Micro-gyroscope for detecting motions

• US 9,857,175 B2
• Filed: 10/13/2015
• Issued: 01/02/2018
• Est. Priority Date: 04/20/2010
• Status: Active Grant

• Current Assignee: Hanking Electronics Hongkong Company Limited
• Original Assignee: Hanking Electronics, Ltd.
• Inventors: Kempe, Volker
• Primary Examiner(s): Macchiarolo, Peter
• Assistant Examiner(s): Megna Fuentes, Anthony W
• Application Number:
  US14/882,115
• Publication Number:
  US 20160178374A1
• Time in Patent Office: 812 Days
• Field of Search: 7350401-50418, 7351424, 7351432, 7351438
• CPC Class Codes: G01C 19/56 Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
• CPC Class Codes: G01C 19/5642 using vibrating bars or beams
• CPC Class Codes: G01C 19/5656 the devices involving a micromechanical structure
• CPC Class Codes: G01C 19/5719 using planar vibrating masses driven in a translation vibration along an axis
• CPC Class Codes: G01C 19/5747 each sensing mass being connected to a driving mass, e.g. driving frames

Abstract

The invention relates to a micro-gyroscope for detecting motions relative to an X and/or Y and Z axis, particularly as a 3D, 5D, or 6D sensor. Sample masses are disposed uniformly about an anchor and can be driven radially relative to the central anchor. Anchor springs are disposed to attach the sample masses to a substrate, and these sample masses can be deflected both radially within and out of the X-Y plane. A sensor mass is disposed on one-of the sample masses by means of sensor springs, and the sensor springs allow deflection of the sensor mass within the plane of the sample mass, and orthogonal to the radial drive direction of the sample masses. Drive elements oscillate these sample masses in the X-Y plane, and sensor elements captures the defection of the sample masses due to the Coriolis forces generated when the substrate is rotated.

Claims

1. A gyroscope comprising:

a substrate;

a central anchor fixed on the substrate;

a plurality of sample masses, the plurality of sample masses being disposed around the central anchor and driven radially relative to the central anchor;

a first anchor spring positioned between the central anchor and a first sample mass from the plurality of sample masses, the first anchor spring configured to allow the first sample mass to be deflected radially in a first plane and out of the first plane;

a second anchor spring positioned between the central anchor and a second sample mass from the plurality of sample masses, the second anchor spring configured to allow the second sample mass to be deflected radially in the first plane and out of the first plane;

a plurality of drive elements coupled to the plurality of sample masses, the plurality of drive elements configured to cause the plurality of sample masses to generate Coriolis forces when the substrate is rotated; and

a first sensor mass disposed on the first sample mass, the first sensor mass configured to deflect within a first deflection plane and orthogonal to a first radial drive direction of the first sensor mass.

2. The gyroscope of claim 1 further comprising a first sensor element disposed below the first sample mass, the first sensor element configured to detect deflections of the first sample mass due to Coriolis forces.

3. The gyroscope of claim 2 wherein the first sensor element is associated with the plurality of sensor masses for detecting a Z rotational rate.

4. The gyroscope of claim 3 wherein the first sensor element is implemented by a capacitance of the first sample mass and a first electrode disposed on the substrate.

5. The gyroscope of claim 3 further comprising a second sensor element disposed below a second sample mass from the plurality of sample masses, the second sensor element configured to detect deflections of the second sample mass due to the Coriolis forces.

6. The gyroscope of claim 5 wherein the first and second sensor elements are combined into a differential sensor configured to detect rotation of the substrate about a first axis in a X-Y plane that is perpendicular to a second axis connecting said two opposing sample masses.

7. The gyroscope of claim 1 wherein the first plane is an X-Y plane.

8. The gyroscope of claim 1 wherein the plurality of sample masses is uniformly distributed around the central anchor.

9. The gyroscope of claim 8 wherein the plurality of sample masses consists of four sample masses distributed uniformly about a circumference of the central anchor.

10. The gyroscope of claim 1 wherein the central anchor comprises an elastic gimbal mount that couples the central anchor to the plurality of sample masses.

11. The gyroscope of claim 10 wherein the elastic gimbal mount comprises two rings coupled together by torsion springs.

12. The gyroscope of claim 1 further comprising:

a second sensor mass disposed on a second sample mass, the second sensor mass configured to deflect within a second deflection plane and orthogonal to a second radial drive direction of the second sensor mass; and

a second sensor element disposed below the second sample mass, the second sensor element configured to detect deflections of the second sample mass due to the Coriolis forces.

13. The gyroscope of claim 12 further comprising at least one synchronization spring coupled between the first and second sample masses, the at least one synchronization spring configured to facilitate synchronized oscillations of the first and second sample masses.

14. The gyroscope of claim 1 wherein the plurality of drive elements comprises a plurality of electrodes.

15. A method for detecting a rate of rotation, the method comprising:

driving a plurality of sample masses to radially oscillate relative to a central anchor on a substrate, the radial oscillation at least partially controlled by at least one anchor spring coupled between a first sample mass from the plurality of sample masses and the central anchor;

deflecting the first sample mass from the plurality of sample masses, wherein the deflecting is allowed by the at least one anchor spring and occurs radially in a first plane and out of the first plane;

sensing a first deflection of a first sensor mass disposed relative to the first sample mass, the first deflection the occurs within a first deflection plane and orthogonal to a first radial drive direction of the first sensor mass; and

deriving a rate of rotation of the substrate about a first axis based on the first deflection.

16. The method of claim 15 wherein the derivation of the rate of rotation includes a capacitance change associated with the first deflection.

17. The method of claim 16 further comprising the steps of:

deflecting a second sample mass from the plurality of sample masses, the deflecting occurs radially in the first plane and out of the first plane; and

sensing a second deflection of a second sensor mass disposed relative to the second sample mass, the second deflection the occurs within the first deflection plane and orthogonal to a second radial drive direction of the second sensor mass.

18. The method of claim 17 further comprising the step of synchronizing radial oscillations of the first and second sample masses.

19. The method of claim 17 further comprising:

identifying a first capacitive change associated with the first deflection of the first sensor mass;

identifying a second capacitive change associate with the second deflection of the second sensor mass; and

calculating a differential value used to derive the rate of rotation.