Semiconductor device and error canceling method
First Claim
1. A semiconductor device comprising:
- a capacitive sensing controller operable to;
periodically capture sensing signals using one or more detection electrodes to generate data for detecting an object proximate to the detection electrodes, wherein the sensing signals are captured during detection periods in periodic detection cycles, each detection cycle defining a period of time between consecutive detection periods, and wherein a single drive pulse is applied to the detection electrodes during each of the detection periods; and
a processor operable to set a duration of the detection cycles,wherein the duration of the detection cycles is an odd multiple greater than one of a half a duration of a display-scan cycle defined by timing signals or an odd multiple of half of 1/m (where m is an integer greater than one) of the duration of the display-scan cycle,wherein a duration of the detection periods is an integer multiple of 1/n of the display-scan cycle (where n is a positive integer),wherein the duration of the detection cycles is longer than the duration of the detection periods, andwherein n is selected based on a periodic noise signal.
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Abstract
Embodiments herein include a device, system, and method for periodically capturing sensing signals using one or more detection electrodes to generate data for detecting an object proximate to the detection electrodes. The sensing signals are captured during detection periods within periodic detection cycles where each of the detection cycles define a period of time between consecutive detection periods. In addition, the device, system and method set a duration of the detection cycle to 1/m (where m is appositive integer) of a duration of a display-scan cycle. The value of m is selected based on a periodic noise signal. Thus, the device, system, and method may prevent a periodic noise signal which has a cycle that is longer than the detection period from worsening the accuracy of touch detection.
9 Citations
18 Claims
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1. A semiconductor device comprising:
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a capacitive sensing controller operable to; periodically capture sensing signals using one or more detection electrodes to generate data for detecting an object proximate to the detection electrodes, wherein the sensing signals are captured during detection periods in periodic detection cycles, each detection cycle defining a period of time between consecutive detection periods, and wherein a single drive pulse is applied to the detection electrodes during each of the detection periods; and a processor operable to set a duration of the detection cycles, wherein the duration of the detection cycles is an odd multiple greater than one of a half a duration of a display-scan cycle defined by timing signals or an odd multiple of half of 1/m (where m is an integer greater than one) of the duration of the display-scan cycle, wherein a duration of the detection periods is an integer multiple of 1/n of the display-scan cycle (where n is a positive integer), wherein the duration of the detection cycles is longer than the duration of the detection periods, and wherein n is selected based on a periodic noise signal. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A semiconductor device comprising:
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a display controller operable to update a display panel in synchronization with a display-scan cycle; and a capacitive sensing controller operable to detect detection data according to capacitance between drive and detection electrodes by periodically capturing sensing signals on the detection electrodes, wherein detecting the detection data is synchronized with the display-scan cycle, wherein the capacitive sensing controller performs the periodic capture during detection periods in periodic detection cycles, each detection cycle defining a period of time between consecutive detection periods, wherein a single drive pulse is applied to the detection electrodes during each of the detection periods, wherein a duration of the detection cycles is an odd multiple greater than one of a half a duration of a display-scan cycle defined by timing signals or an odd multiple of half of 1/m (where m is an integer greater than one) of the duration of the display-scan cycle, wherein a duration of the detection periods is an integer multiple of 1/n of the display-scan cycle (where n is a positive integer), wherein the duration of the detection cycles is longer than the duration of the detection periods, and wherein n is selected based on a periodic noise signal.
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12. A noise reduction method, comprising:
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capturing sensing signals using one or more detection electrodes to generate detection data associated with an object proximate to the detection electrodes, wherein the sensing signals are captured during detection periods in periodic detection cycles, each detection cycle defining a period of time between consecutive detection periods, and wherein a single drive pulse is applied to the detection electrodes during each of the detection periods; and setting a duration of the detection cycles such that a duration of the detection cycles is an odd multiple greater than one of a half a duration of a display-scan cycle defined by timing signals or an odd multiple of half of 1/m (where m is an integer greater than one) of the duration of the display-scan cycle, wherein a duration of the detection periods is an integer multiple of 1/n of the display-scan cycle (where n is a positive integer), wherein the duration of the detection cycles is longer than the duration of the detection periods, and wherein n is selected based on a periodic noise signal. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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Specification