Embedded force measurement
First Claim
1. A force detection system, comprising:
- a display;
a force measurement layer disposed on or in the display, wherein the force measurement layer has an attribute with a baseline measurement; and
force measurement circuitry configured to determine the baseline measurement of the force measurement layer at pre-determined time periods, detect a change in the baseline measurement in at least one portion of the force measurement layer, calculate a force input location based entirely upon the change in the baseline measurement, calculate a magnitude of force based entirely upon the change in the baseline measurement, provide a first touch command input to the display when the magnitude of force is greater than a first level of force, and provide a second touch command input to the display when the magnitude of force is greater than a second level of force, wherein the first and second levels of force are different.
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Abstract
Disclosed embodiments relate to a force detection system that detects force exerted on a flexible display based upon changes in resistance and/or capacitance. In one embodiment, a method includes measuring a baseline comprising a baseline resistance or a baseline capacitance or both of a force measurement layer disposed within or overlaid on the display panel. The method further includes detecting a change in the baseline resistance or the baseline capacitance or both and calculating a change location where the change in the baseline resistance or the baseline capacitance or both occurred. The method also includes calculating a magnitude of the change in the baseline resistance or the baseline capacitance or both.
25 Citations
19 Claims
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1. A force detection system, comprising:
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a display; a force measurement layer disposed on or in the display, wherein the force measurement layer has an attribute with a baseline measurement; and force measurement circuitry configured to determine the baseline measurement of the force measurement layer at pre-determined time periods, detect a change in the baseline measurement in at least one portion of the force measurement layer, calculate a force input location based entirely upon the change in the baseline measurement, calculate a magnitude of force based entirely upon the change in the baseline measurement, provide a first touch command input to the display when the magnitude of force is greater than a first level of force, and provide a second touch command input to the display when the magnitude of force is greater than a second level of force, wherein the first and second levels of force are different. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. An electronic device, comprising:
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a display; a force measurement layer disposed in or on the display, wherein the force measurement layer measures an attribute with a baseline measurement, wherein the attribute is an attribute selected from the group consisting of;
a resistance and a capacitance, and wherein the attribute changes from the baseline measurement to a modified measurement in response to a touch input; andprocessing circuitry configured to; calculate a difference between the baseline measurement of the attribute and the modified measurement of the attribute; in response to calculating the difference between the baseline measurement of the attribute and the modified measurement of the attribute, using the difference between the baseline measurement of the attribute and the modified measurement of the attribute to determine a location of the touch input; in response to calculating the difference between the baseline measurement of the attribute and the modified measurement of the attribute, using the difference between the baseline measurement of the attribute and the modified measurement of the attribute to determine a magnitude of force of the touch input; and provide a graphical output to the display that depends on the location of the touch input and the magnitude of force of the touch input. - View Dependent Claims (12, 13)
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14. An electronic device, comprising:
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a display; an array of rows and columns of crossing conductive lines disposed on or in the display, wherein the rows of conductive lines are located in a first plane, wherein the columns of conductive lines are located in a second plane that is different than the first plane; force measurement circuitry configured to measure an attribute of the array, wherein the attribute is selected from the group consisting of;
a resistance and a capacitance, wherein the attribute changes from a baseline value to a modified value when a distance between at least two of the conductive lines changes, and wherein there is a difference between the baseline value of the attribute and the modified value of the attribute; andprocessing circuitry configured to determine a force input location based entirely upon the difference between the baseline value of the attribute and the modified value of the attribute and determine a magnitude of force based entirely upon the difference between the baseline value of the attribute and the modified value of the attribute. - View Dependent Claims (15, 16, 17, 18, 19)
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Specification