Measuring power consumption in an integrated circuit
First Claim
1. A method comprising:
- determining power consumption of one power domain of multiple power domains within an integrated circuit, said determining comprising;
electrically connecting a test system to said one power domain of the multiple power domains of the integrated circuit, the test system comprising a voltage measurement system;
determining, by the test system, a local power supply impedance profile (Z(f)) specific to said one power domain of the multiple power domains of the integrated circuit;
executing, by the integrated circuit, a periodic activity specific to said one power domain, wherein the periodic activity causes a defined amount of power to be dissipated in the one power domain;
during the executing, measuring, by the voltage measurement system of the test system, a local power supply voltage (U(t)) for the one power domain;
concurrent with the determining of the local power supply impedance profile (Z(f)) specific to said one power domain and the measuring, isolating one or more of the multiple power domains, from the one power domain, the isolating comprising preventing interferences or distortions of the one or more of the multiple power domains of the integrated circuit from influencing said one power domain during determining the local power supply impedance profile (Z(f)) specific to said one power domain and measuring the power supply voltage (U(t)), wherein the isolating does not comprise switching off the one or more of the multiple power domains;
evaluating, by the test system, a voltage spectrum (U(f)) of said measured local power supply voltage (U(t)) for the one power domain;
calculating, by the test system, an associated power supply current (I(t)) from said impedance profile (Z(f)) and said voltage spectrum (U(f)) for the one power domain;
determining, by the test system, a power consumption spectrum (P(t)) for the one power domain of the multiple power domains within the integrated circuit from said power supply current (I(t)) and the measured power supply voltage (U(t)) for the one power domain; and
based on the determining the power consumption spectrum (P(t)) for the one power domain of the multiple power domains, dimensioning and placing cooling resources to adequately cool the integrated circuit during operation.
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Abstract
A method for determining power consumption of a power domain within an integrated circuit is presented. In a first step, a local power supply impedance profile (Z(f)) of this power domain is determined. Subsequently, a local time-resolved power supply voltage (U(t)) is measured while a well-defined periodic activity is executed in power domain. A set of time-domain measured voltage data (U(t)) is thus accumulated and transformed into the frequency domain to yield a voltage spectrum (U(f)). A current spectrum I(t) is calculated from this voltage profile (U(f)) by using the power supply impedance profile Z(f) of this power domain as I(t)=Ff−1{U(f)/Z(f)}. Finally, a time-resolved power consumption spectrum P(t) is determined from measured voltage spectrum U(t)) and calculated current spectrum (I(t)). This power consumption (P(t)) may be compared with a reference (Pref(t)) to verify whether power consumption within power domain matches expectations.
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Citations
10 Claims
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1. A method comprising:
determining power consumption of one power domain of multiple power domains within an integrated circuit, said determining comprising; electrically connecting a test system to said one power domain of the multiple power domains of the integrated circuit, the test system comprising a voltage measurement system; determining, by the test system, a local power supply impedance profile (Z(f)) specific to said one power domain of the multiple power domains of the integrated circuit; executing, by the integrated circuit, a periodic activity specific to said one power domain, wherein the periodic activity causes a defined amount of power to be dissipated in the one power domain; during the executing, measuring, by the voltage measurement system of the test system, a local power supply voltage (U(t)) for the one power domain; concurrent with the determining of the local power supply impedance profile (Z(f)) specific to said one power domain and the measuring, isolating one or more of the multiple power domains, from the one power domain, the isolating comprising preventing interferences or distortions of the one or more of the multiple power domains of the integrated circuit from influencing said one power domain during determining the local power supply impedance profile (Z(f)) specific to said one power domain and measuring the power supply voltage (U(t)), wherein the isolating does not comprise switching off the one or more of the multiple power domains; evaluating, by the test system, a voltage spectrum (U(f)) of said measured local power supply voltage (U(t)) for the one power domain; calculating, by the test system, an associated power supply current (I(t)) from said impedance profile (Z(f)) and said voltage spectrum (U(f)) for the one power domain; determining, by the test system, a power consumption spectrum (P(t)) for the one power domain of the multiple power domains within the integrated circuit from said power supply current (I(t)) and the measured power supply voltage (U(t)) for the one power domain; and based on the determining the power consumption spectrum (P(t)) for the one power domain of the multiple power domains, dimensioning and placing cooling resources to adequately cool the integrated circuit during operation. - View Dependent Claims (2, 3, 4, 5, 6)
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7. A system comprising:
a test system for determining power consumption of one power domain of multiple power domains within an integrated circuit, the test system for determining comprising; a memory for storing a local power supply impedance profile Z(f) specific to said one power domain of the multiple power domains of the integrated circuit; an Activity Stimulation System for executing by the integrated circuit a periodic activity specific to said one power domain, wherein the periodic activity causes a defined amount of power to be dissipated in the one power domain; a Voltage Measurement System for measuring a local power supply voltage (U(t)) of said one power domain and concurrent with the measuring, isolating one or more of the multiple power domains, from the one power domain, the isolating comprising preventing interferences or distortions of the one or more of the multiple power domains of the integrated circuit from influencing said one power domain during the storing and the measuring, wherein the isolating does not comprise switching off the one or more of the multiple power domains; a Fourier Transform System for evaluating a voltage spectrum (U(f)) of said measured local power supply voltage (U(t)) and for calculating associated current (I(t)) from said impedance profile (Z(f)) and said voltage spectrum (U(f) for the one power domain; and a Power Evaluation System for determining a power consumption (P(t)) for the one power domain of the multiple power domains within the integrated circuit; and based on the determining the power consumption spectrum (P(t)) for the one power domain of the multiple power domains, dimensioning and placing cooling resources to adequately cool the integrated circuit during operation. - View Dependent Claims (8, 9, 10)
Specification