Latent fingerprint detectors and fingerprint scanners therefrom

• US 9,767,340 B2
• Filed: 10/06/2015
• Issued: 09/19/2017
• Est. Priority Date: 11/03/2010
• Status: Active Grant

• Current Assignee: Leidos Innovations Technology, Inc.
• Original Assignee: Leidos Innovations Technology, Inc.
• Inventors: Miesak, Edward, Gold, V. Edward
• Primary Examiner(s): DULANEY, KATHLEEN YUAN
• Application Number:
  US14/875,882
• Publication Number:
  US 20160026845A1
• Time in Patent Office: 714 Days
• Field of Search: 382124, 382116, 382312, 348 91, 356 71
• CPC Class Codes: G01N 21/8851 Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002
• CPC Class Codes: G01N 21/94 Investigating contamination, e.g. dust G01N21/85 takes precedence
• CPC Class Codes: G01N 2201/06113 Coherent sources; lasers
• CPC Class Codes: G01N 2201/10 Scanning
• CPC Class Codes: G06V 40/1312 direct reading, e.g. contactless acquisition

Abstract

This document relates to systems and method for latent fingerprint detection using specular reflection (glare). An exemplary system may include a light source alignment portion configured to align a light source at an illumination angle relative to a sample surface such that the light source illuminates a sample surface so that the surface produces specular reflection. The system may also include a specular reflection discriminator that directs the produced specular reflection to an optical detector aligned relative to said sample surface at an alignment angle that is substantially equal to an angle of reflection of the produced specular reflection. Preferably, the directed specular reflection does not saturate the optical detector; and the optical detector captures the specular reflection from the sample surface and generates image data using essentially only the specular reflection.

Claims

1. A method of detecting surface contaminants, comprising:

illuminating a sample surface with a first light source to produce specular reflection from the sample surface;

capturing the specular reflection from the sample surface with an optical detector arranged at a critical alignment angle relative to the first light source;

generating image data with the optical detector using the specular reflection to generate image data of the sample surface;

discriminating against diffuse reflection by said first light source and said optical detector having substantially equal and opposite numerical apertures with geometric filtering; and

analyzing said generated image data of the sample surface with a processor to determine if said generated image data includes an image of a surface contaminant.

2. The method of claim 1, further comprising illuminating the sample surface with a second light source such that the sample surface produces diffuse reflection.

3. The method of claim 1, wherein the surface contaminant comprises at least one of a fracture in the sample surface and a physical defect in the sample surface.

4. The method according to claim 1, wherein illuminating the sample surface with the first light source further comprises illuminating the sample surface with a broadband light source.

5. The method according to claim 1, wherein illuminating the sample surface with the first light source further comprises illuminating the sample surface with a collimated beam of light produced by the first light source.

6. The method according to claim 1, further comprising scanning the optical detector across a plurality of regions of interest on the sample surface with at least one scanner mechanically coupled to the optical detector.

7. The method according to claim 1, wherein capturing the specular reflection from the sample surface with an optical detector further comprises directing and focusing incoming light onto a detector portion of an optical arrangement within the optical detector having a numerical aperture of the optical arrangement of zero to capture the specular reflection.

8. The method according to claim 1, further comprising producing image data of the surface contaminant responsive to a determination that the analyzed image data includes the surface contaminant.

9. A method for detecting a surface contaminant, comprising:

illuminating a sample surface to produce specular reflection with a light source alignment portion that aligns a light source at an illumination angle relative to the sample surface;

directing the specular reflection with a specular reflection discriminator to an optical detector aligned relative to the sample surface at an alignment angle that is substantially equal to an angle of reflection of the specular reflection such that the directed specular reflection does not saturate the optical detector, the optical detector and the light source have substantially equal and opposite numerical apertures to create geometric filtering to discriminate against diffuse reflection;

capturing the specular reflection from the sample surface with the optical detector; and

generating image data using essentially only the specular reflection to generate image data of the sample surface.

10. The method according to claim 9, further comprising analyzing the generated image data with a processor to determine if the generated image data includes a surface contaminant.

11. The method according to claim 10, further comprising producing image data of the surface contaminant responsive to a determination that the analyzed image data includes the surface contaminant.

12. The method according to claim 10, further comprising scanning the optical detector across a plurality of regions of interest on the sample surface with at least one scanner mechanically coupled to the optical detector.

13. The method according to claim 12, wherein scanning the optical detector further comprises maintaining a critical alignment angle during scanning with the scanner.