Voltage-driven intelligent characterization bench for semiconductor
First Claim
1. A method for testing a plurality of semiconductor devices, said system comprising:
- providing a plurality of driver channels, each driver channel connected to a storage device via a bus, each driver channel connected to a respective semiconductor device of the plurality of semiconductor devices, wherein each driver channel comprises;
a first voltage driver connected to the respective semiconductor device and having a first input for the respective semiconductor device, a second voltage driver connected to the respective semiconductor device and having a second input for the respective semiconductor device, a first set of optical switches in the first voltage driver, a second set of optical switches in the second voltage driver, and a microcontroller;
simultaneously grounding all connections between the respective semiconductor device and both the first voltage driver and the second voltage driver, in response to all optical switches of the first set and the second set of optical switches being closed;
said microcontroller receiving test parameters from the storage device and setting the received test parameters in the first voltage driver and the second voltage driver;
independently and simultaneously testing, using the plurality of driver channels and the received test parameters and while said all connections between the respective semiconductor device and both the first voltage driver and the second voltage driver are grounded, the respective semiconductor device to which each driver channel is connected; and
providing test results from the test to the storage device.
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Abstract
A method, and forming an associated system, for testing semiconductor devices. Driver channels are provided, each driver channel connected to a storage device via a bus and connected to a respective semiconductor device. Each driver channel includes: a first voltage driver connected to the respective semiconductor device and having a first input for the respective semiconductor device, a second voltage driver connected to the respective semiconductor device and having a second input for the respective semiconductor device, first and second sets of optical switches in the first and second voltage driver respectively, and a microcontroller. All connections between the respective semiconductor device and both the first and second voltage drivers, in response to all optical switches of the first and second set of optical switches being closed. The semiconductor devices are tested, using the driver channels and the test parameters. The test results are provided to the storage device.
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Citations
20 Claims
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1. A method for testing a plurality of semiconductor devices, said system comprising:
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providing a plurality of driver channels, each driver channel connected to a storage device via a bus, each driver channel connected to a respective semiconductor device of the plurality of semiconductor devices, wherein each driver channel comprises;
a first voltage driver connected to the respective semiconductor device and having a first input for the respective semiconductor device, a second voltage driver connected to the respective semiconductor device and having a second input for the respective semiconductor device, a first set of optical switches in the first voltage driver, a second set of optical switches in the second voltage driver, and a microcontroller;simultaneously grounding all connections between the respective semiconductor device and both the first voltage driver and the second voltage driver, in response to all optical switches of the first set and the second set of optical switches being closed; said microcontroller receiving test parameters from the storage device and setting the received test parameters in the first voltage driver and the second voltage driver; independently and simultaneously testing, using the plurality of driver channels and the received test parameters and while said all connections between the respective semiconductor device and both the first voltage driver and the second voltage driver are grounded, the respective semiconductor device to which each driver channel is connected; and providing test results from the test to the storage device. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10)
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11. A method for forming a system configured to test a plurality of semiconductor devices, said method comprising:
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connecting each driver channel of a plurality of driver channels to a storage device via a bus; connecting each driver channel to a respective semiconductor device of the plurality of semiconductor devices, wherein the plurality of driver channels are configured to;
(i) independently and simultaneously test, using test parameters, the respective semiconductor device to which each driver channel is connected and (ii) provide test results from the test to the storage device, wherein each driver channel comprises a first voltage driver connected to the respective semiconductor device and having a first input for the respective semiconductor device,a second voltage driver connected to the respective semiconductor device and having a second input for the respective semiconductor device, a microcontroller for receiving the test parameters from the storage device and set the test parameters in the first voltage driver and the second voltage driver; and
a first set of optical switches in the first voltage driver and a second set of optical switches in the second voltage driver; andsimultaneously grounding all connections between the respective semiconductor device and both the first voltage driver and the second voltage driver, in response to all optical switches of the first set and the second set of optical switches being closed. - View Dependent Claims (12, 13, 14, 15, 16, 17, 18, 19, 20)
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Specification