Lens heating compensation systems and methods
First Claim
1. A method of performing optical proximity correction (OPC) on a target design for a lithographic process, the method comprising:
- obtaining an optical system heating model that accounts for effects of optical system heating in the lithographic process;
obtaining a set of process window conditions associated with the lithographic process;
determining one or more pattern failures across the set of process window conditions using the optical system heating model;
performing, by a hardware computer system, OPC on the target design based on the determined one or more pattern failures; and
outputting an electronic representation of the corrected target design for creating the pattern as provided by a patterning device of the lithographic process.
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Accused Products
Abstract
Methods for calibrating a photolithographic system are disclosed. A cold lens contour for a reticle design and at least one hot lens contour for the reticle design are generated from which a process window is defined. Aberrations induced by a lens manipulator are characterized in a manipulator model and the process window is optimized using the manipulator model. Aberrations are characterized by identifying variations in critical dimensions caused by lens manipulation for a plurality of manipulator settings and by modeling behavior of the manipulator as a relationship between manipulator settings and aberrations. The process window may be optimized by minimizing a cost function for a set of critical locations.
17 Citations
24 Claims
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1. A method of performing optical proximity correction (OPC) on a target design for a lithographic process, the method comprising:
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obtaining an optical system heating model that accounts for effects of optical system heating in the lithographic process; obtaining a set of process window conditions associated with the lithographic process; determining one or more pattern failures across the set of process window conditions using the optical system heating model; performing, by a hardware computer system, OPC on the target design based on the determined one or more pattern failures; and outputting an electronic representation of the corrected target design for creating the pattern as provided by a patterning device of the lithographic process. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8)
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9. A non-transitory computer readable storage medium having instructions stored thereon which, when executed by a computer, cause the computer to implement a method of performing optical proximity correction (OPC) on a target design for a lithographic process, the method comprising:
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obtaining an optical system heating model that accounts for effects of optical system heating in the lithographic process; obtaining a set of process window conditions associated with the lithographic process; determining one or more pattern failures across the set of process window conditions using the optical system heating model; performing OPC on the target design based on the determined one or more pattern failures; and outputting an electronic representation of the corrected target design for creating the pattern as provided by a patterning device of the lithographic process. - View Dependent Claims (10, 11, 12, 13, 14, 15, 16)
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17. A system, comprising:
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a hardware computer; and a non-transitory computer readable storage medium having instructions stored thereon which, when executed by the computer, cause the computer to; determine one or more pattern failures across a set of process window conditions associated with a lithographic process using an optical system heating model that accounts for effects of optical system heating in the lithographic process; perform optical proximity correction (OPC) on a target design of the lithographic process based on the determined one or more pattern failures; and output an electronic representation of the corrected target design for creating the pattern as provided by a patterning device of the lithographic process. - View Dependent Claims (18, 19, 20, 21, 22, 23, 24)
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Specification