Semiconductor device, power supply control method of semiconductor device, and sensor node

• US 9,837,816 B2
• Filed: 03/28/2013
• Issued: 12/05/2017
• Est. Priority Date: 03/29/2012
• Status: Active Grant

• Current Assignee: NEC Corporation
• Original Assignee: NEC Corporation
• Inventors: Miyamura, Makoto, Sakimura, Noboru, Nebashi, Ryusuke, Tsuji, Yukihide, Sugibayashi, Tadahiko
• Primary Examiner(s): BARNIE, REXFORD N
• Assistant Examiner(s): Ly, Xuan
• Application Number:
  US14/389,311
• Publication Number:
  US 20150048680A1
• Time in Patent Office: 1,713 Days
• Field of Search: 307 31, 327536
• CPC Class Codes: H02J 1/08 Three-wire systems; Systems having more than three wires
• CPC Class Codes: H02J 1/102 being switching converters H02J1/108, H02J1/12 take precedence

Abstract

A semiconductor device includes a current control unit whose conductance is variable and a control unit configured to control the conductance of the current control unit. The current control unit is connected to a direct current power source in parallel with a load for the direct current power source, through a capacitor. The control unit sets the current control unit to a first conductance when the direct current power source and the load are not in a conduction state, and sets the current control unit to a second conductance larger than the first conductance when the direct current power source and the load are in the conduction state.

Claims

1. A semiconductor device, comprising:

a current control unit whose conductance is variable; and

a control unit configured to control the conductance of the current control unit, wherein,

the current control unit is connected to a direct current power source in parallel with a load for the direct current power source, through a capacitor,

the control unit sets the current control unit to a first conductance when the direct current power source and the load are not in a conduction state,

the control unit sets the current control unit to a second conductance larger than the first conductance when the direct current power source and the load are in the conduction state, and

the control unit changes control over the current control unit according to an electrical characteristic of the load.

2. The semiconductor device according to claim 1, wherein

the second conductance is larger than a conductance of the direct current power source.

3. The semiconductor device according to claim 1, wherein

the current control unit is configured by including a first MOS transistor and a second MOS transistor having a diving capability higher than the first MOS transistor;

and

the control unit sets the first conductance by turning on the first MOS transistor, and sets the second conductance by turning on the second MOS transistor.

4. The semiconductor device according to claim 3, wherein

the first MOS transistor and the control unit are formed on a same semiconductor substrate.

5. The semiconductor device according to claim 4, wherein

at least one of the capacitor and the second MOS transistor is formed outside the semiconductor substrate.

6. The semiconductor device according to claim 5, including:

at least one of a terminal configured to connect the capacitor and a terminal configured to control the second MOS transistor.

7. The semiconductor device according to claim 1, wherein

the current control unit is configured by including an MOS transistor or a bipolar transistor;

and

the control unit switches the first conductance and the second conductance by varying a gate voltage of the MOS transistor or a base current of the bipolar transistor.

8. The semiconductor device according to claim 1, wherein

the load is constituted from a plurality of power supply regions, and a switch is provided for each of the plurality of power supply regions;

and

the control unit turns on the switch when the direct current power source and the load are in the conduction state.

9. The semiconductor device according to claim 8, wherein

the control unit determines a time to charge the capacitor, based on a number of the power supply regions of the plurality of power supply regions to be activated.

10. The semiconductor device according to claim 1, wherein

the semiconductor device includes a voltage converter configured to convert a first voltage supplied from the direct current power source to a second voltage;

and

the load receives one of the first voltage and the second voltage.

11. The semiconductor device according to claim 10, wherein the semiconductor device includes:

a first comparator configured to output a result of comparison between the second voltage and a first reference voltage; and

when the first voltage becomes lower than the first reference voltage, the control unit sets the current control unit to the second conductance, based on a result of an output of the first comparator.

12. The semiconductor device according to claim 10, including:

a rectangular wave generation unit configured to generate from the first voltage a rectangular wave with a predetermined cycle and supplies to the load a third voltage obtained by smoothing the rectangular wave;

a second comparator configured to output a result of comparison between the third voltage and a second reference voltage; and

a rectangular wave control unit configured to change the cycle of the rectangular wave, based on a result of an output of the second comparator.

13. The semiconductor device according to claim 12, wherein

the rectangular wave generation unit is configured by including a high-side switch connected to a first power supply line configured to supply the first voltage and a low-side switch with one end thereof connected to a ground potential;

and

the rectangular wave control unit complementarily switches the high-side switch and the low-side switch, thereby changing the cycle of the rectangular wave.

14. A sensor node comprising:

the semiconductor device according to claim 1;

a direct current power source;

a voltage converter configured to convert a voltage output by the direct current power source and supply the converted voltage to the semiconductor device; and

a sensor module including a sensor configured to detect an external environmental condition.

15. A semiconductor device, comprising:

a current control unit whose conductance is variable;

a control unit configured to control the conductance of the current control unit,

wherein the current control unit is connected to a direct current power source in parallel with a load for the direct current power source, through a capacitor,

the control unit sets the current control unit to a first conductance when the direct current power source and the load are not in a conduction state, and

the control unit sets the current control unit to a second conductance larger than the first conductance when the direct current power source and the load are in the conduction state; and

a plurality of the current control units respectively associated with a plurality of the capacitors disposed in parallel between the direct current power source and the load.

16. The semiconductor device according to claim 15, wherein

the control unit determines a number of capacitors to be charged out of the plurality of the capacitors, according to a capacitive load of the load.

17. The semiconductor device according to claim 15, wherein

the control unit determines a number of the capacitors to be charged, according to the electrical characteristic of the load.

18. A power supply control method of a semiconductor device comprising a current control unit connected to a direct current power source in parallel with a load for the direct current source, through a capacitor, a conductance of the current control unit being variable, the power supply control method comprising:

setting the current control unit to a first conductance, thereby starting charging of the capacitor;

setting the current control unit to a second conductance larger than the first conductance when the direct current source and the load are conducted, thereby starting discharging of the capacitor, wherein,

the semiconductor device includes;

a plurality of the capacitors, and

a plurality of the current control units respectively associated with the plurality of the capacitors, and

the power supply control method includes;

determining a number of the capacitors of the plurality of the capacitors to be charged according to the electrical characteristic of the load.

19. The power supply control method of the semiconductor device according to claim 18, further including:

changing a period for charging the capacitor according to an electrical characteristic of the load.

20. The power supply control method of the semiconductor device according to claim 18, including:

when the load includes a plurality of power supply regions, changing the period for charging the capacitor based on a number of the power supply regions to be activated.