Semiconductor device having variable parameter selection based on temperature and test method

• US 9,766,135 B2
• Filed: 06/07/2012
• Issued: 09/19/2017
• Est. Priority Date: 04/19/2006
• Status: Active Grant

• Current Assignee: Samsung Electronics Co. Ltd. (Samsung Group)
• Original Assignee: Nytell Software LLC (Intellectual Ventures LLC)
• Inventors: Walker, Darryl G.
• Primary Examiner(s): Jagan, Mirellys
• Application Number:
  US13/490,890
• Publication Number:
  US 20120243574A1
• Time in Patent Office: 1,930 Days
• Field of Search: 374170, 374178, 374176, 374169, 327512
• CPC Class Codes: G01K 7/425 Thermal management of integrated systems

Abstract

A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined.

Claims

1. An apparatus comprising:

a temperature-sensing circuit; and

a register coupled to the temperature-sensing circuit, wherein the register is separate from the temperature-sensing circuit, and wherein the register is configured to;

receive a temperature select value from a register load operation; and

provide the temperature select value to the temperature-sensing circuit.

2. The apparatus of claim 1, wherein the temperature-sensing circuit is configured to provide a temperature indication signal.

3. The apparatus of claim 1, wherein the temperature-sensing circuit includes a variable resistor, and wherein the temperature-sensing circuit is configured to modify a resistance value of the variable resistor based on the temperature select value.

4. The apparatus of claim 1, wherein the register is not part of the temperature-sensing circuit.

5. The apparatus of claim 1, wherein the register is a register circuit.

6. The apparatus of claim 5, wherein the register circuit is one of a plurality of register circuits.

7. The apparatus of claim 6, wherein the plurality of register circuits are configured to receive a plurality of temperature select values from a plurality of register load operations.

8. A method comprising:

receiving, at a register, a temperature select value from a register load operation;

providing, from the register, the temperature select value to a temperature-sensing circuit that is separate from the register.

9. The method of claim 8, further comprising providing, from the temperature-sensing circuit, a temperature indication signal.

10. The method of claim 8, wherein the temperature-sensing circuit includes a variable resistor, the method further comprising modifying, by the temperature-sensing circuit, a resistance value of the variable resistor based on the temperature select value.

11. The method of claim 8, wherein the register is a register circuit.

12. The method of claim 11, wherein the register circuit is one of a plurality of register circuits.

13. The method of claim 12, further comprising receiving, at the plurality of register circuits, a plurality of temperature select values from a plurality of register load operations.

14. An apparatus comprising:

a temperature-sensing circuit; and

a plurality of register circuits coupled to and separate from the temperature-sensing circuit and configured to;

receive a plurality of bits corresponding to a plurality of temperature select values from a plurality of register circuit load operations; and

provide the received plurality of bits to the temperature-sensing circuit.

15. The apparatus of claim 14, wherein the temperature-sensing circuit is configured to provide a temperature indication signal.

16. A method comprising:

receiving, at a plurality of register circuits, a plurality of bits corresponding to a plurality of temperature select values from a plurality of register load operations;

providing, from the plurality of register circuits, the plurality of bits to a temperature-sensing circuit that is separate from the plurality of register circuits.

17. The method of claim 16, further comprising providing, from the temperature-sensing circuit, a temperature indication signal.