System and method for making concentration measurements within a sample material using orbital angular momentum
First Claim
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1. An apparatus that measures a concentration of a material within a sample, comprising:
- signal generation circuitry that generates a first signal having at least one orthogonal function applied thereto and applying the first signal to the sample;
a detector that receives the first signal after the first signal passes through the sample and that determines the concentration of the material within the sample based on a detected orthogonal function within the first signal received from the sample; and
wherein the at least one orthogonal function and the detected orthogonal function comprise at least one of an orbital angular momentum function or a Laguerre-Gaussian function.
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Abstract
An apparatus that measures a concentration of a material within a sample includes signal generation circuitry that generates a first signal having at least one orthogonal function applied thereto and applies the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and determines the concentration of the material within the sample based on a detected orthogonal function within the first signal received from the sample.
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Citations
30 Claims
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1. An apparatus that measures a concentration of a material within a sample, comprising:
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signal generation circuitry that generates a first signal having at least one orthogonal function applied thereto and applying the first signal to the sample; a detector that receives the first signal after the first signal passes through the sample and that determines the concentration of the material within the sample based on a detected orthogonal function within the first signal received from the sample; and
wherein the at least one orthogonal function and the detected orthogonal function comprise at least one of an orbital angular momentum function or a Laguerre-Gaussian function. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14)
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15. An apparatus that measures a concentration of a material within a sample, comprising:
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an emitting source that emits a first light beam comprising a plurality of plane waves; orthogonal function generation circuitry that receives the first light beam and that applies at least one orthogonal function to the plurality of plane waves of the first light beam; amplifying circuitry that receives the first light beam after the first light beam passes through the sample and that amplifies a first portion of the first light beam having a predetermined orthogonal function associated therewith; a detector that receives the first light beam after the first light beam passes through the sample and that determines the concentration of the material within the sample based on a detected orthogonal function within the amplified portion of the light beam having the predetermined orthogonal function associated therewith; and
wherein the at least one orthogonal function, the predetermined orthogonal function, and the detected orthogonal function comprise at least one of an orbital angular momentum function or a Laguerre-Gaussian function. - View Dependent Claims (16, 17, 18, 19, 20, 21, 22, 23, 24)
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25. A method for measuring a concentration of a material within a sample, comprising:
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generating a first signal having at least one orthogonal function applied thereto; applying the first signal to the sample; receiving the first signal after the first signal passes through the sample; detecting an orthogonal function within the received first signal; and determining the concentration of the material within the sample based on the detected orthogonal function within the first signal received from the sample; and wherein the at least one orthogonal function and the detected orthogonal function comprise at least one of an orbital angular momentum function or a Laguerre-Gaussian function. - View Dependent Claims (26, 27, 28, 29, 30)
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Specification