Semiconductor device having variable parameter selection based on temperature and test method
First Claim
1. An apparatus comprising:
- a temperature-sensing circuit; and
a register coupled to the temperature-sensing circuit, wherein the register is separate from the temperature-sensing circuit, and wherein the register is configured to;
receive a temperature select value from a register load operation; and
provide the temperature select value to the temperature-sensing circuit.
5 Assignments
0 Petitions
Accused Products
Abstract
A semiconductor device that may include temperature sensing circuits is disclosed. The temperature sensing circuits may be used to control various parameters, such as internal regulated supply voltages, internal refresh frequency, or a word line low voltage. In this way, operating specifications of a semiconductor device at worst case temperatures may be met without compromising performance at normal operating temperatures. Each temperature sensing circuit may include a selectable temperature threshold value as well as a selectable temperature hysteresis value. In this way, temperature performance characteristics may be finely tuned. Furthermore, a method of testing the temperature sensing circuits is disclosed in which a current value may be monitored and temperature threshold values and temperature hysteresis values may be thereby determined.
-
Citations
17 Claims
-
1. An apparatus comprising:
-
a temperature-sensing circuit; and a register coupled to the temperature-sensing circuit, wherein the register is separate from the temperature-sensing circuit, and wherein the register is configured to; receive a temperature select value from a register load operation; and provide the temperature select value to the temperature-sensing circuit. - View Dependent Claims (2, 3, 4, 5, 6, 7)
-
-
8. A method comprising:
-
receiving, at a register, a temperature select value from a register load operation; providing, from the register, the temperature select value to a temperature-sensing circuit that is separate from the register. - View Dependent Claims (9, 10, 11, 12, 13)
-
-
14. An apparatus comprising:
-
a temperature-sensing circuit; and a plurality of register circuits coupled to and separate from the temperature-sensing circuit and configured to; receive a plurality of bits corresponding to a plurality of temperature select values from a plurality of register circuit load operations; and provide the received plurality of bits to the temperature-sensing circuit. - View Dependent Claims (15)
-
-
16. A method comprising:
-
receiving, at a plurality of register circuits, a plurality of bits corresponding to a plurality of temperature select values from a plurality of register load operations; providing, from the plurality of register circuits, the plurality of bits to a temperature-sensing circuit that is separate from the plurality of register circuits. - View Dependent Claims (17)
-
Specification