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Semiconductor module

  • US 9,772,359 B2
  • Filed: 09/30/2014
  • Issued: 09/26/2017
  • Est. Priority Date: 03/28/2011
  • Status: Active Grant
First Claim
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1. A semiconductor module comprising:

  • a substrate;

    a first wiring disposed on the substrate;

    an electrode pad connected to the first wiring;

    a junction disposed between the electrode pad and another electrode pad, the junction being a material having an impedance within a predetermined range of a characteristic impedance of the first wiring,the first wiring, the electrode pad and the junction being mechanically direct-connected;

    an oscillator that oscillates a predetermined voltage signal toward the junction via the first wiring, the oscillator being connected to the first wiring;

    a detector that detects the predetermined voltage signal from the junction via the first wiring, the detector being connected to the first wiring; and

    an analysis unit that decides a crack area of the junction, based on an oscillation voltage signal of the first wiring oscillated by the oscillator, a voltage value of a detection voltage signal detected by the detector via the first wiring, and a table that stores a relationship among a ratio of the crack area to a section area of the junction, a voltage range including the voltage value of the detection voltage signal, and a predetermined count value of a number of times of occurrence of the voltage value within the voltage range during a predetermined pulse occurrence time,wherein the junction is electrically inserted between the oscillator and the detector via the first wiring,the oscillation voltage signal is a pulse wave signal,the voltage range and the predetermined count value are stored in correspondence with respective different values of the ratio in the table,the analysis unit makes the oscillator generate the oscillation voltage signal during the predetermined pulse occurrence time, and, when the number of times of occurrence of the voltage value within a voltage range in the table during the predetermined pulse occurrence time is larger than or equal to the predetermined count value corresponding to the voltage range in the table, decides the crack area based on a value of the ratio corresponding to the voltage range in the table.

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