Virtual critical path (VCP) system and associated methods

• US 9,825,638 B2
• Filed: 03/05/2014
• Issued: 11/21/2017
• Est. Priority Date: 03/05/2014
• Status: Expired due to Fees

• Current Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Original Assignee: SanDisk Technologies LLC (Western Digital Corporation)
• Inventors: Dumchin, Yan, Baram, Yair, Tomashev, Michael, Minz, Leonid, Kaplan, Yevgeny, Zilberman, Suzanna
• Primary Examiner(s): LEE, ERIC D
• Application Number:
  US14/198,374
• Publication Number:
  US 20150254384A1
• Time in Patent Office: 1,357 Days
• Field of Search: 716134
• CPC Class Codes: G01R 31/28 Testing of electronic circuits, e.g. by signal tracer EMC, EMP or similar testing of electronic circuits G01R31/002; testing for short-circuits, discontinuities, leakage or incorrect line connection G01R31/50; checking computers or computer components G06F11/00; checking static stores for correct operation G11C29/00 ; testing receivers or transmitters of transmission systems H04B17/00
• CPC Class Codes: G01R 31/31725 Timing aspects, e.g. clock distribution, skew, propagation delay for tester hardware G01R31/31937
• CPC Class Codes: G06F 1/08 Clock generators with changeable or programmable clock frequency
• CPC Class Codes: G06F 1/206 comprising thermal management
• CPC Class Codes: G06F 1/324 by lowering clock frequency
• CPC Class Codes: G06F 1/3296 by lowering the supply or operating voltage
• CPC Class Codes: H03L 7/07 using several loops, e.g. for redundant clock signal generation
• CPC Class Codes: Y02D 10/00 Energy efficient computing, e.g. low power processors, power management or thermal management

Abstract

A virtual critical path (VCP) circuit is defined separate from an actual critical path circuit. The VCP operates in accordance with a special clock signal. The actual critical path circuit operates in accordance with a system clock signal. The VCP circuit has a signal timing characteristic substantially equal to that of the actual critical path circuit. The VCP circuit includes computational circuitry defined to compute an output value based on an input value, and comparison circuitry defined to compare the output value with an expected result value. A match between the output value computed by the VCP circuit and the expected result value indicates that a frequency of the special clock signal is acceptable. The VCP circuit is used to determine a maximum acceptable frequency of the special clock signal. A frequency of the system clock signal is then set to the maximum acceptable frequency of the special clock signal.

Claims

1. A semiconductor chip, comprising:

a critical path circuit comprising first circuitry defined between an input latch and an output latch, defined to operate in accordance with a system clock signal, wherein;

the first circuitry is configured to perform first logic functions on input data from the input latch to generate output data at the output latch, and

a critical path timing characteristic of the critical path circuit is defined as a time delay from clocking out of the input data from the input latch to clocking in of the output data into the output latch; and

a virtual critical path circuit comprising second circuitry defined to operate in accordance with a special clock signal, wherein;

the second circuitry is configured to perform second logic functions on an input value to generate an output value,

a virtual critical path timing characteristic of the virtual critical path circuit corresponds to a duration extending from receipt of the input value by the second circuitry to generation of the output value by the second circuitry, the second circuitry configured such that the virtual critical path timing characteristic is substantially equal to the critical path timing characteristic, and

the second logic functions performed on the input value by the second circuitry to generate the output value are different from the first logic functions performed on the input data by the first circuitry to generate the output data;

the virtual critical path circuit further comprising comparison circuitry configured to compare the output value computed by the second circuitry with an expected result value associated with the input value to determine whether a frequency of the special clock signal is acceptable.

2. The semiconductor chip as recited in claim 1, wherein the virtual critical path circuit includes special clock signal control circuitry defined to increase the frequency of the special clock signal between different operations of the second circuitry to compute the output value based on the input value so as to determine a maximum acceptable frequency of the special clock signal, wherein the maximum acceptable frequency of the special clock signal is a largest frequency of the special clock signal that provides for correct computation of the output value by the second circuitry based on comparison of the output value with the expected result value.

3. The semiconductor chip as recited in claim 2, wherein the virtual critical path circuit is defined to direct the second circuitry to compute a first output value based on a first input value and to compute a second output value based on a second input value in an alternating manner in accordance with successive cycles of the special clock signal.

4. The semiconductor chip as recited in claim 3, wherein the virtual critical path circuit includes circuitry for communicating a determined value of the maximum acceptable frequency of the special clock signal to system clock signal control circuitry to enable the adjustment of a frequency of the system clock signal to match the maximum acceptable frequency of the special clock signal.

5. The semiconductor chip as recited in claim 4, wherein the virtual critical path circuit includes synchronization circuitry defined to synchronize transfer of signals between a domain of the system clock signal and a domain of the special clock signal.

6. The semiconductor chip as recited in claim 1, wherein the second circuitry is defined separate from the critical path circuit, and wherein the second circuitry operates independent of the critical path circuit.

