Defect judging device, radiography system, and defect judging method
First Claim
1. A defect judging device that judges a presence/absence of a defect in an inspection subject based on detected-image data obtained by a radiographic device provided with a radiation source that irradiates the inspection subject with radiation and an imaging device that obtains the detected-image data by detecting the radiation that has passed through the inspection subject, the defect judging device comprising:
- a position identifying portion for identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in the storage portion in advance; and
a defect judging portion for extracting a defect candidate with reference to the feature site in the detected-image data identified by the position identifying portion and judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in the storage portion in advance and a characteristic quantity of the defect candidate,wherein the position identifying portion uses a product-feature image indicated by the feature data as a template, compares the product-feature image being moved, rotated, and enlarged/shrunk with a detected image indicated by the detected-image data so as to identify a position of a product feature in the detected-image data, and based on the comparison result, identifies the position of the feature site on the imaging device included in the radiographic device.
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Accused Products
Abstract
With an image processing device, a presence/absence of a product defect is judged based on detected-image data obtained by a radiographic device that detects radiation that has passed through a product, which is an inspection subject. With the image processing device, a position of a product feature in the detected-image data is identified based on a shape of the product feature indicated by feature data stored in a storage portion in advance, defect candidates are extracted with reference to the identified product feature in the detected-image data, and the presence/absence of a product defect is judged based on characteristic quantities of product defects indicated by a defect characteristic stored in the storage portion in advance and characteristic quantities of the defect candidates.
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Citations
9 Claims
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1. A defect judging device that judges a presence/absence of a defect in an inspection subject based on detected-image data obtained by a radiographic device provided with a radiation source that irradiates the inspection subject with radiation and an imaging device that obtains the detected-image data by detecting the radiation that has passed through the inspection subject, the defect judging device comprising:
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a position identifying portion for identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in the storage portion in advance; and a defect judging portion for extracting a defect candidate with reference to the feature site in the detected-image data identified by the position identifying portion and judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in the storage portion in advance and a characteristic quantity of the defect candidate, wherein the position identifying portion uses a product-feature image indicated by the feature data as a template, compares the product-feature image being moved, rotated, and enlarged/shrunk with a detected image indicated by the detected-image data so as to identify a position of a product feature in the detected-image data, and based on the comparison result, identifies the position of the feature site on the imaging device included in the radiographic device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A defect judging method for judging a presence/absence of a defect in an inspection subject based on detected-image data obtained by a radiographic device provided with a radiation source that irradiates the inspection subject with radiation and an imaging device that obtains the detected-image data by detecting the radiation that has passed through the inspection subject, the defect judging method comprising:
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identifying a position of a feature site in the detected-image data based on a shape of the feature site of the inspection subject indicated by feature data that are stored in advance; and extracting a defect candidate with reference to the feature site in the detected-image data and judging the presence/absence of a defect in the inspection subject based on a characteristic quantity of a defect indicated by defect characteristic data stored in advance and a characteristic quantity of the defect candidate, wherein the identifying the position of the feature site comprises using a product-feature image indicated by the feature data as a template, comparing the product-feature image being moved, rotated, and enlarged/shrunk with a detected image indicated by the detected-image data so as to identify a position of a product feature in the detected-image data, and based on the comparison result, identifying the position of the feature site on the imaging device included in the radiographic device.
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Specification