Multi-stage gate turn-off with dynamic timing

• US 9,825,625 B2
• Filed: 06/19/2015
• Issued: 11/21/2017
• Est. Priority Date: 07/09/2014
• Status: Active Grant

• Current Assignee: Power Integrations Incorporated
• Original Assignee: CT-Concept Technologie GmbH
• Inventors: Thalheim, Jan
• Primary Examiner(s): Kitov, Zeev V
• Application Number:
  US14/744,862
• Publication Number:
  US 20160013788A1
• Time in Patent Office: 886 Days
• CPC Class Codes: H02H 3/08 responsive to excess current responsive to abnormal temperature caused by excess current H02H5/04
• CPC Class Codes: H03K 17/0828 in composite switches
• CPC Class Codes: H03K 17/163 Soft switching
• CPC Class Codes: H03K 17/168 in composite switches
• CPC Class Codes: H03K 17/56 by the use, as active elements, of semiconductor devices using diodes H03K17/74

Abstract

A circuit for turning off a power semiconductor switch includes a turn-off transistor coupled to switch a signal for turning off the power semiconductor switch onto a control terminal of the power semiconductor switch and a feedback control loop for controlling a voltage on the control terminal of the power semiconductor switch during turn-off. The feedback loop includes a feedback path to feedback a measurement of the voltage of the control terminal of the power semiconductor switch, a control terminal reference voltage generator to generate a time-dependent reference voltage, an error amplifier to generate an error signal representative of a difference between the voltage of the control terminal and the time-dependent reference voltage, and a forward path to convey the error signal forward for controlling the switching of the signal for turning off the power semiconductor switch onto the control terminal of the power semiconductor switch by the turn-off transistor.

Claims

1. A circuit for turning off a power semiconductor switch, the circuit comprising:

a turn-off transistor coupled to switch a signal for turning off the power semiconductor switch onto a control terminal of the power semiconductor switch; and

a feedback control loop for controlling a voltage on the control terminal of the power semiconductor switch during turn-off, the feedback control loop comprising

a feedback path to feedback a measurement of the voltage of the control terminal of the power semiconductor switch,

a control terminal reference voltage generator to generate a time-dependent reference voltage, and

an error amplifier to generate an error signal representative of a difference between the voltage of the control terminal and the time-dependent reference voltage, and

a forward path to convey the error signal forward for controlling the switching of the signal for turning off the power semiconductor switch onto the control terminal of the power semiconductor switch by the turn-off transistor.

2. The circuit of claim 1, further comprising Miller plateau detection circuitry coupled to detect that the voltage of the control terminal of the power semiconductor switch is below a voltage level in a vicinity of the Miller plateau of the power semiconductor switch and output a signal indicative thereof.

3. The circuit of claim 2, wherein the control terminal reference voltage generator is to increase a time rate of change of the time-dependent reference voltage in response to the signal indicative that the control terminal of the power semiconductor switch is below the voltage level in the vicinity of the Miller plateau.

4. The circuit of claim 2, wherein the Miller plateau detection circuitry comprises control terminal current detection circuitry coupled to detect current flow to the control terminal of the power semiconductor switch.

5. The circuit of claim 2, wherein the Miller plateau detection circuitry comprises a voltage comparator coupled to compare the control terminal of the power semiconductor switch with a reference voltage.

6. The circuit of claim 2, wherein the Miller plateau detection circuitry detects that the voltage of the control terminal of the power semiconductor switch is below the voltage level in a vicinity of the Miller plateau of the power semiconductor switch using a control input of the turn-off transistor.

7. The circuit of claim 1, wherein the control terminal reference voltage generator comprises:

first circuitry to change the time-dependent reference voltage from a first value at which the power semiconductor switch is on to a second value in the vicinity of the Milller plateau of the power semiconductor switch; and

second circuitry to change the time-dependent reference voltage from a third value in the vicinity of the Miller voltage of the power semiconductor switch to a fourth value at which the power semiconductor switch is off.

8. The circuit of claim 7, wherein the first circuitry is to change the time-dependent reference voltage at a time rate of change that is less than a time rate of change at which the second circuitry changes the reference voltage.

9. The circuit of claim 8, wherein the first circuitry is to change the time-dependent reference voltage from the first value to the second value in between 400 nanoseconds and 4000 nanoseconds.

10. The circuit of claim 8, wherein the second circuitry is to change the time-dependent reference voltage from the third value to the fourth value in between 100 nanoseconds and 2000 nanoseconds.

11. The circuit of claim 8, wherein the second circuitry is to change the time-dependent reference voltage from the third value to the fourth value in between 10 nanoseconds and 100 nanoseconds.

12. The circuit of claim 7, wherein the second value is above the Miller plateau of the power semiconductor switch and the third value is below the Miller plateau of the power semiconductor switch.

13. The circuit of claim 7, wherein the control terminal reference voltage generator comprises circuitry to hold the time-dependent reference voltage constant between the second value and the third value.

14. The circuit of claim 1, further comprising fault detection circuitry coupled to output a fault signal in response to detection of a fault in current conduction through the power semiconductor switch, wherein the control terminal reference voltage generator is responsive to the fault signal to begin changing the reference voltage from a value at which the power semiconductor switch is open.

15. The circuit of claim 14, wherein the fault detection circuitry comprises circuitry for detecting a collector-to-emitter voltage of the power semiconductor switch.

16. The circuit of claim 1, wherein:

the signal for turning off the power semiconductor switch is a current; and

the circuit further comprises a turn-off gate resistor.

17. The circuit of claim 1, wherein the power semiconductor switch is an IGBT.

18. The circuit of claim 1, wherein the turn-off transistor is an NMOS transistor.

19. A turn-off circuit for a semiconductor switch, wherein the turn-off circuit comprises:

an element having a variable resistance, said element being coupled to a control input of the semiconductor switch;

a detection circuit, which is designed to detect an end of a Miller plateau in a control input voltage or in a control input current of the semiconductor switch; and

a control circuit, which is designed to control a resistance value of the element having a variable resistance in such a way that a voltage which is present at the control input of the semiconductor switch is reduced after the end of a Miller plateau at a predetermined rate.

20. The turn-off circuit of claim 19, wherein an end of a Miller plateau is detected on the basis of a voltage at a control input of the element having a variable resistance.

21. The turn-off circuit of claim 20, wherein an end of a Miller plateau is detected when the voltage at the control input of the element having a variable resistance falls below a determined signal level.

22. The turn-off circuit of claim 21, wherein the predetermined signal level is in a range of from 50% to 150% of an expected gate threshold voltage of the element having a variable resistance.

23. The turn-off circuit of claim 19, wherein the level of the control-input reference signal prior to an end of a Miller plateau being reached is substantially constant, and, in response to the detection of the end of the Miller plateau, the signal level of the control-input reference signal is reduced.