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Masking defective bits in a storage array

  • US 9,766,972 B2
  • Filed: 08/07/2014
  • Issued: 09/19/2017
  • Est. Priority Date: 08/07/2014
  • Status: Active Grant
First Claim
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1. A method of failure mapping, comprising:

  • distributing user data throughout a plurality of storage nodes through erasure coding, wherein each of the plurality of storage nodes has a non-volatile solid-state storage with non-volatile memory;

    determining that the non-volatile memory has a defect;

    generating a mask that indicates the defect, the generating based on error correction of reads of the non-volatile solid-state storage, wherein the mask is one of a plurality of masks in a mask hierarchy in the storage cluster, wherein the mask hierarchy includes masks of differing physical levels of the non-volatile memory, and wherein the generating supports combining the masks of differing physical levels to generate one or more page specific masks; and

    reading from the non-volatile memory with application of the mask, wherein the reading and the application of the mask are performed by the non-volatile solid-state storage.

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