Apparatus and method for measuring surface topography optically

• US 9,844,427 B2
• Filed: 07/26/2016
• Issued: 12/19/2017
• Est. Priority Date: 07/03/2014
• Status: Active Grant

• Current Assignee: Align Technology Incorporated
• Original Assignee: Align Technology Incorporated
• Inventors: Atiya, Yossef, Verker, Tal
• Primary Examiner(s): NGUYEN, SANG H
• Application Number:
  US15/220,336
• Publication Number:
  US 20170027670A1
• Time in Patent Office: 511 Days
• Field of Search: 356601-635, 35655954
• CPC Class Codes: A61B 1/000094 extracting biological structures
• CPC Class Codes: A61B 1/00011 characterised by signal transmission
• CPC Class Codes: A61B 1/00045 Display arrangement
• CPC Class Codes: A61B 1/0676 at distal tip of an endoscope
• CPC Class Codes: A61B 1/247 with means for viewing areas outside the direct line of sight, e.g. dentists' mirrors
• CPC Class Codes: A61B 2562/0233 Special features of optical sensors or probes classified in A61B5/00
• CPC Class Codes: A61B 5/0013 Medical image data A61B1/00011, A61B6/56, A61B8/56 take precedence
• CPC Class Codes: A61B 5/0022 Monitoring a patient using a global network, e.g. telephone networks, internet
• CPC Class Codes: A61B 5/0088 for oral or dental tissue
• CPC Class Codes: A61B 5/7228 Signal modulation applied to the input signal sent to patient or subject; demodulation to recover the physiological signal modulation H03C
• CPC Class Codes: A61C 1/088 Illuminating devices or attachments for examination of the mouth A61B1/24 and A61B1/06
• CPC Class Codes: A61C 9/0046 Data acquisition means or methods
• CPC Class Codes: A61C 9/0053 Optical means or methods, e.g. scanning the teeth by a laser or light beam
• CPC Class Codes: A61C 9/0066 Depth determination through adaptive focusing
• CPC Class Codes: G01B 11/24 for measuring contours or curvatures
• CPC Class Codes: G01B 11/25 by projecting a pattern, e.g. one or more lines, moiré fringes on the object G01B11/255 takes precedence ; image analysis for depth or shape recovery G06T7/50
• CPC Class Codes: G01B 11/30 for measuring roughness or irregularity of surfaces

Abstract

An apparatus is described for determining surface topography of a three-dimensional structure. The apparatus can include a probe and an illumination unit configured to output a plurality of light beams. In many embodiments, the apparatus includes a light focusing assembly. The light focusing assembly can receive and focus each of a plurality of light beams to a respective external focal point. The light focusing assembly can be configured to overlap the plurality of light beams within a focus changing assembly in order to move the external focal points along a direction of propagation of the light beams. The apparatus can include a detector having an array of sensing elements configured to measure a characteristic of each of a plurality of light beams returning from the illuminated spots and a processor coupled to the detector and configured to generate data representative of topography of the structure based on the measured characteristic.

Claims

1. An apparatus for determining surface topography of a structure, the apparatus comprising:

a probe;

an illumination unit configured to output a plurality of light beams;

a light focusing assembly comprising an image space lens and an object space lens;

a focus changing assembly located along an optical path between the image space lens and the object space lens, a portion of the focus changing assembly located at a back focal length of the object space lens and comprising a variable optical power element or a divergent and a convergent lens;

a detector having an array of sensing elements configured to measure a characteristic of each of a plurality of light beams returning from the illuminated spots; and

a processor coupled to the detector and configured to generate data representative of topography of the structure based on the measured characteristic of each of the plurality of light beams returning from the illuminated spots,

wherein the light focusing assembly is configured to;

receive each of the plurality of light beams;

overlap the plurality of light beams within a focus changing assembly; and

focus each of the plurality of light beams to a respective focal point external to the probe in order to generate illuminated spots on the structure, and

wherein the focus changing assembly is configured to move the respective focal points along a direction of propagation of the plurality of light beams.

2. The apparatus of claim 1, wherein at least a portion of the focus changing assembly is located at a back focal length of an objective lens of the light focusing assembly in order to inhibit changes in spacing between the respective focal points of the plurality of light beams when the respective focal points move along the direction of propagation of the light beams.

