X-ray detector assembly

• US 9,772,409 B2
• Filed: 12/30/2015
• Issued: 09/26/2017
• Est. Priority Date: 12/30/2014
• Status: Active Grant

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Granfors, Paul, Liu, James
• Primary Examiner(s): Porta, David
• Assistant Examiner(s): FEIN, ABRA S
• Application Number:
  US14/984,184
• Publication Number:
  US 20160187499A1
• Time in Patent Office: 636 Days
• Field of Search: 250362
• CPC Class Codes: G01T 1/2002 Optical details, e.g. reflecting or diffusing layers
• CPC Class Codes: G01T 1/2018 Scintillation-photodiode combinations
• CPC Class Codes: G01T 1/24 with semiconductor detectors

Abstract

An X-ray detector assembly comprising a light attenuator of electro-chromic material, the electro-chromic material having a first electrode layer electrically coupled to a first surface of the electro-chromic material and a second electrode layer electrically coupled to a second surface of the electro-chromic material, wherein the second surface is disposed opposite the first surface, and the light attenuator having a controllable light transmission rate. The X-ray detector further comprising a scintillator deposited on the first electrode layer and a photo detector deposited on the second electrode layer. The photo detector having a sensing surface adjacent to the second electrode layer of the light attenuator. A variable power supply is electrically coupled to the first and second electrode layers of the light attenuator to provide a controllable voltage across the first and second electrode layers to control the light transmission rate of the light attenuator in real time.

Claims

1. A method of varying a light attenuation rate of an X-ray detector, the method comprising the steps of:

converting X-ray photons into visible light photons by passing the X-ray photons through a scintillator;

passing the visible light photons through a light attenuator, wherein the light attenuator comprises a first electrode layer, an electro-chromic layer of electrochromic material, and a second electrode layer;

applying a voltage across the first and second electrode layers of the light attenuator;

varying the voltage applied across the first and second electrode layers to vary the attenuation of at least a portion of the visible light passing through the light attenuator in real time;

converting at least a portion of the visible light photons into electrons, forming a conversion factor; and

wherein the conversion factor is between about 1200 electrons per X-ray photon and 1600 electrons per X-ray photon.

2. A method of varying a light attenuation rate of an X-ray detector, the method comprising the steps of:

converting X-ray photons into visible light photons by passing the X-ray photons through a scintillator;

passing the visible light photons through a light attenuator, wherein the light attenuator comprises a first electrode layer, an electro-chromic layer of electrochromic material, and a second electrode layer;

applying a variable voltage across the first and second electrode layers of the light attenuator;

adjusting the voltage applied across the first and second electrode layers to vary the attenuation of at least a portion of the visible light passing through the light attenuator in real time; and

converting at least a portion of the visible light photons into electrons, forming a conversion factor; and

wherein the conversion factor is between 1200 electrons per X-ray photon and 1600 electrons per X-ray photon.