Systems and methods for monitoring components

• US 9,846,933 B2
• Filed: 11/16/2015
• Issued: 12/19/2017
• Est. Priority Date: 11/16/2015
• Status: Expired due to Fees

• Current Assignee: General Electric Company
• Original Assignee: General Electric Company
• Inventors: Yuksel, Basak
• Primary Examiner(s): PATEL, KANJIBHAI B
• Application Number:
  US14/942,039
• Publication Number:
  US 20170140515A1
• Time in Patent Office: 764 Days
• Field of Search: 382152
• CPC Class Codes: G01L 1/24 by measuring variations of optical properties of material when it is stressed, e.g. by photoelastic stress analysis using infrared, visible light, ultraviolet
• CPC Class Codes: G01M 5/0016 of aircraft wings or blades
• CPC Class Codes: G01M 5/0041 by determining deflection or stress
• CPC Class Codes: G01M 5/0091 by using electromagnetic excitation or detection
• CPC Class Codes: G01N 21/8851 Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002
• CPC Class Codes: G01N 21/9515 Objects of complex shape, e.g. examined with use of a surface follower device measuring contours and curvatures G01B11/24
• CPC Class Codes: G06T 2207/30164 Workpiece; Machine component
• CPC Class Codes: G06T 7/0002 Inspection of images, e.g. flaw detection
• CPC Class Codes: G06T 7/0004 Industrial image inspection
• CPC Class Codes: G06T 7/0008 checking presence/absence
• CPC Class Codes: G06T 7/001 using an image reference approach
• CPC Class Codes: G06T 7/13 Edge detection
• CPC Class Codes: G06T 7/40 Analysis of texture depth or shape recovery from texture G06T7/529

Abstract

Systems and methods for monitoring components are provided. A component has an exterior surface. A method includes performing a first analysis of a first image of a surface feature configured on the exterior surface of the component, the first image obtained by an imaging device. The method further includes adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied, and performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device. The method further includes adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied, and performing a second analysis of a third image, the third image obtained by the imaging device.

Claims

1. A method for monitoring a component, the component having an exterior surface, the method comprising:

performing a first analysis of a first image of a surface feature configured on the exterior surface of the component, the first image obtained by an imaging device;

adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied;

performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;

adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied; and

performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device.

2. The method of claim 1, wherein the first analysis is different from the second analysis.

3. The method of claim 1, wherein the first analysis is a binary pixel analysis.

4. The method of claim 1, wherein the second analysis is a greyscale pixel analysis.

5. The method of claim 4, wherein the second analysis is a 256 bit-per-pixel greyscale analysis.

6. The method of claim 4, further comprising adjusting a viewing parameter of the imaging device when a predetermined second analysis threshold for the third image is unsatisfied.

7. The method of claim 1, wherein the step of adjusting the viewing parameter is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied, and wherein the step of adjusting the distance is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied.

8. The method of claim 1, wherein the surface feature is a strain sensor and the component is a turbine component.

9. A system for monitoring a component, the component having an exterior surface, the system comprising:

an imaging device for obtaining images of a surface feature configured on the exterior surface of the component; and

a processor in operable communication with the imaging device, the processor configured for;

performing a first analysis of a first image of the surface feature, the first image obtained by the imaging device;

adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied;

performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;

adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied; and

performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device.

10. The system of claim 9, wherein the first analysis is different from the second analysis.

11. The system of claim 9, wherein the first analysis is a binary pixel analysis.

12. The system of claim 9, wherein the second analysis is a greyscale pixel analysis.

13. The system of claim 12, wherein the second analysis is a 256 bit-per-pixel greyscale analysis.

14. The system of claim 12, wherein the processor is further configured for adjusting a viewing parameter of the imaging device when a predetermined second analysis threshold for the third image is unsatisfied.

15. The system of claim 9, wherein the step of adjusting the viewing parameter is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied, and wherein the step of adjusting the distance is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied.

16. The system of claim 9, wherein the surface feature is a strain sensor and the component is a turbine component.

17. A method for monitoring a component, the component having an exterior surface, the method comprising:

performing a first analysis of a first image of a surface feature configured on the exterior surface of the component, the first image obtained by an imaging device, wherein the first analysis is a binary pixel analysis;

adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied, wherein the predetermined first analysis threshold is a first width threshold for an edge of the surface feature;

performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;

adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied; and

performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device.

18. The method of claim 17, wherein the first analysis is different from the second analysis.

19. The method of claim 17, wherein the second analysis is a greyscale pixel analysis.

20. The method of claim 17, wherein the step of adjusting the viewing parameter is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied, and wherein the step of adjusting the distance is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied.

21. A system for monitoring a component, the component having an exterior surface, the system comprising:

an imaging device for obtaining images of a surface feature configured on the exterior surface of the component; and

a processor in operable communication with the imaging device, the processor configured for;

performing a first analysis of a first image of the surface feature, the first image obtained by the imaging device, wherein the first analysis is a binary pixel analysis;

adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied, wherein the predetermined first analysis threshold is a first width threshold for an edge of the surface feature;

performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;

adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied; and

performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device.

22. The system of claim 21, wherein the first analysis is different from the second analysis.

23. The system of claim 21, wherein the second analysis is a greyscale pixel analysis.

24. The system of claim 21, wherein the step of adjusting the viewing parameter is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied, and wherein the step of adjusting the distance is performed automatically when the predetermined first analysis threshold for the second image is unsatisfied.

25. A method for monitoring a component, the component having an exterior surface, the method comprising:

performing a first analysis of a first image of a surface feature configured on the exterior surface of the component, the first image obtained by an imaging device;

adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied;

performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;

adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied;

performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device, wherein the second analysis is a 256 bit-per-pixel greyscale pixel analysis; and

adjusting a viewing parameter of the imaging device when a predetermined second analysis threshold for the third image is unsatisfied, wherein the predetermined second analysis threshold is a second width threshold for an edge of the surface feature.

26. The system of claim 25, wherein the first analysis is different from the second analysis.

27. A system for monitoring a component, the component having an exterior surface, the system comprising:

an imaging device for obtaining images of a surface feature configured on the exterior surface of the component; and

a processor in operable communication with the imaging device, the processor configured for;

performing a first analysis of a first image of the surface feature, the first image obtained by the imaging device;

adjusting a viewing parameter of the imaging device when a predetermined first analysis threshold for the first image is unsatisfied;

performing a subsequent first analysis of a second image of the surface feature, the second image obtained by the imaging device;

adjusting a distance between the imaging device and the surface feature when the predetermined first analysis threshold for the second image is unsatisfied;

performing a second analysis of a third image of the surface feature, the third image obtained by the imaging device, wherein the second analysis is a 256 bit-per-pixel greyscale pixel analysis;

adjusting a viewing parameter of the imaging device when a predetermined second analysis threshold for the third image is unsatisfied, wherein the predetermined second analysis threshold is a second width threshold for an edge of the surface feature.

28. The system of claim 27, wherein the first analysis is different from the second analysis.