3. The apparatus of claim 1, wherein the focus changing assembly is located along optical paths of the plurality of light beams such that a majority of the plurality of light beams overlaps with other light beams of the plurality along at least a portion of the focus changing assembly in order to inhibit changes in spacing between the respective focal points of the plurality of light beams when the respective focal points move along the direction of propagation of the light beams.

4. The apparatus of claim 1, wherein each of the plurality of light beams comprises a substantially collimated configuration upon entering the focus changing assembly and wherein the focus changing assembly similarly adjusts each of the plurality of light beams to a convergent configuration, a collimated configuration, or a divergent configuration upon exiting the focus changing assembly in order to move the respective focal points along the direction of propagation of the light beams.

5. The apparatus of claim 1, wherein the characteristic comprises an intensity.

6. The apparatus of claim 1, wherein the focus changing assembly moves the respective focal points at least 10 mm.

7. The apparatus of claim 1, wherein the object space lens comprises a telecentric lens and at least a portion of the focus changing assembly is located at a back focal length of the telecentric lens.

8. The apparatus of claim 1, wherein the image space lens comprises a focal length and location arranged to overlap and substantially collimate the plurality of light beams passing through the focus changing assembly.

9. The apparatus of claim 1, wherein the focus changing assembly comprises the variable optical power element and is operable to move the respective focal points without movement of the variable optical power element, thereby oscillating separation between the respective focal points and the probe by at least 10 mm at a frequency greater than 10 Hz.

10. The apparatus of claim 1, wherein the focus changing assembly comprises the divergent lens and the convergent lens, and separation between the divergent lens and the convergent lens is varied to displace the external focal points.

11. A method of determining surface topography of a structure, the method comprising:

generating illuminated spots on the structure using a light focusing assembly including an image space lens and an object space lens to receive and focus each of a plurality of light beams to a respective focal point external to a probe;

operating the light focusing assembly to overlap each of the plurality of light beams within a focus changing assembly located along an optical path between the image space lens and the object space lens, a portion of the focus changing assembly located at a back focal length of the object space lens and comprising a variable optical power element or a divergent and a convergent lens;

operating the focus changing assembly to displace the respective focal points along a direction of propagation of the plurality of light beams;

measuring a characteristic of each of a plurality of light beams returning from the illuminated spots; and

generating, with a processor, data representative of topography of the structure based on the measured characteristic.

12. The method of claim 11, wherein at least a portion of the focus changing assembly is located at a back focal length of an objective lens of the light focusing assembly in order to inhibit changes in spacing between the respective focal points of the plurality of light beams when the respective focal points move along the direction of propagation of the light beams.

13. The method of claim 11, wherein the focus changing assembly is located along optical paths of the plurality of light beams such that a majority of the plurality of light beams overlaps with other light beams of the plurality along at least a portion of the focus changing assembly in order to inhibit changes in spacing between the respective focal points of the plurality of light beams when the respective focal points move along the direction of propagation of the light beams.

14. The method of claim 11, wherein each of the plurality of light beams comprises a substantially collimated configuration upon entering the focus changing assembly and wherein the focus changing assembly similarly adjusts each of the plurality of light beams to a convergent configuration, a collimated configuration, or a divergent configuration upon exiting the focus changing assembly in order to move the respective focal points along the direction of propagation of the light beams.

15. The method of claim 11, wherein the characteristic comprises an intensity.

16. The method of claim 11, wherein the focus changing assembly moves the respective focal points at least 10 mm.

17. The method of claim 11, wherein the object space lens comprises a telecentric lens and at least a portion of the focus changing assembly is located at a back focal length of the telecentric lens.

18. The method of claim 11, wherein the image space lens comprises a focal length and location arranged to overlap and substantially collimate the plurality of light beams passing through the focus changing assembly.

19. The method of claim 11, wherein the focus changing assembly comprises the variable optical power element operable to move the respective focal points without movement of the variable optical power element, thereby oscillating separation between the respective focal points and the probe by at least 10 mm at a frequency greater than 10 Hz.

20. The method of claim 11, wherein the focus changing assembly comprises the divergent lens and the convergent lens, and separation between the divergent lens and the convergent lens is varied to displace the external focal points.