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Backscatter inspection systems, and related methods

  • US 9,851,312 B2
  • Filed: 05/07/2014
  • Issued: 12/26/2017
  • Est. Priority Date: 05/07/2014
  • Status: Active Grant
First Claim
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1. An inspection system, comprising:

  • a radiation scanner configured to emit a radiation beam along a radiation trajectory;

    a plurality of filters comprising at least two filters selectably positionable so that at least one of the at least two filters receives at least a portion of the radiation of the radiation beam backscattered from a specimen and passes attenuated radiation, wherein the at least two filters respectively have different attenuation characteristics;

    a radiation detector configured to receive the attenuated radiation and configured to produce detection data associated with an energy intensity of the attenuated radiation; and

    a rendering system configured to create a composite image of the specimen disposed along the radiation trajectory using the detection data from the attenuated radiation passed through the at least two filters.

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