Method and device for detecting the surface structure and properties of a probe

• US 9,826,918 B2
• Filed: 08/28/2015
• Issued: 11/28/2017
• Est. Priority Date: 08/28/2015
• Status: Active Grant

• Current Assignee: Juergen Marx
• Original Assignee: Juergen Marx
• Inventors: Eberl, Heinrich Alexander, Marx, Juergen
• Primary Examiner(s): Porta, David
• Assistant Examiner(s): Maupin, Hugh H
• Application Number:
  US14/898,931
• Publication Number:
  US 20170059308A1
• Time in Patent Office: 823 Days
• CPC Class Codes: A61B 2562/0238 Optical sensor arrangements for performing transmission measurements on body tissue
• CPC Class Codes: A61B 2576/00 Medical imaging apparatus involving image processing or analysis A61B1/00009, A61B6/52 and A61B8/52 take precedence; image processing per se G06T; details of algorithms for analysing medical images G06T7/0012
• CPC Class Codes: A61B 5/0077 Devices for viewing the surface of the body, e.g. camera, magnifying lens
• CPC Class Codes: A61B 5/1032 Determining colour for diagnostic purposes measuring colour in general G01J3/46
• CPC Class Codes: A61B 5/1172 using fingerprinting
• CPC Class Codes: A61B 5/1455 using optical sensors, e.g. spectral photometrical oximeters
• CPC Class Codes: A61B 5/441 Skin evaluation, e.g. for skin disorder diagnosis
• CPC Class Codes: A61B 5/6826 Finger
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures
• CPC Class Codes: G01N 21/3563 for analysing solids; Preparation of samples therefor
• CPC Class Codes: G01N 21/4738 Diffuse reflection precedence is given to G01N21/55 - G01N21/57 if specular component is taken into consideration, e.g. also for testing fluids, fibrous materials
• CPC Class Codes: G01N 21/8422 Investigating thin films, e.g. matrix isolation method
• CPC Class Codes: G01N 2201/06113 Coherent sources; lasers
• CPC Class Codes: G01N 2201/105 Purely optical scan
• CPC Class Codes: G01N 2201/12 Circuits of general importance; Signal processing
• CPC Class Codes: G01S 17/42 Simultaneous measurement of distance and other co-ordinates indirect measurement G01S17/46
• CPC Class Codes: G01S 17/86 Combinations of lidar systems with systems other than lidar, radar or sonar, e.g. with direction finders
• CPC Class Codes: G01S 17/89 for mapping or imaging
• CPC Class Codes: G01S 7/4802 using analysis of echo signal for target characterisation; Target signature; Target cross-section
• CPC Class Codes: G01S 7/4817 relating to scanning
• CPC Class Codes: H04N 23/56 : provided with illuminating means
• CPC Class Codes: H04N 3/09 : for electromagnetic radiation in the invisible region, e.g. infrared
• CPC Class Codes: H04N 5/33 : Transforming infrared radiation cameras or camera modules for generating image signals from infrared radiation H04N23/20; circuitry of SSIS for transforming infrared radiation into image signals H04N25/20

Abstract

A method for detecting the surface structure and composition of a sample by means of a scanning unit, in particular for detecting traces, which are induced by contact of the skin of the human body on the surface of an object or absorbed by means of a trace carrier. The sample and the scanning unit are moved in relation to one another. The sample surface is irradiated line-by-line using a light beam or laser beam emitted from the scanning unit. The light beam or laser beam reflected from the sample surface is detected, and a digital image of the topography of the sample surface and the intensity of the reflected light beam or laser beam is generated from deviations of the reflected light beam or laser beam from the emitted light beam or laser beam to illustrate the composition of the sample surface.

Claims

1. A method for detecting the surface structure and composition of a sample by means of a scanning unit wherein the sample and the scanning unit are moved in relation to one another,

wherein

a sample surface is irradiated line-by-line using a laser beam emitted from the scanning unit, having predefined laser beam diameter in a step width corresponding to the laser beam diameter, and the reflected laser beam is detected and analyzed coaxially in relation to the emitted laser beam, the laser beam reflected from the sample surface is detected and a digital image of the topography of the sample surface and the intensity of the reflected laser beam is generated from deviations of the reflected laser beam from the emitted laser beam and a run time, which is dependent on the distance of the scanning unit from the sample surface, of the laser beam, which is emitted from the scanning unit and reflected from the sample surface, is detected and analyzed to prepare a distance image corresponding to the topography of the sample surface.

2. The method as claimed in claim 1, wherein the laser beam is emitted at a wavelength which corresponds to a wavelength range of an absorption spectrum of a composition of the sample surface.

