X-ray detection apparatus

• US 9,784,851 B2
• Filed: 11/28/2016
• Issued: 10/10/2017
• Est. Priority Date: 11/08/2011
• Status: Expired due to Fees

• Current Assignee: IBEX Innovations Ltd.
• Original Assignee: IBEX Innovations Ltd.
• Inventors: Gibson, Gary
• Primary Examiner(s): Fox, Dani
• Application Number:
  US15/361,793
• Publication Number:
  US 20170074991A1
• Time in Patent Office: 316 Days
• CPC Class Codes: G01N 23/04 and forming images of the material
• CPC Class Codes: G01T 1/20 with scintillation detectors
• CPC Class Codes: G01T 1/2985 In depth localisation, e.g. using positron emitters; Tomographic imaging (longitudinal and transverse section imaging; apparatus for radiation diagnosis sequentially in different planes, steroscopic radiation diagnosis); using external radiation sources A61B6/02

Abstract

An X-ray imaging apparatus is disclosed that includes an x-ray detector. The x-ray detector includes a member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons, a position for a material under test, an x-ray source, and a structure configured to perturb an x-ray energy spectrum, each lying on a common axis. The x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test. The structure lies between the x-ray source and the member to one side of the position for material under test intersecting the common axis, and the structure includes at least three adjacent regions, each region different to immediately adjacent regions and configured to perturb the x-ray energy spectrum differently.

Claims

1. An x-ray imaging and materials identification apparatus, the apparatus including an x-ray detector comprising:

a single member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons,

a position for a material under test,

an x-ray source, and

a structure configured to perturb an x-ray energy spectrum, wherein the single member, the position for a material under test, the x-ray source, and the structure configured to perturb an x-ray energy spectrum each lie on a common axis, wherein;

the x-ray source is arranged to direct an x-ray energy spectrum along the common axis to impinge upon the member, the structure configured to perturb the x-ray energy spectrum, and positioned material under test,

said structure lies between the x-ray source and the single member to one side of the position for material under test intersecting the common axis,

the structure configured to perturb an x-ray energy spectrum comprises at least three adjacent regions, each different from each other and having a different x-ray energy spectrum perturbing characteristic; and

a difference between the three adjacent regions of the structure configured to perturb the x-ray energy spectrum includes a different material from which each individual region of the three adjacent regions of the structure is formed.

2. An x-ray imaging and materials identification apparatus according to claim 1, wherein the member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons is a scintillator.

3. An x-ray imaging and materials identification apparatus according to claim 2, wherein the scintillator includes a scintillator layer and a backing layer.

4. An x-ray imaging and materials identification apparatus according to claim 1, wherein the plurality of regions is formed in an array.

5. An x-ray imaging and materials identification apparatus according to claim 4, wherein the array comprises an x by y array wherein the multiple of x and y is greater than or equal to three.

6. An x-ray imaging and materials identification apparatus according to claim 4, wherein the array repeats itself in the structure.

7. An x-ray imaging and materials identification apparatus according to claim 4, wherein the structure includes a multiplicity of arrays.

8. An x-ray imaging and materials identification apparatus according to claim 1, wherein the structure is planar or non-planar.

9. An x-ray imaging and materials identification apparatus according to claim 8, wherein the structure is curved in at least one plane.

10. An x-ray imaging and materials identification apparatus according to claim 1, wherein the individual regions of the structure include discrete layers.

11. An x-ray imaging and materials identification apparatus according to claim 1, wherein the material from which the discrete layers are formed differs between regions and/or within a region.

12. An x-ray imaging and materials identification apparatus according to claim 1, wherein the number of discrete layers differs between regions and/or within a region.

13. An x-ray imaging and materials identification apparatus according to claim 1, wherein the structure includes a plurality of discrete layers and at least one of the discrete layers includes at least one aperture.

14. An x-ray imaging and materials identification apparatus according to claim 13, wherein a plurality of the discrete layers include at least one aperture and wherein apertures of different layers within the structure are of different dimensions.

15. An x-ray imaging and materials identification apparatus according to claim 13, wherein the discrete layers are formed of foil.

16. An x-ray imaging and materials identification apparatus according to claim 13, wherein the discrete layers are formed of mesh.

17. An x-ray imaging and materials identification apparatus according to claim 1, wherein the scintillator layer is formed of a scintillator material having a flat energy dependence.

18. An x-ray imaging and materials identification apparatus according to claim 1, wherein the scintillator layer is formed of a scintillator material having a non-flat energy dependence.

19. An x-ray detector suitable for use in an x-ray imaging apparatus according to claim 1 and comprising:

a single member configured to convert incident x-ray wavelength photons into emitted visible wavelength photons; and

a structure for alignment with an x-ray energy spectrum source, the structure configured to perturb an x-ray energy spectrum;

and wherein the structure configured to perturb an x-ray energy spectrum comprises at least three adjacent regions, each different from each other and having a different x-ray energy spectrum perturbing characteristic; and

a difference between the three adjacent regions of the structure configured to perturb the x-ray energy spectrum includes a different material from which each individual region of the three adjacent regions of the structure is formed.

20. A structure according to claim 19, wherein the plurality of regions is formed in an array.

21. A structure according to claim 20, wherein the array is repeated in the structure.

22. A structure according to claim 19, wherein the structure includes a multiplicity of arrays.

23. A structure according to claim 19, wherein the structure is planar or non-planar.

24. A structure according to claim 19, wherein the structure is curved in at least one plane.

25. A structure according to claim 19, wherein the individual regions of the structure include discrete layers.

26. A structure according to claim 25, wherein the material from which the discrete layers are formed differs between regions and/or within a region.

27. A structure according to claim 25, wherein the number of discrete layers differs between regions and/or within a region.

28. A structure according to claim 25, wherein the structure includes a plurality of discrete layers and at least one of the discrete layers includes at least one aperture.

29. A structure according to claim 28, wherein a plurality of the discrete layers include at least one aperture and wherein apertures of different layers within the structure are of different dimensions.

30. A structure according to claim 28, wherein the discrete layers are formed of foil.

31. A structure according to claim 28, wherein the discrete layers are formed of mesh.