System and method for detection of materials using orbital angular momentum signatures

• US 9,810,628 B2
• Filed: 01/05/2017
• Issued: 11/07/2017
• Est. Priority Date: 07/24/2014
• Status: Active Grant

• Current Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Original Assignee: Nxgen Partners Ip, LLC (NxGen Partners LLC)
• Inventors: Ashrafi, Solyman, Linquist, Roger
• Primary Examiner(s): Stock, Jr., Gordon J
• Application Number:
  US15/398,857
• Publication Number:
  US 20170115220A1
• Time in Patent Office: 306 Days
• CPC Class Codes: A61B 5/14532 for measuring glucose, e.g. by tissue impedance measurement
• CPC Class Codes: A61B 5/1455 using optical sensors, e.g. spectral photometrical oximeters
• CPC Class Codes: G01N 2021/1765 Method using an image detector and processing of image signal
• CPC Class Codes: G01N 21/17 Systems in which incident light is modified in accordance with the properties of the material investigated where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63
• CPC Class Codes: G01N 21/21 Polarisation-affecting properties G01N21/19 takes precedence
• CPC Class Codes: G01N 21/59 Transmissivity G01N21/25 takes precedence
• CPC Class Codes: G01N 24/00 Investigating or analyzing materials by the use of nuclear magnetic resonance, electron paramagnetic resonance or other spin effects
• CPC Class Codes: G01N 33/483 Physical analysis of biological material
• CPC Class Codes: G01N 33/4833 of solid biological material, e.g. tissue samples, cell cultures tissue in vivo A61B5/00; cell suspensions G01N33/48735
• CPC Class Codes: G01N 33/487 of liquid biological material
• CPC Class Codes: G01R 33/3657 Decoupling of multiple RF coils wherein the multiple RF coils do not have the same function in MR, e.g. decoupling of a transmission coil from a receive coil
• CPC Class Codes: G01R 33/3692 involving signal transmission without using electrically conductive connections, e.g. wireless communication or optical communication of the MR signal or an auxiliary signal other than the MR signal

Abstract

An apparatus for detecting a presence of a predetermined material within a sample uses signal generation circuitry for generating a first signal having a first distinct signature including a first eccentricity of a mode intensity, a first shift in a center of the mode intensity and a first rotation of an ellipsoidal intensity output of the mode intensity and applying the first signal to the sample. A detector receives the first signal after the first signal passes through the sample and detects a second distinct signature including a second eccentricity of the mode intensity, a second shift in the center of the mode intensity and a second rotation of the ellipsoidal intensity output of the mode intensity. The detector also determines the presence of the predetermined material within the sample based on the detected second distinct signature within the first signal received from the sample and provides an output of an indication of the presence of the predetermined material responsive to the determination.

Claims

1. An apparatus for detecting a presence of a predetermined material within a sample, comprising:

signal generation circuitry for generating a first signal having a first distinct signature including a first eccentricity of a mode intensity, a first shift in a center of the mode intensity and a first rotation of an ellipsoidal intensity output of the mode intensity and applying the first signal to the sample;

a detector for receiving the first signal after the first signal passes through the sample, for detecting a second distinct signature including a second eccentricity of the mode intensity, a second shift in the center of the mode intensity and a second rotation of the ellipsoidal intensity output of the mode intensity and for determining the presence of the predetermined material within the sample based on the detected second distinct signature within the first signal received from the sample, the detector providing an output of an indication of the presence of the predetermined material responsive to the determination.

2. The apparatus of claim 1, wherein the signal generation circuitry applies the first distinct signature using a spatial light modulator.

3. The apparatus of claim 1, wherein the signal generation circuitry applies the first distinct signature using a digital light processor.

4. The apparatus of claim 1, wherein the signal generation circuitry applies the first distinct signature using a hologram.

5. The apparatus of claim 1, wherein the signal generation circuitry applies the first distinct signature using an amplitude mask.

6. The apparatus of claim 1, wherein the signal generation circuitry applies the first distinct signature using a phase mask.

7. The apparatus of claim 1, wherein the detector further implements Photoshop to identify the second eccentricity of the mode intensity.

8. The apparatus of claim 1, wherein the detector implements Matlab to identify the second distinct signature.

9. The apparatus of claim 1, wherein the detector negates effects of at least one of sample distribution due to gravity, angle of camera recording the mode intensity to the sample, a container holding the sample, an angle of incidence of the first signal to the sample and an angle exit of the first signal from the sample to detect a change in an eccentricity of the mode intensity.

10. The apparatus of claim 1, wherein the detector further includes circuitry for determining a phase of the first signal after it passes through the sample, wherein the circuitry determines the phase by interfering the first signal having the second distinct signature therein with the first signal having plane waves therein.

11. A method for detecting a presence of a predetermined material within a sample based upon a unique orbital angular momentum signature, comprising:

generating a first signal having a first distinct signature including a first eccentricity of a mode intensity, a first shift in a center of the mode intensity and a first rotation of an ellipsoidal intensity output of the mode intensity;

applying the first signal to the sample;

receiving the first signal after the first signal passes through the sample;

detecting within the received first signal a second distinct signature including a second eccentricity of the mode intensity, a second shift in the center of the mode intensity and a second rotation of the ellipsoidal intensity output of the mode intensity;

determining the presence of the predetermined material within the sample based on the detected second distinct signature within the first signal received from the sample; and

providing an output of an indication of the presence of the predetermined material responsive to the determination.

12. The method of claim 11, wherein the step of generating further comprises the step of generating the first distinct signature using a spatial light modulator.

13. The method of claim 11, wherein the step of generating further comprises the step of generating the first distinct signature using a digital light processor.

14. The method of claim 11, wherein the step of generating further comprises the step of generating the first distinct signature using a hologram.

15. The method of claim 11, wherein the step of generating further comprises the step of generating the first distinct signature using an amplitude mask.

16. The method of claim 11, wherein the step of generating further comprises the step of generating the first distinct signature using a phase mask.

17. The method of claim 11, wherein the step of detecting further comprises implementing Photoshop to identify the second eccentricity of the mode intensity.

18. The method of claim 11, wherein the step of detecting further comprises detecting the second distinct signature using Matlab.

19. The method of claim 11, wherein the step of detecting comprises negating effects of at least one of sample distribution due to gravity, angle of camera recording the mode intensity to the sample, a container holding the sample, an angle of incidence of the first signal to the sample and an angle exit of the first signal from the sample to detect a change in an eccentricity of the mode intensity.

20. The method of claim 11, wherein the step of detecting further comprises:

interfering the first signal having the second distinct signature therein with the first signal having plane waves therein; and

determining a phase of the first signal after it passes through the sample responsive to the interfered first signal.