Semiconductor memory device and methods for manufacturing the same
First Claim
1. A semiconductor memory device, comprising:
- a first conductive layer;
a second conductive layer separated from the first conductive layer in a first direction;
a third conductive layer arranged with the first conductive layer in a second direction crossing the first direction;
a fourth conductive layer separated from the third conductive layer in the first direction and arranged with the second conductive layer in the second direction;
a first intermediate insulating layer provided between the first conductive layer and the third conductive layer;
a second intermediate insulating layer provided between the second conductive layer and the fourth conductive layer;
an inter-layer insulating layer including an intermediate partial region, the intermediate partial region being between the first intermediate insulating layer and the second intermediate insulating layer;
a first semiconductor body extending through the first conductive layer and the second conductive layer in the first direction;
a first memory layer provided between the first conductive layer and the first semiconductor body;
a second semiconductor body extending through the third conductive layer and the fourth conductive layer in the first direction;
a second memory layer provided between the third conductive layer and the second semiconductor body; and
a first interconnect electrically connected to the first semiconductor body and the second semiconductor body,at least one of the first intermediate insulating layer or the second intermediate insulating layer including a material different from a material of the intermediate partial region.
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Accused Products
Abstract
According to one embodiment, a semiconductor memory device includes first to fourth conductive layers, a first intermediate insulating layer, a second intermediate insulating layer, an inter-layer insulating layer, a first semiconductor body, a first memory layer, a second semiconductor body, a second memory layer, and a first interconnect. The second conductive layer is separated from the first conductive layer in a first direction. The third conductive layer is arranged with the first conductive layer in a second direction crossing the first direction. The fourth conductive layer is separated from the third conductive layer in the first direction and arranged with the second conductive layer in the second direction. The first intermediate insulating layer is provided between the first conductive layer and the third conductive layer. The second intermediate insulating layer is provided between the second conductive layer and the fourth conductive layer.
17 Citations
20 Claims
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1. A semiconductor memory device, comprising:
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a first conductive layer; a second conductive layer separated from the first conductive layer in a first direction; a third conductive layer arranged with the first conductive layer in a second direction crossing the first direction; a fourth conductive layer separated from the third conductive layer in the first direction and arranged with the second conductive layer in the second direction; a first intermediate insulating layer provided between the first conductive layer and the third conductive layer; a second intermediate insulating layer provided between the second conductive layer and the fourth conductive layer; an inter-layer insulating layer including an intermediate partial region, the intermediate partial region being between the first intermediate insulating layer and the second intermediate insulating layer; a first semiconductor body extending through the first conductive layer and the second conductive layer in the first direction; a first memory layer provided between the first conductive layer and the first semiconductor body; a second semiconductor body extending through the third conductive layer and the fourth conductive layer in the first direction; a second memory layer provided between the third conductive layer and the second semiconductor body; and a first interconnect electrically connected to the first semiconductor body and the second semiconductor body, at least one of the first intermediate insulating layer or the second intermediate insulating layer including a material different from a material of the intermediate partial region. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15)
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16. A method for manufacturing a semiconductor memory device, comprising:
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forming a stacked film by alternately stacking a first film and a second film on a base semiconductor layer, the stacked film including a plurality of the first films and a plurality of the second films; forming a first pillar-shaped structure body and a second pillar-shaped structure body, the first pillar-shaped structure body including a first semiconductor body and a first memory layer, the first semiconductor body extending through the stacked film along a stacking direction of the stacked film, the first memory layer being provided between the first semiconductor body and the stacked film, the second pillar-shaped structure body including a second semiconductor body and a second memory layer, the second semiconductor body extending through the stacked film along the stacking direction, the second memory layer being provided between the second semiconductor body and the stacked film; forming a hole in the stacked film; causing a third portion of the plurality of first films to remain while removing a first portion and a second portion of the plurality of first films via the hole, the third portion being positioned between the first pillar-shaped structure body and the second pillar-shaped structure body, the first portion being positioned between the third portion and the first pillar-shaped structure body, the second portion being positioned between the third portion and the second pillar-shaped structure body; forming a plurality of conductive layers from a conductive material by introducing the conductive material to at least a portion of a space formed by the removing of the first portion and the second portion; and forming an interconnect electrically connected to the first semiconductor body and the second semiconductor body. - View Dependent Claims (17, 18, 19, 20)
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Specification