Opto-mechanical inertial sensor
First Claim
1. A micro-electro-mechanical system (MEMS) apparatus, comprising:
- a first waveguide; and
a second waveguide, substantially aligned endface to endface with the first waveguide, wherein at least a portion of the second waveguide is disposed on a movable proof mass structure, wherein one of the first or second waveguide is to receive at least a portion of the a light beam from another one of the first or second waveguide via optical coupling through the substantially aligned endfaces,wherein a movement of the proof mass structure in response to an inertial change of the apparatus results in a shearing motion of the second waveguide relative to the first waveguide, such that a longitudinal axis of the at least a portion of the second waveguide is to move in the shearing motion relative to a longitudinal axis of the first waveguide whereby an endface of the first waveguide and an endface of the second waveguide are parallel during the shearing motion, and wherein movement of the endface of the second waveguide relative to a corresponding endface of the first waveguide that results from the movement of the longitudinal axis of the at least a portion of the second waveguide relative to the longitudinal axis of the first waveguide causes a corresponding change in light intensity of the portion of the light beam that indicates a measure of the inertial change.
1 Assignment
0 Petitions
Accused Products
Abstract
Embodiments of the present disclosure are directed towards a micro-electromechanical system (MEMS) sensing apparatus, including a laser arrangement configured to generate a light beam, a first waveguide configured to receive and output the light beam, and a second waveguide aligned endface to endface with the first waveguide. The second waveguide may be configured to receive at least a portion of the light beam from the first waveguide via optical coupling through the aligned endfaces. Either the first or second waveguide may be configured to be moveable in response to an inertial change of the apparatus, wherein movement of the first or second waveguide causes a corresponding change in light intensity of the portion of the light beam, the change in light intensity indicating a measure of the inertial change. Other embodiments may be described and/or claimed.
-
Citations
24 Claims
-
1. A micro-electro-mechanical system (MEMS) apparatus, comprising:
-
a first waveguide; and a second waveguide, substantially aligned endface to endface with the first waveguide, wherein at least a portion of the second waveguide is disposed on a movable proof mass structure, wherein one of the first or second waveguide is to receive at least a portion of the a light beam from another one of the first or second waveguide via optical coupling through the substantially aligned endfaces, wherein a movement of the proof mass structure in response to an inertial change of the apparatus results in a shearing motion of the second waveguide relative to the first waveguide, such that a longitudinal axis of the at least a portion of the second waveguide is to move in the shearing motion relative to a longitudinal axis of the first waveguide whereby an endface of the first waveguide and an endface of the second waveguide are parallel during the shearing motion, and wherein movement of the endface of the second waveguide relative to a corresponding endface of the first waveguide that results from the movement of the longitudinal axis of the at least a portion of the second waveguide relative to the longitudinal axis of the first waveguide causes a corresponding change in light intensity of the portion of the light beam that indicates a measure of the inertial change. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 13, 14, 15, 16, 17, 18, 19)
-
-
12. The apparatus of clam 11, wherein the proof mass structure is affixed to the frame by at least two springs.
-
20. A method for detecting inertial change in an apparatus, comprising:
-
providing, by a light source generation unit of an apparatus, a light beam to a first waveguide, the first waveguide having an endface optically coupled with an endface of a second waveguide to cause the second waveguide to transmit at least a portion of the light beam, wherein at least a portion of one of the first or second waveguide is disposed on a proof mass structure that is moveable in a shearing motion in response to an inertial change of the apparatus, resulting in a movement of a longitudinal axis of the at least a portion of the one of the first or second waveguide in the shearing motion relative to a longitudinal axis of another one of the first or second waveguide, and in a correspondent movement of an endface of the one of the first or second waveguide in the shearing motion relative to a corresponding endface of the other one of the first or second waveguide whereby the endface of the first waveguide and the endface of the second waveguide are parallel during the shearing motion; and detecting, by a detection module of the apparatus, in response to the inertial change of the apparatus, a change in light intensity of the portion of the light beam transmitted by the second waveguide, the change caused by the movement of the endface of the one of the first or second waveguide in the shearing motion relative to the corresponding endface of the other one of the first or second waveguide, respectively, the change indicating a measure of the inertial change of the apparatus. - View Dependent Claims (21)
-
-
22. A computing device comprising:
-
a processor; and a micro-electro-mechanical system (MEMS) apparatus coupled with the processor, the MEMS apparatus comprising; a first waveguide; a second waveguide, substantially aligned endface to endface with the first waveguide, wherein at least a portion of the second waveguide is disposed on a movable proof mass structure, wherein one of the first or second waveguide is to receive at least a portion of a light beam from another one of the first or second waveguide via optical coupling through the substantially aligned endfaces, wherein a movement of the proof mass structure in response to an inertial change of the computing device results in a shearing motion of the second waveguide relative to the first waveguide, such that a longitudinal axis of the at least a portion of the second waveguide is to move in the shearing motion relative to a longitudinal axis of the first waveguide, respectively, and wherein the movement of the second waveguide relative to the first waveguide causes a movement of an endface of the second waveguide relative to a corresponding endface of the first waveguide, which results in a change in light intensity of the portion of the light beam whereby the endface of the first waveguide and the endface of the second waveguide are parallel during the shearing motion; and a detector coupled with the one of the first or second waveguide to detect the change in light intensity of the portion of the light beam and output a signal to the processor, the signal indicating a measure of light intensity, wherein the processor is to determine an inertial change of the computing device based upon the signal. - View Dependent Claims (23, 24)
-
Specification