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Self testing fault circuit apparatus and method

  • US 9,709,626 B2
  • Filed: 09/18/2013
  • Issued: 07/18/2017
  • Est. Priority Date: 01/29/2008
  • Status: Active Grant
First Claim
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1. A process for self testing a fault circuit comprising:

  • a) disabling an actuator;

    b) performing a self test by creating a simulated fault signal across at least a portion of a half cycle of a first polarity and across at least a portion of a half cycle of a second polarity;

    (c) controlling a duration of the self test based upon the presence of an external fault; and

    (d) determining whether the self test was successful.

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