7. The semiconductor chip as recited in claim 6, wherein the second circuitry is located near the critical path circuit on the semiconductor chip such that the second circuitry and the critical path circuit are subject to similar process variation during manufacture, and such that the second circuitry and the critical path circuit are subject to similar voltage and temperature during operation of the semiconductor chip.

8. The semiconductor chip as recited in claim 1, wherein the virtual critical path circuit includes data-in flip-flop circuits configured to receive and store a first input data value and a second input data value, the second circuitry defined to perform computational operations on the first input data value and the second input data value in an alternating manner on successive cycles of the special clock signal.

9. The semiconductor chip as recited in claim 8, wherein the virtual critical path circuit includes a multiplexer configured to receive the first input data value and the second input data value as separate inputs, the multiplexer configured to transmit the first input data value and the second input data value as the input value to the second circuitry on successive cycles of the special clock signal.

10. The semiconductor chip as recited in claim 9, wherein the virtual critical path circuit includes data-out flip-flop circuits configured to receive and store a first output data value and a second output data value from the second circuitry, the first output data value generated by the second circuitry operating on the first input data value, the second output data value generated by the second circuitry operating on the second input data value.

11. The semiconductor chip as recited in claim 10, wherein the comparison circuitry is configured to receive the first output data value and the second output data value from the data-out flip-flop circuits, the comparison circuitry configured to compare the first output data value to a first expected result value to determine whether or not the second circuitry functioned correctly when processing the first input data value, the comparison circuitry configured to compare the second output data value to a second expected result value to determine whether or not the second circuitry functioned correctly when processing the second input data value.

12. The semiconductor chip as recited in claim 11, wherein the comparison circuitry is configured to transmit a comparison failure signal when the first output data value does not equal the first expected result value, and wherein the comparison circuitry is configured to transmit the comparison failure signal when the second output data value does not equal the second expected result value.

13. The semiconductor chip as recited in claim 1, wherein the second circuitry is configured to perform mathematical operations on the input value to generate the output value.

14. A method comprising:

operating a virtual critical path circuit defined to operate in accordance with a special clock signal, separate from a system clock signal of a critical path circuit, the critical path circuit comprising first circuitry defined between an input latch and an output latch, the first circuitry configured to perform first logic functions on input data transmitted from the input latch to generate output data at the output latch, the critical path circuit having a critical path timing characteristic defined as a time delay from clocking out of the input data from the input latch to clocking in of the output data into the output latch, the virtual critical path circuit comprising second circuitry configured to perform second logic functions on an input value to generate an output value, wherein;

the second logic functions performed by the second circuitry of the virtual critical path circuit on the input value to generate the output value differ from the first logic functions performed by the first circuitry of the critical path circuit,

the virtual critical path circuit has a virtual critical path timing characteristic corresponding to a duration extending from receipt of an input value by the second circuitry to generation of a corresponding output value by the second circuitry, the second circuitry configured such that the virtual critical path timing characteristic is substantially equal to the critical path timing characteristic, and

wherein operating the virtual critical path circuit further comprises;

comparing the output value generated by the second circuitry with an expected result value associated with the input value to determine that a frequency of the special clock signal is acceptable for operation of the critical path circuit; and

adjusting a frequency of the system clock signal to match the determined acceptable frequency of the special clock signal.

15. The method as recited in claim 14, further comprising:

increasing a frequency of the special clock signal for successive operation of the second circuitry to compute the output value based on the input value and comparison of the output value with the expected result value, the frequency of the special clock signal increased to determine a maximum acceptable frequency of the special clock signal, wherein the maximum acceptable frequency of the special clock signal is a highest frequency of the special clock signal that provides for correct computation of the output value by the second circuitry based on comparison of the output value with the expected result value.

16. The method as recited in claim 15, further comprising:

alternating between a first input value and a second input value between successive cycles of the special clock signal; and

alternating between a first expected result value and a second expected result value between successive cycles of the special clock signal, such that the first input value and the first expected result value are used on a same cycle of the special clock signal and such that the second input value and the second expected result value are used on a same cycle of the special clock signal.

17. The method as recited in claim 16, further comprising:

upon determining the maximum acceptable frequency of the special clock signal, adjusting the frequency of the system clock signal to match the maximum acceptable frequency of the special clock signal.

18. The method as recited in claim 17, further comprising:

synchronizing transfer of signals between a domain of the system clock signal and a domain of the special clock signal.

19. The method as recited in claim 16, further comprising:

loading the first input value, the second input value, the first expected result value, and the second expected result value into registers for access in operating the second circuitry to compute the output value based on the input value and for access in comparing the output value with the expected result value.

20. The method as recited in claim 14, wherein the second circuitry is located near the critical path circuit on a semiconductor chip such that the second circuitry and the critical path circuit are subject to similar process variation during manufacture, and such that the second circuitry and the critical path circuit are subject to similar voltage and temperature during operation of the semiconductor chip. second circuitry functioned correctly when processing the second input data value.