Systems and methods for internal and external error detection in sensor output interfaces

• US 9,846,191 B2
• Filed: 09/09/2013
• Issued: 12/19/2017
• Est. Priority Date: 09/09/2013
• Status: Active Grant

• Current Assignee: Infineon Technologies AG
• Original Assignee: Infineon Technologies AG
• Inventors: Granig, Wolfgang, Witschnig, Harald, Morici, Andrea
• Primary Examiner(s): Cosimano, Edward
• Application Number:
  US14/021,059
• Publication Number:
  US 20150070042A1
• Time in Patent Office: 1,562 Days
• Field of Search: None
• CPC Class Codes: G01D 21/00 Measuring or testing not otherwise provided for
• CPC Class Codes: G01D 3/036 on measuring arrangements themselves
• CPC Class Codes: G01R 31/2829 Testing of circuits in sensor or actuator systems testing of apparatus for measuring electric or magnetic variables G01R35/00; testing of indicating or recording apparatus G01D; in airbag systems B60R21/0173; checking gas analysers G01N33/007; monitoring or fail-safe circuits for electromagnets H01F7/1844
• CPC Class Codes: G01R 31/2851 Testing of integrated circuits [IC] G01R31/317 takes precedence; testing individual devices G01R31/26; testing printed circuits G01R31/2801
• CPC Class Codes: G01R 31/36 Arrangements for testing, measuring or monitoring the electrical condition of accumulators or electric batteries, e.g. capacity or state of charge [SoC]
• CPC Class Codes: G06F 17/40 Data acquisition and logging for input to computer G06F3/00
• CPC Class Codes: G16Z 99/00 Subject matter not provided for in other main groups of this subclass

Abstract

Integrated circuit systems, such as sensor systems, having on-board-diagnostic (OBD) circuits for the detection of errors presenting internal to the systems are disclosed, along with related methods. In one embodiment, an ADC multiplexer receives analog output readback from an output driver and provides a signal triggering an OBD circuit for internal error indication performed completely independent of digital-to-analog converters (DAC) and output drivers, which can be the point of failure.

Claims

1. An integrated circuit system comprising:

at least one on-board diagnostic circuit comprising a switch coupled between an output and a first potential;

an output driver configured to provide a system output signal at the output; and

a control unit coupled to the at least one on-board diagnostic circuit and configured to compare the system output signal with a value and to provide an error output signal via the at least one on-board diagnostic circuit when the comparison indicates an error.

2. The integrated circuit system of claim 1, wherein the error is internal to the sensor system.

3. The integrated circuit system of claim 1, wherein the error is external to the sensor system.

4. The integrated circuit system of claim 1, wherein the value is one of a predetermined value or a predetermined range of values.

5. The integrated circuit system of claim 1, further comprising a digital-to-analog converter coupled to a positive input of the output driver and the control circuit.

6. The integrated circuit system of claim 1, wherein the at least one on-board diagnostic circuit comprises at least one charge pump coupled to the switch and to the control unit.

7. The integrated circuit system of claim 6, wherein the control unit is configured to turn off the at least one charge pump to close the switch and form a short circuit between the first potential and the output of the sensor system, such that the error output signal comprises the first potential, when the comparison indicates an error.

8. The integrated circuit system of claim 1, wherein the switch comprises at least one transistor.

9. The integrated circuit system of claim 8, wherein the at least one transistor comprises a depletion MOSFET.

10. The integrated circuit system of claim 1, further comprising:

an analog-to-digital converter coupled to the output driver and configured to receive the system output signal and convert the system output signal to a digital signal before providing the digital signal to the control unit.

11. The integrated circuit system of claim 10, wherein the value comprise a digital value.

12. The integrated circuit system of claim 10, wherein the analog-to-digital converter comprises an analog-to-digital converter multiplexer.

13. The integrated circuit system of claim 12, further comprising at least one sensor coupled to the analog-to-digital converter multiplexer, wherein the system output signal is related to a signal generated by the at least one sensor.

14. The integrated circuit system of claim 13, wherein the value is related to the signal generated by the at least one sensor.

15. The integrated circuit system of claim 13, wherein the at least one sensor comprises a primary sensor and a secondary sensor, wherein the analog-to-digital converter multiplexer is coupled to the secondary sensor and an analog-to-digital converter is coupled to the primary sensor.

16. The integrated circuit system of claim 15, wherein the primary sensor comprises one of a temperature sensor, a pressure sensor, a magnetic field sensor, a moisture sensor, or an acceleration sensor.

17. The integrated circuit system of claim 16, wherein the secondary sensor comprises one of a temperature sensor, a pressure sensor, a magnetic field sensor, a moisture sensor, or an acceleration sensor.

18. A method of detecting errors internal to an integrated circuit system comprising:

providing an output signal of the system to an internal control circuit of the system;

comparing the output signal to a value; and

providing an error signal indicative of an error internal to the system via an on-board-diagnostic circuit if the comparing deviates from the value by a predefined limit, wherein providing the error signal further comprises deactivating a charge pump of the on-board-diagnostic circuit to close a switch of the on-board-diagnostic circuit to provide the error signal indicative of an error internal to the system via the closed switch.

19. The method of claim 18, wherein the output signal is an analog output signal, and the method further comprises digitizing the analog output signal before the comparing.

20. The method of claim 19, wherein comparing the output signal with the value comprises evaluating the digitized output signal with the value, wherein the value includes a predetermined range of values.