Combined scatter and transmission multi-view imaging system
First Claim
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1. An X-ray inspection system for scanning an object, the X-ray inspection system comprising:
- at least two rotating X-ray sources configured to simultaneously emit rotating X-ray beams, wherein each of said at least two rotating X-ray sources comprises a rotary encoder for determining an absolute angle of rotation of the X-ray beams and wherein each of said X-ray beams defines a transmission path;
at least two non-pixelated detector arrays, wherein each of said at least two non-pixelated detector arrays is placed opposite one of the at least two rotating X-ray sources to form a scanning area; and
at least one controller for controlling each of the at least two rotating X-ray sources to scan the object in a coordinated manner and arranged to form an X-ray scan image of the object by recording an intensity of a signal output from each of the at least two non-pixelated detector arrays and the angle of rotation of the X-ray beams.
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Abstract
The present specification discloses a multi-view X-ray inspection system having, in one of several embodiments, a three-view configuration with three X-ray sources. Each X-ray source rotates and is configured to emit a rotating X-ray pencil beam and at least two detector arrays, where each detector array has multiple non-pixellated detectors such that at least a portion of the non-pixellated detectors are oriented toward both the two X-ray sources.
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18 Claims
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1. An X-ray inspection system for scanning an object, the X-ray inspection system comprising:
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at least two rotating X-ray sources configured to simultaneously emit rotating X-ray beams, wherein each of said at least two rotating X-ray sources comprises a rotary encoder for determining an absolute angle of rotation of the X-ray beams and wherein each of said X-ray beams defines a transmission path; at least two non-pixelated detector arrays, wherein each of said at least two non-pixelated detector arrays is placed opposite one of the at least two rotating X-ray sources to form a scanning area; and at least one controller for controlling each of the at least two rotating X-ray sources to scan the object in a coordinated manner and arranged to form an X-ray scan image of the object by recording an intensity of a signal output from each of the at least two non-pixelated detector arrays and the angle of rotation of the X-ray beams. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11)
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12. An X-ray inspection system for scanning an object, the inspection system comprising:
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a first X-ray source and a second X-ray source configured to simultaneously emit rotating X-ray beams for irradiating the object, wherein each of the first X-ray source and second X-ray source comprises a rotary encoder configured to determine an angle of rotation of the X-ray beams and wherein each of said X-ray beams defines a transmission path; a non-pixelated detector array comprising at least one transmission detector placed between at least two backscatter detectors, wherein each of said at least two backscatter detectors detects X-rays backscattered by the first X-ray source from a first side of the object and wherein the at least one transmission detector detects transmitted X-rays emitted by the second X-ray source through an opposing side of the object; and at least one controller configured to control each of the first X-ray sources and second X-ray source to concurrently scan the object in a coordinated manner and configured to generate an X-ray scan image of the object from a signal outputs of the non-pixelated detector array and the angle of rotation of the X-ray beams. - View Dependent Claims (13, 14, 15, 16, 17, 18)
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Specification