3. The method as claimed in claim 1, wherein the emitted laser beam is collimated to a laser beam diameter less than or equal to 1 mm.

4. The method as claimed in claim 1, wherein a thickness of internal layers of the sample, which differ from external layers, is analyzed.

5. The method as claimed in claim 1, wherein a phase shift between the laser beam emitted from the scanning unit and the laser beam reflected from the sample surface is detected and analyzed to ascertain the topography of the sample surface.

6. The method as claimed in claim 5, wherein the laser beam emitted from the scanning unit is sinusoidally modulated and, to determine the phase shift between the laser beam emitted from the scanning unit and the laser beam reflected from the sample surface, the reflected laser beam detected by the scanning unit is correlated with a reference signal synchronous with the emitted laser beam.

7. The method as claimed in claim 1, wherein an absorption-related deviation of the laser beam reflected from the sample surface from the laser beam emitted from the scanning unit is analyzed to prepare an intensity image corresponding to a chemical substance on and in the sample surface.

8. The method as claimed in claim 7, wherein the sample surface is scanned serially point-by-point using the modulated laser beam and image elements of a digital image are emulated from the distance and intensity measurements arranged in a matrix.

9. The method as claimed in claim 1, wherein the reflected laser beam is detected by means of an RGB image recording unit to ascertain color values of the scanned sample surface.

10. A device for detecting the surface structure and composition of a sample, comprising:

a sample receptacle,

a scanning unit comprising

a laser light source for emitting a laser beam having a wavelength range of a known or previously ascertained significant absorption peak of a chemical substance or for ascertaining the significant absorption peak, a laser beam is tuned in a range of the infrared spectrum,

a receiver for receiving laser beams transmitted or reflected from a sample surface, and

an X-Y axis deflection unit, which scans the sample surface using the laser beams emitted from the laser source, and.

an analysis unit comprising

a first computer unit for generating a topographic distance image of the sample surface having the chemical substance, the image being generated using a run time, which is dependent on the distance of the scanning unit from the sample surface, of the laser beam, which is emitted from the scanning unit and reflected from the sample surface, is detected and analyzed to prepare a distance image corresponding to the topography of the sample surface,

a second computer unit for generating an infrared image, which depicts an intensity of the reflected laser beams, of the sample surface having the chemical substance, and

a central computer unit which is bidirectionally connected to a data memory, an image display unit or display screen, and the first and second computer unit.

11. The device as claimed in claim 10, wherein the sample receptacle and/or the scanning unit is/are connected to a Z axis drive unit for changing a distance between the sample receptacle and the scanning unit, which is bidirectionally connected via the Z axis driver unit to the central computer unit.

12. The device as claimed in claim 10, further comprising an RGB image recording unit, which is oriented onto the sample surface, and which is bidirectionally connected via a third computer unit for generating an RGB image to the central computer unit.

13. The device as claimed in claim 10, wherein the laser source has an IR laser light source, a transmitting lens, which orients laser beams emitted from the IR laser light source onto the sample surface, and light source activation electronics for activating the IR laser light source.

14. The device as claimed in claim 10, wherein the light receiver has an IR photodiode receiver, a receiving lens, which is arranged on the receiving side receiving the reflected laser beams, and a lock-in signal amplifier, which amplifies the signals emitted from the IR photodiode receiver.

15. The device as claimed in claim 10, wherein a pulse generator activates light source activation electronics, a lock-in signal amplifier, and the three computer units.

16. The device as claimed in claim 10, wherein the IR laser light source directs an IR laser beam via a modulator, which is activated by laser activation electronics, onto a collimator, which emits the IR laser beam having limited laser beam diameter onto a deflection unit, which deflects the IR laser beam line-by-line onto the sample and deflects the IR laser beams reflected from the sample surface to an image recording photodiode.

17. The device as claimed in claim 16, wherein a semitransparent mirror is arranged in the beam path between the collimator and the deflection unit, which transmits the IR laser beams emitted from the collimator to the deflection unit, on the one hand, and deflects the IR laser beams, which are serially combined by the deflection unit and reflected from the sample surface, to the image recording photodiode.

18. The device as claimed in claim 16, wherein the IR laser beams, which are fanned out line-by-line by the deflection unit, and the reflected IR laser beams received from the deflection unit, are guided via a correcting lens and a redirection mirror to the sample.

19. The device as claimed in claim 16, wherein at least a part of the IR laser beams, which are fanned out line-by-line by the deflection unit, are deflected onto a synchronization photodiode.

20. The device as claimed in claim 16, wherein the deflection unit consists of a polygonal deflection mirror, which is driven by an electric motor, or a galvanometer.