Evaluating image values
First Claim
Patent Images
1. A method for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the method comprising the steps of:
- capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface features;
computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image;
capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features;
computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image;
comparing the computed second measurement to the computed first measurement;
evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements;
capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces;
computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image;
comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement;
approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and
computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement.
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Abstract
Images of items are evaluated. A first image of the item, having a view of two or more of its surfaces, is captured at a first time. A measurement of at least one dimension of one or more of the surfaces is computed and stored. A second image of the item, having a view of at least one of the two or more surfaces, is captured at a second time, subsequent to the first time. A measurement of the dimension is then computed and compared to the stored first measurement. The computed measurement is evaluated based on the comparison.
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Citations
19 Claims
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1. A method for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the method comprising the steps of:
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capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface features; computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image; capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features; computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image; comparing the computed second measurement to the computed first measurement; evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements; capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces; computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image; comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement; approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17)
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18. A non-transitory computer readable storage medium comprising instructions, which when read and executed by a computer processor are operable for performing, controlling, or causing a process for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the process comprising:
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capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface features; computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image; capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features; computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image; comparing the computed second measurement to the computed first measurement; evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements; capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces; computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image; comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement; approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement.
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19. A computer system, comprising:
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a bus component; a processor component coupled to the bus component and operable for processing data; and a non-transitory storage component coupled to the bus component and comprising instructions, which when read and executed by the processor component are operable for performing, controlling or causing a process for evaluating whether an image of an item may be suitable for computing accurate dimension measurements, the process comprising; capturing a first image of the item at a first time, the first image comprising a view of two or more surfaces of the item and of one or more surface features; computing a first measurement of at least one dimension of at least one of the surface features based on the first captured image; capturing a second image of the item at a second time, which is subsequent to the first time, the second image comprising a view of at least one of the two or more surfaces and of at least one of the one or more surface features; computing a second measurement of the at least one dimension of the at least one of the surface features based on the second captured image; comparing the computed second measurement to the computed first measurement; evaluating whether the computed first measurement and/or the computed second measurement may be suitable for computing accurate dimension measurements; capturing at least a third image of the item at a corresponding time, which occurs between the first time and the second time, the at least a third image comprising a view of the at least one of the two or more surfaces; computing at least a third measurement of at least one dimension of at least one of the two or more surfaces based on the captured at least a third image; comparing the at least a third measurement computed in relation to the captured at least a third image to the computed first measurement and/or to the computed second measurement; approving the at least a third measurement, computed in relation to the captured at least a third image, based on the comparison to the computed first measurement and/or the computed second measurement; and computing a mean value based on the computed first measurement, and/or the computed second measurement, and the approved at least a third measurement.
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Specification