Method and apparatus for the detection of arc events during the plasma processing of a wafer, surface of substrate
First Claim
1. A method for detecting an arc event occurring during plasma processing of a surface being performed in a plasma chamber which is being supplied by a radio frequency power source, the method comprising the steps of:
- detecting light being generated from the plasma during the processing, wherein the detecting light includes detecting modulated light being emitted from a plasma sheath and the volume of plasma close to the plasma sheath; and
processing the detected light to determine when an arc event occurs.
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Accused Products
Abstract
A method for monitoring at least one process parameter of a plasma process being performed on a semiconductor wafer, surface or surface and determine arc events occurring within the plasma tool chamber. The method comprises the steps of detecting the modulated light being generated from the plasma sheath during the plasma process; sampling RF voltage and current signals from the RF transmission line; processing the detected modulated light and the RF signals to produce at least one monitor statistic for the plasma process, and process the monitor signal to determine the occurrence of arcing events during the wafer processing.
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Citations
27 Claims
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1. A method for detecting an arc event occurring during plasma processing of a surface being performed in a plasma chamber which is being supplied by a radio frequency power source, the method comprising the steps of:
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detecting light being generated from the plasma during the processing, wherein the detecting light includes detecting modulated light being emitted from a plasma sheath and the volume of plasma close to the plasma sheath; and processing the detected light to determine when an arc event occurs. - View Dependent Claims (2, 3, 4, 5, 6, 7, 8, 9, 10, 11, 12, 13, 14, 15, 16, 17, 18, 19)
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20. An apparatus for detecting an arc event occurring during plasma processing of a surface being performed in a plasma chamber which is being supplied by a radio frequency power source, the apparatus comprising:
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means for detecting light being generated from the plasma during the processing, wherein the means for detecting light is configured to detect modulated light being emitted from a plasma sheath and the volume of plasma close to the plasma sheath; and means for processing the detected light to determine when an arc event occurs. - View Dependent Claims (21, 22, 23, 24, 25, 26, 27)
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Specification