage.

6. The method of claim 1, wherein the threshold is specified as corresponding to an equivalent change in a die temperature of a die of the voltage regulator circuit.

7. The method of claim 1, wherein determining a trim code using the measured first output voltage and the measured second output voltage includes determining at least one bit representing the determined trim code.

8. The method of claim 1, wherein modifying a resistance of a variable resistance based on the determined trim code includes:

modifying a resistance of a variable resistor of a bandgap voltage reference circuit based on the determined trim code.

9. The method of claim 8, modifying a resistance of a variable resistance based on the determined trim code includes:

burning or blowing at least one polysilicon fuse.

10. The method of claim 1, wherein the voltage regulator circuit is a low-dropout regulator.

11. The method of claim 1, wherein the voltage regulator circuit includes complementary metal-oxide semiconductor (CMOS) circuitry.

12. The method of claim 1, wherein the voltage regulator circuit includes bipolar junction transistor circuitry.

13. The method of claim 1, wherein the voltage regulator circuit includes both complementary metal-oxide semiconductor (CMOS) circuitry and bipolar junction transistor circuitry.

14. The method of claim 1, wherein measuring a reference current or voltage includes:

applying a test mode bit to the voltage regulator circuit; and

measuring the reference current out of a pin of the voltage regulator circuit.

15. A method for compensating for a temperature effect during operation of a low dropout regulator circuit, the method comprising:

applying only one ambient temperature to the voltage regulator circuit;

applying a load current at an output of the voltage regulator circuit;

measuring a first output voltage at the output;

measuring a reference current;

increasing the load current;

measuring a change in the reference current corresponding to the increased load current;

measuring a second output voltage when the measured change in the reference current or voltage exceeds a threshold;

determining a temperature coefficient trim code using a difference between the measured first output voltage and the measured second output voltage; and

modifying a resistance of a variable resistor based on the determined trim code by burning or blowing at least one polysilicon fuse to improve an output accuracy of the low dropout regulator circuit over load current and temperature.