System and method for optimizing a work implement path

• US 9,760,081 B2
• Filed: 09/12/2014
• Issued: 09/12/2017
• Est. Priority Date: 09/12/2014
• Status: Active Grant

• Current Assignee: Caterpillar Incorporated
• Original Assignee: Caterpillar Incorporated
• Inventors: Taylor, Michael, Wei, Mo, Edara, Thandava K.
• Primary Examiner(s): Antonucci, Anne M
• Application Number:
  US14/484,601
• Publication Number:
  US 20160077514A1
• Time in Patent Office: 1,096 Days
• CPC Class Codes: E01C 19/004 Devices for guiding or controlling the machines along a predetermined path for graders or bulldozers E02F3/841; for other soil-shifting machines E02F9/2045
• CPC Class Codes: E02F 3/841 Devices for controlling and guiding the whole machine, e.g. by feeler elements and reference lines placed exteriorly of the machine construction of roads E01C19/008
• CPC Class Codes: E02F 9/2045 Guiding machines along a predetermined path for graders E02F3/841; machines for construction of roads E01C19/004
• CPC Class Codes: E02F 9/205 Remotely operated machines, e.g. unmanned vehicles E02F3/8866 takes precedence
• CPC Class Codes: E02F 9/262 with follow-up actions to control the work tool, e.g. controller
• CPC Class Codes: G05B 19/402 characterised by control arrangements for positioning, e.g. centring a tool relative to a hole in the workpiece, additional detection means to correct position G05B19/19 takes precedence
• CPC Class Codes: G05B 2219/49372 Optimize toolpath pattern for a given cutting layer, mounting sequence
• CPC Class Codes: G05D 1/0217 in accordance with energy consumption, time reduction or distance reduction criteria
• CPC Class Codes: G05D 1/0278 using satellite positioning signals, e.g. GPS

Abstract

A system for determining an optimized cut location for a work implement includes a position sensor and a controller. The controller is configured to determine the position of a work surface and perform a coarse analysis along a path based upon the position of the work surface and a coarse analysis parameter threshold to select a selected coarse analysis increment. The controller is further configured to perform a fine analysis along the selected coarse analysis increment based upon the position of the work surface and a fine analysis parameter threshold to select the optimized cut location.

Claims

1. A system for determining an optimized cut location for a work implement of a machine, the machine moving on a work surface along a path, comprising:

a position sensor associated with the machine for generating position signals indicative of a position of the work surface;

a controller configured to;

store a coarse analysis cut length;

store a coarse analysis parameter threshold;

store a fine analysis cut length;

store a fine analysis parameter threshold;

determine the position of the work surface based upon the position signals;

determine a position of each of a plurality of coarse analysis increments along the path;

determine a coarse analysis parameter for each of the plurality of coarse analysis increments based upon the position of the work surface and the coarse analysis cut length;

select one of the plurality of coarse analysis increments based upon the coarse analysis parameter threshold, the coarse analysis parameter for each of the plurality of coarse analysis increments, and the position of each of the plurality of coarse analysis increments relative to the path to define a selected coarse analysis increment;

determine a position of each of a plurality of fine analysis increments along the selected coarse analysis increment;

determine a fine analysis parameter for each of the plurality of fine analysis increments based upon the position of the work surface and the fine analysis cut length; and

select the optimized cut location from one of the plurality of fine analysis increments based upon the fine analysis parameter threshold, the fine analysis parameter for each of the plurality of fine analysis increments, and the position of each of the plurality of fine analysis increments relative to the selected coarse analysis increment.

2. The system of claim 1, wherein the path includes a start location and an end location and the plurality of coarse analysis increments are positioned between the start location and the end location and the controller is further configured to sequentially analyze the plurality of coarse analysis increments beginning at a coarse analysis increment closest to the end location to determine the coarse analysis parameter until the coarse analysis parameter for one of the plurality of coarse analysis increments exceeds the coarse analysis parameter threshold, the one of the plurality of coarse analysis increments defining the selected coarse analysis increment.

3. The system of claim 2, wherein the selected coarse analysis increment includes a fine analysis start location and a fine analysis end location and the plurality of fine analysis increments are positioned between the fine analysis start location and the fine analysis end location, and the controller is further configured to sequentially analyze the plurality of fine analysis increments beginning at a fine analysis increment closest to the fine analysis end location to determine the fine analysis parameter until the fine analysis parameter for one of the plurality of fine analysis increments exceeds the fine analysis parameter threshold, the one of the plurality of fine analysis increments defining the optimized cut location.

4. The system of claim 1, wherein the selected coarse analysis increment includes a fine analysis start location and a fine analysis end location and the plurality of fine analysis increments are positioned between the fine analysis start location and the fine analysis end location, and the controller is further configured to sequentially analyze the plurality of fine analysis increments beginning at a fine analysis increment closest to the fine analysis end location to determine the fine analysis parameter until the fine analysis parameter for one of the plurality of fine analysis increments exceeds the fine analysis parameter threshold, the one of the plurality of fine analysis increments defining the optimized cut location.

5. The system of claim 1, wherein the coarse analysis cut length is generally equal to a coarse analysis increment plus the fine analysis cut length.

6. The system of claim 1, wherein a coarse analysis increment is equal to between 5 and 15 fine analysis increments.

7. The system of claim 1, wherein a coarse analysis increment is equal to approximately 10 fine analysis increments.

8. The system of claim 1, wherein the coarse analysis parameter for each of the plurality of coarse analysis increments is dependent on a target profile of each coarse analysis increment and the fine analysis parameter for each of the plurality of fine analysis increments is dependent on a target profile of each fine analysis increment.

