Method, apparatus and system providing adjustment of pixel defect map
First Claim
Patent Images
1. A method of adjusting a pixel array defect map comprising:
- storing an initial pixel defect map corresponding to a pixel sensor array;
obtaining pixel output signals from the pixel sensor array, wherein the pixel output signals represent an imaged scene;
using the pixel output signals to determine current defective pixel locations in accordance with pixel defect criteria and independent of the stored pixel defect map, wherein the current defective pixel locations correspond to a marking of “
DEFECT”
or “
TRUE DEFECT,”
checking whether a condition exists based on the pixel output signals and a predetermined threshold, wherein the condition represents a cause external to the imaged scene that affects detection of the defective pixel locations and whether the current defective pixel locations correspond to the “
TRUE DEFECT”
marking;
comparing the stored pixel defect map with the said current defective pixel locations;
determining if the stored pixel defect map needs adjusting by using the results of the comparison and the results of the determination of whether the condition exists; and
updating and storing the pixel defect map if adjusting is determined to be necessary.
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Abstract
A method, apparatus and system that allows for the identification of defective pixels, for example, defective pixel clusters, in an imager device. The method, apparatus and system determine, during use of the imager device, that a pixel defect, e.g., cluster defect, exists and accurately maps the location of the defective pixel. By analyzing more than one frame of an image, the method increases the accuracy of the defect mapping, which is used to improve the quality of the resulting image data.
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Citations
20 Claims
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1. A method of adjusting a pixel array defect map comprising:
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storing an initial pixel defect map corresponding to a pixel sensor array; obtaining pixel output signals from the pixel sensor array, wherein the pixel output signals represent an imaged scene; using the pixel output signals to determine current defective pixel locations in accordance with pixel defect criteria and independent of the stored pixel defect map, wherein the current defective pixel locations correspond to a marking of “
DEFECT”
or “
TRUE DEFECT,”checking whether a condition exists based on the pixel output signals and a predetermined threshold, wherein the condition represents a cause external to the imaged scene that affects detection of the defective pixel locations and whether the current defective pixel locations correspond to the “
TRUE DEFECT”
marking;comparing the stored pixel defect map with the said current defective pixel locations; determining if the stored pixel defect map needs adjusting by using the results of the comparison and the results of the determination of whether the condition exists; and updating and storing the pixel defect map if adjusting is determined to be necessary. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method of operating an imager device comprising:
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saving a pre-trigger pixel defect map having a location for each of a plurality of pixel sensors in an imager device; perceiving a trigger event; subsequently obtaining at least one pixel output signal from a pixel-under-test associated with a first location in the map, wherein the at least one pixel output signal represents an imaged scene; determining whether a true pixel defect cluster is currently detected at the location for the pixel-under-test, wherein determining whether a true pixel defect cluster is currently detected includes— using the at least one output signal from the pixel-under test to determine whether a pixel defect cluster is currently detected at the location for the pixel-under-test independently from the saved pre-trigger pixel defect map, wherein the at least one output signal at the location corresponds to a marking of “
DEFECT”
or “
TRUE DEFECT”
, andchecking whether a condition exists based on the pixel output signals and a predetermined threshold, wherein the condition represents a cause external to the imaged scene that affects detection of the defective pixel locations; and updating the pre-trigger defect map after the triggering event with the data created based on the act of determining if a true pixel defect cluster is detected and the results of the determination of whether the condition exists. - View Dependent Claims (17, 18, 19)
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20. A method of adjusting a pixel array defect map comprising:
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storing an initial pixel defect map corresponding to a pixel sensor array; obtaining pixel output signals from the pixel sensor array, wherein the pixel output signals represent an imaged scene; using the pixel output signals to determine current defective pixel locations in accordance with pixel defect criteria and independent of the stored pixel defect map, wherein the current defective pixel locations correspond to a marking of “
DEFECT”
or “
TRUE DEFECT,”checking whether a condition exists based on the pixel output signals and a predetermined threshold, wherein the condition represents a cause external to the imaged scene that affects detection of the defective pixel locations and whether the current defective pixel locations correspond to the “
TRUE DEFECT”
marking;comparing the stored pixel defect map with the current defective pixel locations, wherein if a pixel defect cluster is not detected, the method further comprises determining if a cluster is sited at the location in the stored pixel defect map; determining if the stored pixel defect map needs adjusting by using the results of the comparison and the results of the determination of whether the condition exists; and updating and storing the pixel defect map if adjusting is determined to be necessary, wherein updating the pixel defect map comprises removing a cluster defect from the map if it is determined that the type of defect is different than a type of defect cluster associated with the location in the pixel defect map, or marking a cluster defect as the “
TRUE DEFECT”
on the map if it is determined that the type of defect is the same as a type of defect cluster associated with the location in the pixel defect map.
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Specification