System and process for accounting for aging effects in a computing device
First Claim
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1. A method, comprising:
- in response to an installation of a peripheral device in a computing system, directly measuring, with a plurality of dedicated circuits comprising a plurality of temperature sensors, operating conditions of a plurality of components comprised in the computing system, wherein the operating conditions comprise at least a temperature of the plurality of components during operation;
determining an amount of wear accumulated on the plurality of components based on the measured operating conditions;
calculating a number of accumulated credits for the computing system based on the determined amount of wear by plotting a first curve corresponding to the amount of wear and a second curve corresponding to a reference data and calculating the difference between the first and second curves;
adjusting operating conditions in the computing system based on the number of accumulated credits;
operating the computing system under adjusted operating conditions; and
increasing a frequency of said calculating said number of accumulated credits when said operating conditions are adjusted beyond a base performance level,wherein operating conditions in the computing system are prevented from increasing beyond the base performance level until the number of accumulated credits is positive.
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Abstract
Embodiments of the claimed subject matter are directed to methods and systems that allow tracking and accounting of wear and other aging effects in integrated circuits and products which include integrated circuits over time, and the dynamic adjustment of operating conditions to increase or decrease wear in response to the accumulated wear relative to the expected wear during the lifetime of the circuit and/or product.
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Citations
38 Claims
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1. A method, comprising:
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in response to an installation of a peripheral device in a computing system, directly measuring, with a plurality of dedicated circuits comprising a plurality of temperature sensors, operating conditions of a plurality of components comprised in the computing system, wherein the operating conditions comprise at least a temperature of the plurality of components during operation; determining an amount of wear accumulated on the plurality of components based on the measured operating conditions; calculating a number of accumulated credits for the computing system based on the determined amount of wear by plotting a first curve corresponding to the amount of wear and a second curve corresponding to a reference data and calculating the difference between the first and second curves; adjusting operating conditions in the computing system based on the number of accumulated credits; operating the computing system under adjusted operating conditions; and increasing a frequency of said calculating said number of accumulated credits when said operating conditions are adjusted beyond a base performance level, wherein operating conditions in the computing system are prevented from increasing beyond the base performance level until the number of accumulated credits is positive. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19, 20, 21)
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22. A computing system comprising:
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a processor configured to process programmed instructions in the computing system at a plurality of frequencies; a power supply device configured to supply power to the computing system at a plurality of voltages; a plurality of components comprised in the computing system, wherein the plurality of components accumulate wear over time during operation of the computing system; and a plurality of dedicated circuits comprising a plurality of temperature sensors and configured to measure operating conditions of the plurality of components, wherein the operating conditions comprise at least a temperature of the plurality of components during operation, wherein the measured operating conditions are tracked over time and used to determine an accumulated wear on the components comprised in the computing system, wherein, operating conditions in the computing system and corresponding to at least one of the processor and the power supply device are adjusted based on a number of accumulated credits determined to correspond to the accumulated wear on the plurality of integrated circuits, further wherein the plurality of dedicated circuits are configured to measure the operating conditions in response to an installation of a peripheral device in the computing system. - View Dependent Claims (23, 24, 25, 26, 27, 28, 29, 30, 31)
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32. A computing system comprising:
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a processor configured to process programmed instructions in the computing system at a plurality of frequencies; a power supply device configured to supply power to the computing system at a plurality of voltages; and a plurality of components that accumulates wear over time during operation of the computing system; and a plurality of dedicated circuits configured to measure, in response to an installation of a peripheral device in the computing system, operating conditions in a plurality of components comprised in the computing system, and to inspect the plurality of components for accumulated wear over time based on the measured operating conditions, wherein the plurality of dedicated circuits comprise a plurality of temperature sensors configured to measure a plurality of temperatures of the plurality of components, wherein the computing system accumulates a plurality of operating credits while the computing system operates at a performance level under a pre-determined threshold by calculating a difference between a plot of wear corresponding to the performance level of the computing system in a first curve and a plot of wear corresponding to a reference data in a second curve at a frequency and determining a difference between the first and second curves, and consumes operating credits while the computing system operates at a performance level above the pre-determined threshold, wherein, the computing system is further operable to operate at a performance level above the pre-determined threshold for so long as a surplus of the operating credits remains. - View Dependent Claims (33, 34, 35, 36, 37, 38)
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Specification