9. The system of claim 8, wherein a loading profile along each coarse analysis increment and a loading profile of along each fine analysis increment are generally Gaussian-shaped.

10. The system of claim 1, wherein the fine analysis parameter for each of the plurality of fine analysis increments is further based upon one of a curvature of the work surface, a slope of the work surface, a roughness of the work surface, and material characteristics of material to be moved by the work implement.

11. The system of claim 1, wherein a portion of the controller on-board the machine is further configured to determine the position of the plurality of coarse analysis increments, determine the coarse analysis parameter for each of the plurality of coarse analysis increments, select one of the coarse analysis increments, determine the position of the plurality of fine analysis increments, determine the fine analysis parameter for each of the plurality of fine analysis increments, and select the optimized cut location.

12. The system of claim 1, further including a ground-engaging drive mechanism for moving the machine along the path and wherein the controller is configured to determine the coarse analysis parameter for each of the plurality of coarse analysis increments while the machine is moving along the path.

13. The system of claim 12, wherein the controller is configured to determine the fine analysis parameter for each of the plurality of fine analysis increments while the machine is moving along the path.

14. A controller implemented method of determining an optimized cut location for a work implement of a machine, the machine moving on a work surface along a path, comprising:

storing a coarse analysis cut length;

storing a coarse analysis parameter threshold;

storing a fine analysis cut length;

storing a fine analysis parameter threshold;

determining a position of the work surface based upon position signals from a position sensor;

determining a position of each of a plurality of coarse analysis increments along the path;

determining a coarse analysis parameter for each of the plurality of coarse analysis increments based upon the position of the work surface and the coarse analysis cut length;

selecting one of the plurality of coarse analysis increments based upon the coarse analysis parameter threshold, the coarse analysis parameter for each of the plurality of coarse analysis increments, and the position of each of the plurality of coarse analysis increments relative to the path to define a selected coarse analysis increment;

determining a position of each of a plurality of fine analysis increments along the selected coarse analysis increment;

determining a fine analysis parameter for each of the plurality of fine analysis increments based upon the position of the work surface and the fine analysis cut length; and

selecting the optimized cut location from one of the plurality of fine analysis increments based upon the fine analysis parameter threshold, the fine analysis parameter for each of the plurality of fine analysis increments, and the position of each of the plurality of fine analysis increments relative to the selected coarse analysis increment.

15. The method of claim 14, wherein the path includes a start location and an end location and the plurality of coarse analysis increments are positioned between the start location and the end location and further including sequentially analyzing the plurality of coarse analysis increments beginning at a coarse analysis increment closest to the end location to determine the coarse analysis parameter until the coarse analysis parameter for one of the plurality of coarse analysis increments exceeds the coarse analysis parameter threshold, the one of the plurality of coarse analysis increments defining the selected coarse analysis increment.

16. The method of claim 15, wherein the selected coarse analysis increment includes a fine analysis start location and a fine analysis end location and the plurality of fine analysis increments are positioned between the fine analysis start location and the fine analysis end location, and further including sequentially analyzing the plurality of fine analysis increments beginning at a fine analysis increment closest to the fine analysis end location to determine the fine analysis parameter until the fine analysis parameter for one of the plurality of fine analysis increments exceeds the fine analysis parameter threshold, the one of the plurality of fine analysis increments defining the optimized cut location.

17. The method of claim 14, wherein the steps of determining the position of each of the plurality of coarse analysis increments, determining the coarse analysis parameter for each of the plurality of coarse analysis increments, selecting one of the plurality of coarse analysis increments, determining the position of the plurality of fine analysis increments, determining the fine analysis parameter for each of the plurality of fine analysis increments, and selecting the optimized cut location all occur on-board the machine.

18. The method of claim 14, further including moving the machine along the path and determining the coarse analysis parameter for each of the plurality of coarse analysis increments while the machine is moving along the path.

19. The method of claim 18, further including determining the fine analysis parameter for each of the plurality of fine analysis increments while the machine is moving along the path.

20. A machine, comprising:

a prime mover;

a work implement for engaging a work surface along a path;

a position sensor for generating position signals indicative of a position of the work surface;

a controller configured to;

store a coarse analysis cut length;

store a coarse analysis parameter threshold;

store a fine analysis cut length;

store a fine analysis parameter threshold;

determine the position of the work surface based upon the position signals;

determine a position of each of a plurality of coarse analysis increments along the path;

determine a coarse analysis parameter for each of the plurality of coarse analysis increments based upon the position of the work surface and the coarse analysis cut length;

select one of the plurality of coarse analysis increments based upon the coarse analysis parameter threshold, the coarse analysis parameter for each of the plurality of coarse analysis increments, and the position of each of the plurality of coarse analysis increments relative to the path to define a selected coarse analysis increment;

determine a position of each of a plurality of fine analysis increments along the selected coarse analysis increment;

determine a fine analysis parameter for each of the plurality of fine analysis increments based upon the position of the work surface and the fine analysis cut length; and

select an optimized cut location from one of the plurality of fine analysis increments based upon the fine analysis parameter threshold, the fine analysis parameter for each of the plurality of fine analysis increments, and the position of each of the plurality of fine analysis increments relative to the selected coarse analysis increment.